Rice grain resistance to brown spot and yield are increased by silicon
Autor(a) principal: | |
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Data de Publicação: | 2014 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Tropical plant pathology (Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1982-56762014000100007 |
Resumo: | Brown spot, caused by Bipolaris oryzae, is one of the most important diseases of rice and can cause a reduction in yield and grain quality. The effect of silicon (Si) on the resistance of rice grains to brown spot was investigated. Plants from cv. Oochikara and its mutant, defective in the Lsi1 transporter (lsi1 mutant), were grown in hydroponic culture either with Si (+Si; 2 mM) or without Si (-Si). Panicle inoculation with B. oryzae was carried out at the beginning of the milk-grain stage. Panicles were harvested at physiological grain maturity. The supply of Si significantly increased Si concentration in husks compared to -Si plants. Si concentration in husks from cv. Oochikara was up to three times greater than the lsi1 mutant. In the presence of Si, brown spot severity was reduced by 88% in grains from cv. Oochikara and by 53% in grains from lsi1 mutant. Brown spot severity was 77% lower for grains of cv. Oochikara than for the lsi1 mutant, both plant types were grown in the presence of Si. Panicle inoculation reduced significantly the following yield components: number of grains per panicle, the weight of 1000 grains and the percentage of filled grains. Si significantly increased these yield components, especially for inoculated panicles. Considering kernel quality, the panicle inoculation with B. oryzae significantly reduced the yield of husked kernel, yield of whole kernel and kernel diameter, especially for grains from -Si plants. For panicles from +Si plants, the kernel quality was improved under inoculation, compared to -Si plants. Results from this study show that Si improved rice yield and kernel quality in panicles inoculated with B. oryzae. Furthermore the functional Lsi1 gene contributed significantly for increasing the yield of whole kernel and kernel diameter, possibly due to the increasing Si concentration in husks. |
id |
SBF-6_4a62718a5df2b62f94c5c667a4287182 |
---|---|
oai_identifier_str |
oai:scielo:S1982-56762014000100007 |
network_acronym_str |
SBF-6 |
network_name_str |
Tropical plant pathology (Online) |
repository_id_str |
|
spelling |
Rice grain resistance to brown spot and yield are increased by siliconBipolaris oryzaeOryza sativakernel qualityLsi1 generice yieldBrown spot, caused by Bipolaris oryzae, is one of the most important diseases of rice and can cause a reduction in yield and grain quality. The effect of silicon (Si) on the resistance of rice grains to brown spot was investigated. Plants from cv. Oochikara and its mutant, defective in the Lsi1 transporter (lsi1 mutant), were grown in hydroponic culture either with Si (+Si; 2 mM) or without Si (-Si). Panicle inoculation with B. oryzae was carried out at the beginning of the milk-grain stage. Panicles were harvested at physiological grain maturity. The supply of Si significantly increased Si concentration in husks compared to -Si plants. Si concentration in husks from cv. Oochikara was up to three times greater than the lsi1 mutant. In the presence of Si, brown spot severity was reduced by 88% in grains from cv. Oochikara and by 53% in grains from lsi1 mutant. Brown spot severity was 77% lower for grains of cv. Oochikara than for the lsi1 mutant, both plant types were grown in the presence of Si. Panicle inoculation reduced significantly the following yield components: number of grains per panicle, the weight of 1000 grains and the percentage of filled grains. Si significantly increased these yield components, especially for inoculated panicles. Considering kernel quality, the panicle inoculation with B. oryzae significantly reduced the yield of husked kernel, yield of whole kernel and kernel diameter, especially for grains from -Si plants. For panicles from +Si plants, the kernel quality was improved under inoculation, compared to -Si plants. Results from this study show that Si improved rice yield and kernel quality in panicles inoculated with B. oryzae. Furthermore the functional Lsi1 gene contributed significantly for increasing the yield of whole kernel and kernel diameter, possibly due to the increasing Si concentration in husks.Sociedade Brasileira de Fitopatologia2014-02-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1982-56762014000100007Tropical Plant Pathology v.39 n.1 2014reponame:Tropical plant pathology (Online)instname:Sociedade Brasileira de Fitopatologiainstacron:SBF10.1590/S1982-56762014005000003info:eu-repo/semantics/openAccessDallagnol,Leandro J.Rodrigues,Fabricio A.Mielli,Mateus V. B.Ma,Jian F.eng2014-02-18T00:00:00Zoai:scielo:S1982-56762014000100007Revistahttps://www.scielo.br/j/tpp/ONGhttps://old.scielo.br/oai/scielo-oai.phpsbf-revista@ufla.br1983-20521982-5676opendoar:2014-02-18T00:00Tropical plant pathology (Online) - Sociedade Brasileira de Fitopatologiafalse |
dc.title.none.fl_str_mv |
Rice grain resistance to brown spot and yield are increased by silicon |
title |
Rice grain resistance to brown spot and yield are increased by silicon |
spellingShingle |
Rice grain resistance to brown spot and yield are increased by silicon Dallagnol,Leandro J. Bipolaris oryzae Oryza sativa kernel quality Lsi1 gene rice yield |
title_short |
Rice grain resistance to brown spot and yield are increased by silicon |
title_full |
Rice grain resistance to brown spot and yield are increased by silicon |
title_fullStr |
Rice grain resistance to brown spot and yield are increased by silicon |
title_full_unstemmed |
Rice grain resistance to brown spot and yield are increased by silicon |
title_sort |
Rice grain resistance to brown spot and yield are increased by silicon |
author |
Dallagnol,Leandro J. |
author_facet |
Dallagnol,Leandro J. Rodrigues,Fabricio A. Mielli,Mateus V. B. Ma,Jian F. |
author_role |
author |
author2 |
Rodrigues,Fabricio A. Mielli,Mateus V. B. Ma,Jian F. |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Dallagnol,Leandro J. Rodrigues,Fabricio A. Mielli,Mateus V. B. Ma,Jian F. |
dc.subject.por.fl_str_mv |
Bipolaris oryzae Oryza sativa kernel quality Lsi1 gene rice yield |
topic |
Bipolaris oryzae Oryza sativa kernel quality Lsi1 gene rice yield |
description |
Brown spot, caused by Bipolaris oryzae, is one of the most important diseases of rice and can cause a reduction in yield and grain quality. The effect of silicon (Si) on the resistance of rice grains to brown spot was investigated. Plants from cv. Oochikara and its mutant, defective in the Lsi1 transporter (lsi1 mutant), were grown in hydroponic culture either with Si (+Si; 2 mM) or without Si (-Si). Panicle inoculation with B. oryzae was carried out at the beginning of the milk-grain stage. Panicles were harvested at physiological grain maturity. The supply of Si significantly increased Si concentration in husks compared to -Si plants. Si concentration in husks from cv. Oochikara was up to three times greater than the lsi1 mutant. In the presence of Si, brown spot severity was reduced by 88% in grains from cv. Oochikara and by 53% in grains from lsi1 mutant. Brown spot severity was 77% lower for grains of cv. Oochikara than for the lsi1 mutant, both plant types were grown in the presence of Si. Panicle inoculation reduced significantly the following yield components: number of grains per panicle, the weight of 1000 grains and the percentage of filled grains. Si significantly increased these yield components, especially for inoculated panicles. Considering kernel quality, the panicle inoculation with B. oryzae significantly reduced the yield of husked kernel, yield of whole kernel and kernel diameter, especially for grains from -Si plants. For panicles from +Si plants, the kernel quality was improved under inoculation, compared to -Si plants. Results from this study show that Si improved rice yield and kernel quality in panicles inoculated with B. oryzae. Furthermore the functional Lsi1 gene contributed significantly for increasing the yield of whole kernel and kernel diameter, possibly due to the increasing Si concentration in husks. |
publishDate |
2014 |
dc.date.none.fl_str_mv |
2014-02-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1982-56762014000100007 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1982-56762014000100007 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/S1982-56762014005000003 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Sociedade Brasileira de Fitopatologia |
publisher.none.fl_str_mv |
Sociedade Brasileira de Fitopatologia |
dc.source.none.fl_str_mv |
Tropical Plant Pathology v.39 n.1 2014 reponame:Tropical plant pathology (Online) instname:Sociedade Brasileira de Fitopatologia instacron:SBF |
instname_str |
Sociedade Brasileira de Fitopatologia |
instacron_str |
SBF |
institution |
SBF |
reponame_str |
Tropical plant pathology (Online) |
collection |
Tropical plant pathology (Online) |
repository.name.fl_str_mv |
Tropical plant pathology (Online) - Sociedade Brasileira de Fitopatologia |
repository.mail.fl_str_mv |
sbf-revista@ufla.br |
_version_ |
1754824586410590208 |