The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films

Detalhes bibliográficos
Autor(a) principal: Tenan,Mário Alberto
Data de Publicação: 1998
Outros Autores: Soares,David Mendes
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Brazilian Journal of Physics
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331998000400015
Resumo: Techniques based upon the electrical response of the quartz crystal microbalance (QCM) have been widely used in laboratories as a routine tools. In this article we present and discuss applications of the QCM (or its variant, the electrochemical quartz crystal microbalance, EQCM) to the viscoelastic characterization of films. It is pointed out that correlations between the motion of quartz crystal and contacting films and overlayers as well as the influence of the electronic circuit on the electric state of the whole system are of fundamental importance in interpreting the results.
id SBF-2_02aaa50a1ab6f8da8bca8a79c1a44dec
oai_identifier_str oai:scielo:S0103-97331998000400015
network_acronym_str SBF-2
network_name_str Brazilian Journal of Physics
repository_id_str
spelling The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin filmsTechniques based upon the electrical response of the quartz crystal microbalance (QCM) have been widely used in laboratories as a routine tools. In this article we present and discuss applications of the QCM (or its variant, the electrochemical quartz crystal microbalance, EQCM) to the viscoelastic characterization of films. It is pointed out that correlations between the motion of quartz crystal and contacting films and overlayers as well as the influence of the electronic circuit on the electric state of the whole system are of fundamental importance in interpreting the results.Sociedade Brasileira de Física1998-12-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331998000400015Brazilian Journal of Physics v.28 n.4 1998reponame:Brazilian Journal of Physicsinstname:Sociedade Brasileira de Física (SBF)instacron:SBF10.1590/S0103-97331998000400015info:eu-repo/semantics/openAccessTenan,Mário AlbertoSoares,David Mendeseng1999-08-26T00:00:00Zoai:scielo:S0103-97331998000400015Revistahttp://www.sbfisica.org.br/v1/home/index.php/pt/ONGhttps://old.scielo.br/oai/scielo-oai.phpsbfisica@sbfisica.org.br||sbfisica@sbfisica.org.br1678-44480103-9733opendoar:1999-08-26T00:00Brazilian Journal of Physics - Sociedade Brasileira de Física (SBF)false
dc.title.none.fl_str_mv The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
title The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
spellingShingle The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
Tenan,Mário Alberto
title_short The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
title_full The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
title_fullStr The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
title_full_unstemmed The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
title_sort The quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
author Tenan,Mário Alberto
author_facet Tenan,Mário Alberto
Soares,David Mendes
author_role author
author2 Soares,David Mendes
author2_role author
dc.contributor.author.fl_str_mv Tenan,Mário Alberto
Soares,David Mendes
description Techniques based upon the electrical response of the quartz crystal microbalance (QCM) have been widely used in laboratories as a routine tools. In this article we present and discuss applications of the QCM (or its variant, the electrochemical quartz crystal microbalance, EQCM) to the viscoelastic characterization of films. It is pointed out that correlations between the motion of quartz crystal and contacting films and overlayers as well as the influence of the electronic circuit on the electric state of the whole system are of fundamental importance in interpreting the results.
publishDate 1998
dc.date.none.fl_str_mv 1998-12-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331998000400015
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331998000400015
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/S0103-97331998000400015
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Sociedade Brasileira de Física
publisher.none.fl_str_mv Sociedade Brasileira de Física
dc.source.none.fl_str_mv Brazilian Journal of Physics v.28 n.4 1998
reponame:Brazilian Journal of Physics
instname:Sociedade Brasileira de Física (SBF)
instacron:SBF
instname_str Sociedade Brasileira de Física (SBF)
instacron_str SBF
institution SBF
reponame_str Brazilian Journal of Physics
collection Brazilian Journal of Physics
repository.name.fl_str_mv Brazilian Journal of Physics - Sociedade Brasileira de Física (SBF)
repository.mail.fl_str_mv sbfisica@sbfisica.org.br||sbfisica@sbfisica.org.br
_version_ 1754734858470424576

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