A methodology for performance evaluation of LEDs based on ac small signal analysis
Autor(a) principal: | |
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Data de Publicação: | 2013 |
Outros Autores: | |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Journal of Microwaves. Optoelectronics and Electromagnetic Applications |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000200026 |
Resumo: | This paper shows fundamentals and results that support a promising methodology for evaluation in locus of a LED from its own radiating signal, and that allows monitoring of its aging by remote inference on which degradation mechanism is acting internally to the device's structure. It brings out also an alternative route for estimation of parameters of the Shockley's equation directly from small-signal ac analysis in a simple bench circuit. This last approach is shown to be effective and advantageous relatively to methods which take near a hundred points to achieve good estimations, while it uses only two points of the I-V static characteristic. Both approaches __ referred to as remote inference method (RIM) and two-points method (TPM) __ are applied together to show that external quantum efficiency (EQE) can be closely correlated to the injection process assumed to take place in that emitting device, meanwhile overvalued serial resistances due to neutral layers and ohmic contacts in electrodes affect only its electrical performance. |
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Journal of Microwaves. Optoelectronics and Electromagnetic Applications |
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A methodology for performance evaluation of LEDs based on ac small signal analysiscurves I-VdiodeLEDShockley equationThis paper shows fundamentals and results that support a promising methodology for evaluation in locus of a LED from its own radiating signal, and that allows monitoring of its aging by remote inference on which degradation mechanism is acting internally to the device's structure. It brings out also an alternative route for estimation of parameters of the Shockley's equation directly from small-signal ac analysis in a simple bench circuit. This last approach is shown to be effective and advantageous relatively to methods which take near a hundred points to achieve good estimations, while it uses only two points of the I-V static characteristic. Both approaches __ referred to as remote inference method (RIM) and two-points method (TPM) __ are applied together to show that external quantum efficiency (EQE) can be closely correlated to the injection process assumed to take place in that emitting device, meanwhile overvalued serial resistances due to neutral layers and ohmic contacts in electrodes affect only its electrical performance.Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo2013-12-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000200026Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.12 n.2 2013reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applicationsinstname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)instacron:SBMO10.1590/S2179-10742013000200026info:eu-repo/semantics/openAccessCoêlho,Isnaldo J. SouzaSilva,James N. daeng2014-02-10T00:00:00Zoai:scielo:S2179-10742013000200026Revistahttp://www.jmoe.org/index.php/jmoe/indexONGhttps://old.scielo.br/oai/scielo-oai.php||editor_jmoe@sbmo.org.br2179-10742179-1074opendoar:2014-02-10T00:00Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)false |
dc.title.none.fl_str_mv |
A methodology for performance evaluation of LEDs based on ac small signal analysis |
title |
A methodology for performance evaluation of LEDs based on ac small signal analysis |
spellingShingle |
A methodology for performance evaluation of LEDs based on ac small signal analysis Coêlho,Isnaldo J. Souza curves I-V diode LED Shockley equation |
title_short |
A methodology for performance evaluation of LEDs based on ac small signal analysis |
title_full |
A methodology for performance evaluation of LEDs based on ac small signal analysis |
title_fullStr |
A methodology for performance evaluation of LEDs based on ac small signal analysis |
title_full_unstemmed |
A methodology for performance evaluation of LEDs based on ac small signal analysis |
title_sort |
A methodology for performance evaluation of LEDs based on ac small signal analysis |
author |
Coêlho,Isnaldo J. Souza |
author_facet |
Coêlho,Isnaldo J. Souza Silva,James N. da |
author_role |
author |
author2 |
Silva,James N. da |
author2_role |
author |
dc.contributor.author.fl_str_mv |
Coêlho,Isnaldo J. Souza Silva,James N. da |
dc.subject.por.fl_str_mv |
curves I-V diode LED Shockley equation |
topic |
curves I-V diode LED Shockley equation |
description |
This paper shows fundamentals and results that support a promising methodology for evaluation in locus of a LED from its own radiating signal, and that allows monitoring of its aging by remote inference on which degradation mechanism is acting internally to the device's structure. It brings out also an alternative route for estimation of parameters of the Shockley's equation directly from small-signal ac analysis in a simple bench circuit. This last approach is shown to be effective and advantageous relatively to methods which take near a hundred points to achieve good estimations, while it uses only two points of the I-V static characteristic. Both approaches __ referred to as remote inference method (RIM) and two-points method (TPM) __ are applied together to show that external quantum efficiency (EQE) can be closely correlated to the injection process assumed to take place in that emitting device, meanwhile overvalued serial resistances due to neutral layers and ohmic contacts in electrodes affect only its electrical performance. |
publishDate |
2013 |
dc.date.none.fl_str_mv |
2013-12-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000200026 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742013000200026 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/S2179-10742013000200026 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo |
publisher.none.fl_str_mv |
Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo |
dc.source.none.fl_str_mv |
Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.12 n.2 2013 reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applications instname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO) instacron:SBMO |
instname_str |
Sociedade Brasileira de Microondas e Optoeletrônica (SBMO) |
instacron_str |
SBMO |
institution |
SBMO |
reponame_str |
Journal of Microwaves. Optoelectronics and Electromagnetic Applications |
collection |
Journal of Microwaves. Optoelectronics and Electromagnetic Applications |
repository.name.fl_str_mv |
Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO) |
repository.mail.fl_str_mv |
||editor_jmoe@sbmo.org.br |
_version_ |
1752122125732282368 |