A methodology for performance evaluation of LEDs based on ac small signal analysis

Detalhes bibliográficos
Autor(a) principal: Coêlho,Isnaldo J. Souza
Data de Publicação: 2013
Outros Autores: Silva,James N. da
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Journal of Microwaves. Optoelectronics and Electromagnetic Applications
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000200026
Resumo: This paper shows fundamentals and results that support a promising methodology for evaluation in locus of a LED from its own radiating signal, and that allows monitoring of its aging by remote inference on which degradation mechanism is acting internally to the device's structure. It brings out also an alternative route for estimation of parameters of the Shockley's equation directly from small-signal ac analysis in a simple bench circuit. This last approach is shown to be effective and advantageous relatively to methods which take near a hundred points to achieve good estimations, while it uses only two points of the I-V static characteristic. Both approaches __ referred to as remote inference method (RIM) and two-points method (TPM) __ are applied together to show that external quantum efficiency (EQE) can be closely correlated to the injection process assumed to take place in that emitting device, meanwhile overvalued serial resistances due to neutral layers and ohmic contacts in electrodes affect only its electrical performance.
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spelling A methodology for performance evaluation of LEDs based on ac small signal analysiscurves I-VdiodeLEDShockley equationThis paper shows fundamentals and results that support a promising methodology for evaluation in locus of a LED from its own radiating signal, and that allows monitoring of its aging by remote inference on which degradation mechanism is acting internally to the device's structure. It brings out also an alternative route for estimation of parameters of the Shockley's equation directly from small-signal ac analysis in a simple bench circuit. This last approach is shown to be effective and advantageous relatively to methods which take near a hundred points to achieve good estimations, while it uses only two points of the I-V static characteristic. Both approaches __ referred to as remote inference method (RIM) and two-points method (TPM) __ are applied together to show that external quantum efficiency (EQE) can be closely correlated to the injection process assumed to take place in that emitting device, meanwhile overvalued serial resistances due to neutral layers and ohmic contacts in electrodes affect only its electrical performance.Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo2013-12-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000200026Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.12 n.2 2013reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applicationsinstname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)instacron:SBMO10.1590/S2179-10742013000200026info:eu-repo/semantics/openAccessCoêlho,Isnaldo J. SouzaSilva,James N. daeng2014-02-10T00:00:00Zoai:scielo:S2179-10742013000200026Revistahttp://www.jmoe.org/index.php/jmoe/indexONGhttps://old.scielo.br/oai/scielo-oai.php||editor_jmoe@sbmo.org.br2179-10742179-1074opendoar:2014-02-10T00:00Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)false
dc.title.none.fl_str_mv A methodology for performance evaluation of LEDs based on ac small signal analysis
title A methodology for performance evaluation of LEDs based on ac small signal analysis
spellingShingle A methodology for performance evaluation of LEDs based on ac small signal analysis
Coêlho,Isnaldo J. Souza
curves I-V
diode
LED
Shockley equation
title_short A methodology for performance evaluation of LEDs based on ac small signal analysis
title_full A methodology for performance evaluation of LEDs based on ac small signal analysis
title_fullStr A methodology for performance evaluation of LEDs based on ac small signal analysis
title_full_unstemmed A methodology for performance evaluation of LEDs based on ac small signal analysis
title_sort A methodology for performance evaluation of LEDs based on ac small signal analysis
author Coêlho,Isnaldo J. Souza
author_facet Coêlho,Isnaldo J. Souza
Silva,James N. da
author_role author
author2 Silva,James N. da
author2_role author
dc.contributor.author.fl_str_mv Coêlho,Isnaldo J. Souza
Silva,James N. da
dc.subject.por.fl_str_mv curves I-V
diode
LED
Shockley equation
topic curves I-V
diode
LED
Shockley equation
description This paper shows fundamentals and results that support a promising methodology for evaluation in locus of a LED from its own radiating signal, and that allows monitoring of its aging by remote inference on which degradation mechanism is acting internally to the device's structure. It brings out also an alternative route for estimation of parameters of the Shockley's equation directly from small-signal ac analysis in a simple bench circuit. This last approach is shown to be effective and advantageous relatively to methods which take near a hundred points to achieve good estimations, while it uses only two points of the I-V static characteristic. Both approaches __ referred to as remote inference method (RIM) and two-points method (TPM) __ are applied together to show that external quantum efficiency (EQE) can be closely correlated to the injection process assumed to take place in that emitting device, meanwhile overvalued serial resistances due to neutral layers and ohmic contacts in electrodes affect only its electrical performance.
publishDate 2013
dc.date.none.fl_str_mv 2013-12-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000200026
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000200026
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/S2179-10742013000200026
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo
publisher.none.fl_str_mv Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo
dc.source.none.fl_str_mv Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.12 n.2 2013
reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applications
instname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)
instacron:SBMO
instname_str Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)
instacron_str SBMO
institution SBMO
reponame_str Journal of Microwaves. Optoelectronics and Electromagnetic Applications
collection Journal of Microwaves. Optoelectronics and Electromagnetic Applications
repository.name.fl_str_mv Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)
repository.mail.fl_str_mv ||editor_jmoe@sbmo.org.br
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