Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method
Autor(a) principal: | |
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Data de Publicação: | 2015 |
Outros Autores: | , , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Journal of the Brazilian Chemical Society (Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50532015000500978 |
Resumo: | Few-layered graphene oxide (GO) was prepared using a fast and energy-saving method by microwave-assisted acid technique. The oxygenated groups existing on the GO surface were determined using UV-Vis, X-ray photoelectron and Fourier-transform infrared spectroscopies. An oxygenated group percentage of 30% in mass for the GO was observed by thermogravimetric analysis. The reduced few-layered graphene oxide (rGO) film annealed at 110 °C deposited onto a silicon/silica wafer showed expanded graphite-like structure with 0.70 nm between the rGO sheets, as determined by X-ray diffraction. This rGO film exhibited a relatively high electrical conductivity value of 7.36 × 102 S m-1 confirming the good restoration of the π-conjugated system. The prepared GO sample exhibited good stability in water from pH 4 to 12, as determined by its zeta potential, and contained 5 to 9 layers, as determined by atomic force microscopy (AFM) and transmission electron microscopy (TEM). |
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Facile Graphene Oxide Preparation by Microwave-Assisted Acid Methodmicrowave irradiationgraphene oxidefilmconductivityFew-layered graphene oxide (GO) was prepared using a fast and energy-saving method by microwave-assisted acid technique. The oxygenated groups existing on the GO surface were determined using UV-Vis, X-ray photoelectron and Fourier-transform infrared spectroscopies. An oxygenated group percentage of 30% in mass for the GO was observed by thermogravimetric analysis. The reduced few-layered graphene oxide (rGO) film annealed at 110 °C deposited onto a silicon/silica wafer showed expanded graphite-like structure with 0.70 nm between the rGO sheets, as determined by X-ray diffraction. This rGO film exhibited a relatively high electrical conductivity value of 7.36 × 102 S m-1 confirming the good restoration of the π-conjugated system. The prepared GO sample exhibited good stability in water from pH 4 to 12, as determined by its zeta potential, and contained 5 to 9 layers, as determined by atomic force microscopy (AFM) and transmission electron microscopy (TEM).Sociedade Brasileira de Química2015-05-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50532015000500978Journal of the Brazilian Chemical Society v.26 n.5 2015reponame:Journal of the Brazilian Chemical Society (Online)instname:Sociedade Brasileira de Química (SBQ)instacron:SBQ10.5935/0103-5053.20150061info:eu-repo/semantics/openAccessViana,Marcelo M.Lima,Meiriane C. F. S.Forsythe,Jerimiah C.Gangoli,Varun S.Cho,MinjungCheng,YinhongSilva,Glaura G.Wong,Michael S.Caliman,Viniciuseng2015-10-26T00:00:00Zoai:scielo:S0103-50532015000500978Revistahttp://jbcs.sbq.org.brONGhttps://old.scielo.br/oai/scielo-oai.php||office@jbcs.sbq.org.br1678-47900103-5053opendoar:2015-10-26T00:00Journal of the Brazilian Chemical Society (Online) - Sociedade Brasileira de Química (SBQ)false |
dc.title.none.fl_str_mv |
Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method |
title |
Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method |
spellingShingle |
Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method Viana,Marcelo M. microwave irradiation graphene oxide film conductivity |
title_short |
Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method |
title_full |
Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method |
title_fullStr |
Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method |
title_full_unstemmed |
Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method |
title_sort |
Facile Graphene Oxide Preparation by Microwave-Assisted Acid Method |
author |
Viana,Marcelo M. |
author_facet |
Viana,Marcelo M. Lima,Meiriane C. F. S. Forsythe,Jerimiah C. Gangoli,Varun S. Cho,Minjung Cheng,Yinhong Silva,Glaura G. Wong,Michael S. Caliman,Vinicius |
author_role |
author |
author2 |
Lima,Meiriane C. F. S. Forsythe,Jerimiah C. Gangoli,Varun S. Cho,Minjung Cheng,Yinhong Silva,Glaura G. Wong,Michael S. Caliman,Vinicius |
author2_role |
author author author author author author author author |
dc.contributor.author.fl_str_mv |
Viana,Marcelo M. Lima,Meiriane C. F. S. Forsythe,Jerimiah C. Gangoli,Varun S. Cho,Minjung Cheng,Yinhong Silva,Glaura G. Wong,Michael S. Caliman,Vinicius |
dc.subject.por.fl_str_mv |
microwave irradiation graphene oxide film conductivity |
topic |
microwave irradiation graphene oxide film conductivity |
description |
Few-layered graphene oxide (GO) was prepared using a fast and energy-saving method by microwave-assisted acid technique. The oxygenated groups existing on the GO surface were determined using UV-Vis, X-ray photoelectron and Fourier-transform infrared spectroscopies. An oxygenated group percentage of 30% in mass for the GO was observed by thermogravimetric analysis. The reduced few-layered graphene oxide (rGO) film annealed at 110 °C deposited onto a silicon/silica wafer showed expanded graphite-like structure with 0.70 nm between the rGO sheets, as determined by X-ray diffraction. This rGO film exhibited a relatively high electrical conductivity value of 7.36 × 102 S m-1 confirming the good restoration of the π-conjugated system. The prepared GO sample exhibited good stability in water from pH 4 to 12, as determined by its zeta potential, and contained 5 to 9 layers, as determined by atomic force microscopy (AFM) and transmission electron microscopy (TEM). |
publishDate |
2015 |
dc.date.none.fl_str_mv |
2015-05-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50532015000500978 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50532015000500978 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.5935/0103-5053.20150061 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Sociedade Brasileira de Química |
publisher.none.fl_str_mv |
Sociedade Brasileira de Química |
dc.source.none.fl_str_mv |
Journal of the Brazilian Chemical Society v.26 n.5 2015 reponame:Journal of the Brazilian Chemical Society (Online) instname:Sociedade Brasileira de Química (SBQ) instacron:SBQ |
instname_str |
Sociedade Brasileira de Química (SBQ) |
instacron_str |
SBQ |
institution |
SBQ |
reponame_str |
Journal of the Brazilian Chemical Society (Online) |
collection |
Journal of the Brazilian Chemical Society (Online) |
repository.name.fl_str_mv |
Journal of the Brazilian Chemical Society (Online) - Sociedade Brasileira de Química (SBQ) |
repository.mail.fl_str_mv |
||office@jbcs.sbq.org.br |
_version_ |
1750318177080836096 |