Soil-applied silicon decreases severity of wheat spot blotch on silicon-deficient soils

• Autor(a) principal: Zanão Júnior,Luiz Antônio
• Data de Publicação: 2010
• Outros Autores: Fontes,Renildes Lúcio Ferreira, Coelho,Paulo Henrique Moreira, Korndörfer,Gaspar Henrique, Zambolim,Laércio
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Revista Brasileira de Ciência do Solo (Online)
• Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0100-06832010000200013
• topic: Triticum aestivum L; Bipolaris sorokiniana (Sacc. in Sorok.); plant nutrition; Si

Spot bloth caused by Bipolaris sorokiniana is an important wheat desease mainly in hot and humid regions. The aim of this study was to evaluate the response of wheat to different sources and modes of Si application, as related to the severity of wheat spot blotch and plant growth, in two Si-deficient Latosols (Oxisols). An greenhouse experiment was arranged in a 2 x 5 factorial completely randomized design, with eight replications. The treatments consisted of two soils (Yellow Latosol and Red Latosol) and five Si supply modes (no Si application; Si applied as calcium silicate and monosilicic acid to the soil; and Si applied as potassium silicate or monosilicic acid to wheat leaves). No significant differences were observed between the two soils. When Si was applied to the soil, regardless the Si source, the disease incubation period, the shoot dry matter yield and the Si content in leaves were greater. Additionally, the final spot blotch severity was lower and the area under the spot blotch disease progress curve and the leaf insertion angle in the plant were smaller. Results of Si foliar application were similar to those observed in the control plants.