Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity

Detalhes bibliográficos
Autor(a) principal: Gomes, José Nuno S.
Data de Publicação: 2020
Outros Autores: Trallero-Giner, Carlos, Peres, N. M. R., Vasilevskiy, Mikhail
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/1822/66003
Resumo: We describe exciton-polariton modes formed by the interaction between excitons in a 2D layer of a transition metal dichalcogenide embedded in a cylindrical microcavity and the microcavity photons. For this, an expression for the excitonic susceptibility of a semiconductor disk placed in the symmetry plane perpendicular to the axis of the microcavity is derived. Semiclassical theory provides dispersion relations for the polariton modes, while the quantum-mechanical treatment of a simplified model yields the Hopfield coefficients, measuring the degree of exciton-photon mixing in the coupled modes. The density of states (DOS) and its projection onto the photonic and the excitonic subspaces are calculated taking monolayer MoS 2 embedded in a Si 3 N 4 cylinder as an example. The calculated results demonstrate a strong enhancement, for certain frequencies, of the total and local DOS (Purcell effect) caused by the presence of the 2D layer.
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spelling Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavityCiências Naturais::Ciências FísicasWe describe exciton-polariton modes formed by the interaction between excitons in a 2D layer of a transition metal dichalcogenide embedded in a cylindrical microcavity and the microcavity photons. For this, an expression for the excitonic susceptibility of a semiconductor disk placed in the symmetry plane perpendicular to the axis of the microcavity is derived. Semiclassical theory provides dispersion relations for the polariton modes, while the quantum-mechanical treatment of a simplified model yields the Hopfield coefficients, measuring the degree of exciton-photon mixing in the coupled modes. The density of states (DOS) and its projection onto the photonic and the excitonic subspaces are calculated taking monolayer MoS 2 embedded in a Si 3 N 4 cylinder as an example. The calculated results demonstrate a strong enhancement, for certain frequencies, of the total and local DOS (Purcell effect) caused by the presence of the 2D layer.We are grateful to Dr. Fernando de Leon for helpful discussion. Funding from the European Commission, within the project ”Graphene-Driven Revolutions in ICT and Beyond” (Ref. No. 696656), and from the Portuguese Foundation for Science and Technology (FCT) in the framework of the PTDC/NAN-OPT/29265/2017 Towards high speed optical devices by exploiting the unique electronic properties of engineered 2D materials project the Strategic Funding UID/FIS/04650/2019 is gratefully acknowledged. C. T-G acknowledges support from the Brazilian Agency CNPq.American Institute of PhysicsUniversidade do MinhoGomes, José Nuno S.Trallero-Giner, CarlosPeres, N. M. R.Vasilevskiy, Mikhail20202020-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/66003eng0021-897910.1063/1.5143244https://aip.scitation.org/doi/10.1063/1.5143244info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:45:30Zoai:repositorium.sdum.uminho.pt:1822/66003Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:43:21.933695Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
title Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
spellingShingle Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
Gomes, José Nuno S.
Ciências Naturais::Ciências Físicas
title_short Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
title_full Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
title_fullStr Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
title_full_unstemmed Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
title_sort Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
author Gomes, José Nuno S.
author_facet Gomes, José Nuno S.
Trallero-Giner, Carlos
Peres, N. M. R.
Vasilevskiy, Mikhail
author_role author
author2 Trallero-Giner, Carlos
Peres, N. M. R.
Vasilevskiy, Mikhail
author2_role author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Gomes, José Nuno S.
Trallero-Giner, Carlos
Peres, N. M. R.
Vasilevskiy, Mikhail
dc.subject.por.fl_str_mv Ciências Naturais::Ciências Físicas
topic Ciências Naturais::Ciências Físicas
description We describe exciton-polariton modes formed by the interaction between excitons in a 2D layer of a transition metal dichalcogenide embedded in a cylindrical microcavity and the microcavity photons. For this, an expression for the excitonic susceptibility of a semiconductor disk placed in the symmetry plane perpendicular to the axis of the microcavity is derived. Semiclassical theory provides dispersion relations for the polariton modes, while the quantum-mechanical treatment of a simplified model yields the Hopfield coefficients, measuring the degree of exciton-photon mixing in the coupled modes. The density of states (DOS) and its projection onto the photonic and the excitonic subspaces are calculated taking monolayer MoS 2 embedded in a Si 3 N 4 cylinder as an example. The calculated results demonstrate a strong enhancement, for certain frequencies, of the total and local DOS (Purcell effect) caused by the presence of the 2D layer.
publishDate 2020
dc.date.none.fl_str_mv 2020
2020-01-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/1822/66003
url http://hdl.handle.net/1822/66003
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 0021-8979
10.1063/1.5143244
https://aip.scitation.org/doi/10.1063/1.5143244
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
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