Charge dynamics in electron-irradiated polymers

Detalhes bibliográficos
Autor(a) principal: Sessler,G. M.
Data de Publicação: 1999
Outros Autores: Yang,G. M.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Brazilian Journal of Physics
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331999000200006
Resumo: Recent studies of charge trapping and charge transport in spolymer films irradiated and charged with monoenergetic electrons of range smaller than the sample thickness and thereafter stored or annealed under various conditions are discussed. An analytical model used to describe the phenomena takes the following parameters into consideration: Charge and energy deposition profiles, charge drift due to a shallow-trap-modulated mobility, deep trapping without release, trap filling due to a finite trap density, and ohmic relaxation due to a radiation-induced conductivity during irradiation and its delayed component after irradiation. The model calculations show the effect of various parameters on the shape of the initial charge distribution and on its evolution with annealing time. - Experiments with the laser-induced pressure-pulse (LIPP) method on 12 and 25<FONT FACE="Symbol">m</font>m thick fluorocarbon and polymide films, charged with 10 or keV electron beams, respectively, yield the charge distributions after irradiation and the changes of the distributions due to annealing of the samples at 120oC for various times. A comparison of experimental and analytical results reveals the trapping kinetics and permits to estimate the deep-trap density and the <FONT FACE="Symbol">mt</font>-product, where <FONT FACE="Symbol">m</font> is the trap-modulated mobilit and <FONT FACE="Symbol">t</font> is the trapping time.
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spelling Charge dynamics in electron-irradiated polymersRecent studies of charge trapping and charge transport in spolymer films irradiated and charged with monoenergetic electrons of range smaller than the sample thickness and thereafter stored or annealed under various conditions are discussed. An analytical model used to describe the phenomena takes the following parameters into consideration: Charge and energy deposition profiles, charge drift due to a shallow-trap-modulated mobility, deep trapping without release, trap filling due to a finite trap density, and ohmic relaxation due to a radiation-induced conductivity during irradiation and its delayed component after irradiation. The model calculations show the effect of various parameters on the shape of the initial charge distribution and on its evolution with annealing time. - Experiments with the laser-induced pressure-pulse (LIPP) method on 12 and 25<FONT FACE="Symbol">m</font>m thick fluorocarbon and polymide films, charged with 10 or keV electron beams, respectively, yield the charge distributions after irradiation and the changes of the distributions due to annealing of the samples at 120oC for various times. A comparison of experimental and analytical results reveals the trapping kinetics and permits to estimate the deep-trap density and the <FONT FACE="Symbol">mt</font>-product, where <FONT FACE="Symbol">m</font> is the trap-modulated mobilit and <FONT FACE="Symbol">t</font> is the trapping time.Sociedade Brasileira de Física1999-06-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331999000200006Brazilian Journal of Physics v.29 n.2 1999reponame:Brazilian Journal of Physicsinstname:Sociedade Brasileira de Física (SBF)instacron:SBF10.1590/S0103-97331999000200006info:eu-repo/semantics/openAccessSessler,G. M.Yang,G. M.eng1999-10-08T00:00:00Zoai:scielo:S0103-97331999000200006Revistahttp://www.sbfisica.org.br/v1/home/index.php/pt/ONGhttps://old.scielo.br/oai/scielo-oai.phpsbfisica@sbfisica.org.br||sbfisica@sbfisica.org.br1678-44480103-9733opendoar:1999-10-08T00:00Brazilian Journal of Physics - Sociedade Brasileira de Física (SBF)false
dc.title.none.fl_str_mv Charge dynamics in electron-irradiated polymers
title Charge dynamics in electron-irradiated polymers
spellingShingle Charge dynamics in electron-irradiated polymers
Sessler,G. M.
title_short Charge dynamics in electron-irradiated polymers
title_full Charge dynamics in electron-irradiated polymers
title_fullStr Charge dynamics in electron-irradiated polymers
title_full_unstemmed Charge dynamics in electron-irradiated polymers
title_sort Charge dynamics in electron-irradiated polymers
author Sessler,G. M.
author_facet Sessler,G. M.
Yang,G. M.
author_role author
author2 Yang,G. M.
author2_role author
dc.contributor.author.fl_str_mv Sessler,G. M.
Yang,G. M.
description Recent studies of charge trapping and charge transport in spolymer films irradiated and charged with monoenergetic electrons of range smaller than the sample thickness and thereafter stored or annealed under various conditions are discussed. An analytical model used to describe the phenomena takes the following parameters into consideration: Charge and energy deposition profiles, charge drift due to a shallow-trap-modulated mobility, deep trapping without release, trap filling due to a finite trap density, and ohmic relaxation due to a radiation-induced conductivity during irradiation and its delayed component after irradiation. The model calculations show the effect of various parameters on the shape of the initial charge distribution and on its evolution with annealing time. - Experiments with the laser-induced pressure-pulse (LIPP) method on 12 and 25<FONT FACE="Symbol">m</font>m thick fluorocarbon and polymide films, charged with 10 or keV electron beams, respectively, yield the charge distributions after irradiation and the changes of the distributions due to annealing of the samples at 120oC for various times. A comparison of experimental and analytical results reveals the trapping kinetics and permits to estimate the deep-trap density and the <FONT FACE="Symbol">mt</font>-product, where <FONT FACE="Symbol">m</font> is the trap-modulated mobilit and <FONT FACE="Symbol">t</font> is the trapping time.
publishDate 1999
dc.date.none.fl_str_mv 1999-06-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
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dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331999000200006
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dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/S0103-97331999000200006
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Sociedade Brasileira de Física
publisher.none.fl_str_mv Sociedade Brasileira de Física
dc.source.none.fl_str_mv Brazilian Journal of Physics v.29 n.2 1999
reponame:Brazilian Journal of Physics
instname:Sociedade Brasileira de Física (SBF)
instacron:SBF
instname_str Sociedade Brasileira de Física (SBF)
instacron_str SBF
institution SBF
reponame_str Brazilian Journal of Physics
collection Brazilian Journal of Physics
repository.name.fl_str_mv Brazilian Journal of Physics - Sociedade Brasileira de Física (SBF)
repository.mail.fl_str_mv sbfisica@sbfisica.org.br||sbfisica@sbfisica.org.br
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