A methodology development for the study of near surface stress gradients

• Autor(a) principal: Marques, M. J.
• Data de Publicação: 2000
• Outros Autores: Dias, A. M., Gergaud, P., Lebrun, J. L.
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
• Texto Completo: http://hdl.handle.net/10316/4305; https://doi.org/10.1016/S0921-5093(00)00819-4
• topic: Grazing incidence X-ray diffraction; Residual stress gradients; PVD chromium film

A modification of the geometry used in the sin2 [psi] technique of X-ray diffraction is described. A modified equation for residual stress determination, including geometric adapted Fij, is presented. This method allows near surface stress gradients determination and is called pseudo-grazing incidence method. The limits of the new technique were first tested on different powder materials with X-ray radiation produced by conventional tubes and by a synchrotron radiation source. The technique was finally applied for the determination of a residual stress profile in a polished molybdenum surface before and after the deposition of a PVD chromium film.