2-D ZO CRS stack by considering an acquisition line with smooth topography

• Autor(a) principal: Chira-Oliva,Pedro
• Data de Publicação: 2005
• Outros Autores: Cruz,João Carlos R, Garabito,German, Hubral,Peter, Tygel,Martin
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Revista Brasileira de Geofísica (Online)
• Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0102-261X2005000100002
• topic: CRS stack; smooth topography; measurement surface curvature; near-surface irregularities

The land seismic data suffers from effects due to the near surface irregularities and the existence of topography. For obtaining a high resolution seismic image, these effects should be corrected by using seismic processing techniques, e.g. field and residual static corrections. The Common-Reflection-Surface (CRS) stack method is a new processing technique to simulate zero-offset (ZO) seismic sections from multi-coverage seismic data. It is based on a second-order hyperbolic paraxial traveltime approximation referred to a central normal ray. By considering a planar measurement surface, the CRS stacking operator is defined by means of three parameters, namely the emergence angle of the normal ray, the curvature of the normal incidence point (NIP) wave, and the curvature of the normal (N) wave. In this paper the 2-D ZO CRS stack method is modified in order to consider effects due to the smooth topography. By means of this new CRS formalism, we obtain a high resolution ZO seismic section, without applying static corrections. As by-products the 2-D ZO CRS stack method we estimate at each point of the ZO seismic section the three relevant parameters associated to the CRS stack process.