Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
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Data de Publicação: | 2020 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/1822/66003 |
Resumo: | We describe exciton-polariton modes formed by the interaction between excitons in a 2D layer of a transition metal dichalcogenide embedded in a cylindrical microcavity and the microcavity photons. For this, an expression for the excitonic susceptibility of a semiconductor disk placed in the symmetry plane perpendicular to the axis of the microcavity is derived. Semiclassical theory provides dispersion relations for the polariton modes, while the quantum-mechanical treatment of a simplified model yields the Hopfield coefficients, measuring the degree of exciton-photon mixing in the coupled modes. The density of states (DOS) and its projection onto the photonic and the excitonic subspaces are calculated taking monolayer MoS 2 embedded in a Si 3 N 4 cylinder as an example. The calculated results demonstrate a strong enhancement, for certain frequencies, of the total and local DOS (Purcell effect) caused by the presence of the 2D layer. |
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Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavityCiências Naturais::Ciências FísicasWe describe exciton-polariton modes formed by the interaction between excitons in a 2D layer of a transition metal dichalcogenide embedded in a cylindrical microcavity and the microcavity photons. For this, an expression for the excitonic susceptibility of a semiconductor disk placed in the symmetry plane perpendicular to the axis of the microcavity is derived. Semiclassical theory provides dispersion relations for the polariton modes, while the quantum-mechanical treatment of a simplified model yields the Hopfield coefficients, measuring the degree of exciton-photon mixing in the coupled modes. The density of states (DOS) and its projection onto the photonic and the excitonic subspaces are calculated taking monolayer MoS 2 embedded in a Si 3 N 4 cylinder as an example. The calculated results demonstrate a strong enhancement, for certain frequencies, of the total and local DOS (Purcell effect) caused by the presence of the 2D layer.We are grateful to Dr. Fernando de Leon for helpful discussion. Funding from the European Commission, within the project ”Graphene-Driven Revolutions in ICT and Beyond” (Ref. No. 696656), and from the Portuguese Foundation for Science and Technology (FCT) in the framework of the PTDC/NAN-OPT/29265/2017 Towards high speed optical devices by exploiting the unique electronic properties of engineered 2D materials project the Strategic Funding UID/FIS/04650/2019 is gratefully acknowledged. C. T-G acknowledges support from the Brazilian Agency CNPq.American Institute of PhysicsUniversidade do MinhoGomes, José Nuno S.Trallero-Giner, CarlosPeres, N. M. R.Vasilevskiy, Mikhail20202020-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/66003eng0021-897910.1063/1.5143244https://aip.scitation.org/doi/10.1063/1.5143244info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:45:30Zoai:repositorium.sdum.uminho.pt:1822/66003Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:43:21.933695Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity |
title |
Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity |
spellingShingle |
Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity Gomes, José Nuno S. Ciências Naturais::Ciências Físicas |
title_short |
Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity |
title_full |
Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity |
title_fullStr |
Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity |
title_full_unstemmed |
Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity |
title_sort |
Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity |
author |
Gomes, José Nuno S. |
author_facet |
Gomes, José Nuno S. Trallero-Giner, Carlos Peres, N. M. R. Vasilevskiy, Mikhail |
author_role |
author |
author2 |
Trallero-Giner, Carlos Peres, N. M. R. Vasilevskiy, Mikhail |
author2_role |
author author author |
dc.contributor.none.fl_str_mv |
Universidade do Minho |
dc.contributor.author.fl_str_mv |
Gomes, José Nuno S. Trallero-Giner, Carlos Peres, N. M. R. Vasilevskiy, Mikhail |
dc.subject.por.fl_str_mv |
Ciências Naturais::Ciências Físicas |
topic |
Ciências Naturais::Ciências Físicas |
description |
We describe exciton-polariton modes formed by the interaction between excitons in a 2D layer of a transition metal dichalcogenide embedded in a cylindrical microcavity and the microcavity photons. For this, an expression for the excitonic susceptibility of a semiconductor disk placed in the symmetry plane perpendicular to the axis of the microcavity is derived. Semiclassical theory provides dispersion relations for the polariton modes, while the quantum-mechanical treatment of a simplified model yields the Hopfield coefficients, measuring the degree of exciton-photon mixing in the coupled modes. The density of states (DOS) and its projection onto the photonic and the excitonic subspaces are calculated taking monolayer MoS 2 embedded in a Si 3 N 4 cylinder as an example. The calculated results demonstrate a strong enhancement, for certain frequencies, of the total and local DOS (Purcell effect) caused by the presence of the 2D layer. |
publishDate |
2020 |
dc.date.none.fl_str_mv |
2020 2020-01-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/1822/66003 |
url |
http://hdl.handle.net/1822/66003 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
0021-8979 10.1063/1.5143244 https://aip.scitation.org/doi/10.1063/1.5143244 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
American Institute of Physics |
publisher.none.fl_str_mv |
American Institute of Physics |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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RCAAP |
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RCAAP |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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1799132989861396480 |