Characterization of CdTe thin films grown on glass by hot wall epitaxy
Autor(a) principal: | |
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Data de Publicação: | 2006 |
Outros Autores: | , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Brazilian Journal of Physics |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332006000300022 |
Resumo: | In this work we have investigated the properties of CdTe thin films grown on glass substrates by Hot Wall Epitaxy. Its most important feature is the growth at very low temperatures, which would allow the growth even on polymer substrates. Our samples were grown at temperatures between 150 and 250 ºC at a growth rate between 0.2 and 2 µm/h. The CdTe films were characterized by x-ray diffraction, scanning electron microscopy and optical transmission. The x-ray teta-2teta scans revealed films with cubic structure and a very high degree of preferential orientation. In fact, for films thicker than 1 µm, no other reflections have been observed on the spectra besides the (111), (333) and (444). The scanning electron micrographs showed a grain size about 0.3 µm and the optical transmission indicated a very good optical quality of the interfaces, showing pronounced interference fringes. |
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Brazilian Journal of Physics |
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Characterization of CdTe thin films grown on glass by hot wall epitaxyThin films grownHot wall epitaxyCdTeIn this work we have investigated the properties of CdTe thin films grown on glass substrates by Hot Wall Epitaxy. Its most important feature is the growth at very low temperatures, which would allow the growth even on polymer substrates. Our samples were grown at temperatures between 150 and 250 ºC at a growth rate between 0.2 and 2 µm/h. The CdTe films were characterized by x-ray diffraction, scanning electron microscopy and optical transmission. The x-ray teta-2teta scans revealed films with cubic structure and a very high degree of preferential orientation. In fact, for films thicker than 1 µm, no other reflections have been observed on the spectra besides the (111), (333) and (444). The scanning electron micrographs showed a grain size about 0.3 µm and the optical transmission indicated a very good optical quality of the interfaces, showing pronounced interference fringes.Sociedade Brasileira de Física2006-06-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332006000300022Brazilian Journal of Physics v.36 n.2a 2006reponame:Brazilian Journal of Physicsinstname:Sociedade Brasileira de Física (SBF)instacron:SBF10.1590/S0103-97332006000300022info:eu-repo/semantics/openAccessFerreira,Sukarno OlavoLeal,Fábio FagundesFaria,Tatiana Estorani deOliveira,José Eduardo deMotisuke,PauloAbramof,Eduardoeng2006-07-06T00:00:00Zoai:scielo:S0103-97332006000300022Revistahttp://www.sbfisica.org.br/v1/home/index.php/pt/ONGhttps://old.scielo.br/oai/scielo-oai.phpsbfisica@sbfisica.org.br||sbfisica@sbfisica.org.br1678-44480103-9733opendoar:2006-07-06T00:00Brazilian Journal of Physics - Sociedade Brasileira de Física (SBF)false |
dc.title.none.fl_str_mv |
Characterization of CdTe thin films grown on glass by hot wall epitaxy |
title |
Characterization of CdTe thin films grown on glass by hot wall epitaxy |
spellingShingle |
Characterization of CdTe thin films grown on glass by hot wall epitaxy Ferreira,Sukarno Olavo Thin films grown Hot wall epitaxy CdTe |
title_short |
Characterization of CdTe thin films grown on glass by hot wall epitaxy |
title_full |
Characterization of CdTe thin films grown on glass by hot wall epitaxy |
title_fullStr |
Characterization of CdTe thin films grown on glass by hot wall epitaxy |
title_full_unstemmed |
Characterization of CdTe thin films grown on glass by hot wall epitaxy |
title_sort |
Characterization of CdTe thin films grown on glass by hot wall epitaxy |
author |
Ferreira,Sukarno Olavo |
author_facet |
Ferreira,Sukarno Olavo Leal,Fábio Fagundes Faria,Tatiana Estorani de Oliveira,José Eduardo de Motisuke,Paulo Abramof,Eduardo |
author_role |
author |
author2 |
Leal,Fábio Fagundes Faria,Tatiana Estorani de Oliveira,José Eduardo de Motisuke,Paulo Abramof,Eduardo |
author2_role |
author author author author author |
dc.contributor.author.fl_str_mv |
Ferreira,Sukarno Olavo Leal,Fábio Fagundes Faria,Tatiana Estorani de Oliveira,José Eduardo de Motisuke,Paulo Abramof,Eduardo |
dc.subject.por.fl_str_mv |
Thin films grown Hot wall epitaxy CdTe |
topic |
Thin films grown Hot wall epitaxy CdTe |
description |
In this work we have investigated the properties of CdTe thin films grown on glass substrates by Hot Wall Epitaxy. Its most important feature is the growth at very low temperatures, which would allow the growth even on polymer substrates. Our samples were grown at temperatures between 150 and 250 ºC at a growth rate between 0.2 and 2 µm/h. The CdTe films were characterized by x-ray diffraction, scanning electron microscopy and optical transmission. The x-ray teta-2teta scans revealed films with cubic structure and a very high degree of preferential orientation. In fact, for films thicker than 1 µm, no other reflections have been observed on the spectra besides the (111), (333) and (444). The scanning electron micrographs showed a grain size about 0.3 µm and the optical transmission indicated a very good optical quality of the interfaces, showing pronounced interference fringes. |
publishDate |
2006 |
dc.date.none.fl_str_mv |
2006-06-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332006000300022 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332006000300022 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/S0103-97332006000300022 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Sociedade Brasileira de Física |
publisher.none.fl_str_mv |
Sociedade Brasileira de Física |
dc.source.none.fl_str_mv |
Brazilian Journal of Physics v.36 n.2a 2006 reponame:Brazilian Journal of Physics instname:Sociedade Brasileira de Física (SBF) instacron:SBF |
instname_str |
Sociedade Brasileira de Física (SBF) |
instacron_str |
SBF |
institution |
SBF |
reponame_str |
Brazilian Journal of Physics |
collection |
Brazilian Journal of Physics |
repository.name.fl_str_mv |
Brazilian Journal of Physics - Sociedade Brasileira de Física (SBF) |
repository.mail.fl_str_mv |
sbfisica@sbfisica.org.br||sbfisica@sbfisica.org.br |
_version_ |
1754734862695137280 |