The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials

Detalhes bibliográficos
Autor(a) principal: Zerbino,J.O.
Data de Publicação: 1997
Outros Autores: López de Mishima,B. A., López Teijelo,M., Maltz,A., Hernández Úbeda,M.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Journal of the Brazilian Chemical Society (Online)
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50531997000200005
Resumo: The galvanostatic electrodeposition of manganese dioxide films in the thickness range from 0 to 1000 nm was investigated by in situ ellipsometry. The results obtained can be fit into the whole thickness range in terms of the uniaxial anisotropy of the film. The optical indices and thicknesses were calculated. The anisotropic properties may be related to a preferential orientation of the deposits.
id SBQ-2_894ce6cb55fbe2b14914704eab0e56c6
oai_identifier_str oai:scielo:S0103-50531997000200005
network_acronym_str SBQ-2
network_name_str Journal of the Brazilian Chemical Society (Online)
repository_id_str
spelling The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentialsellipsometrymanganese oxideanisotropyThe galvanostatic electrodeposition of manganese dioxide films in the thickness range from 0 to 1000 nm was investigated by in situ ellipsometry. The results obtained can be fit into the whole thickness range in terms of the uniaxial anisotropy of the film. The optical indices and thicknesses were calculated. The anisotropic properties may be related to a preferential orientation of the deposits.Sociedade Brasileira de Química1997-01-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50531997000200005Journal of the Brazilian Chemical Society v.8 n.2 1997reponame:Journal of the Brazilian Chemical Society (Online)instname:Sociedade Brasileira de Química (SBQ)instacron:SBQ10.1590/S0103-50531997000200005info:eu-repo/semantics/openAccessZerbino,J.O.López de Mishima,B. A.López Teijelo,M.Maltz,A.Hernández Úbeda,M.eng2013-04-10T00:00:00Zoai:scielo:S0103-50531997000200005Revistahttp://jbcs.sbq.org.brONGhttps://old.scielo.br/oai/scielo-oai.php||office@jbcs.sbq.org.br1678-47900103-5053opendoar:2013-04-10T00:00Journal of the Brazilian Chemical Society (Online) - Sociedade Brasileira de Química (SBQ)false
dc.title.none.fl_str_mv The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials
title The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials
spellingShingle The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials
Zerbino,J.O.
ellipsometry
manganese oxide
anisotropy
title_short The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials
title_full The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials
title_fullStr The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials
title_full_unstemmed The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials
title_sort The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials
author Zerbino,J.O.
author_facet Zerbino,J.O.
López de Mishima,B. A.
López Teijelo,M.
Maltz,A.
Hernández Úbeda,M.
author_role author
author2 López de Mishima,B. A.
López Teijelo,M.
Maltz,A.
Hernández Úbeda,M.
author2_role author
author
author
author
dc.contributor.author.fl_str_mv Zerbino,J.O.
López de Mishima,B. A.
López Teijelo,M.
Maltz,A.
Hernández Úbeda,M.
dc.subject.por.fl_str_mv ellipsometry
manganese oxide
anisotropy
topic ellipsometry
manganese oxide
anisotropy
description The galvanostatic electrodeposition of manganese dioxide films in the thickness range from 0 to 1000 nm was investigated by in situ ellipsometry. The results obtained can be fit into the whole thickness range in terms of the uniaxial anisotropy of the film. The optical indices and thicknesses were calculated. The anisotropic properties may be related to a preferential orientation of the deposits.
publishDate 1997
dc.date.none.fl_str_mv 1997-01-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50531997000200005
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50531997000200005
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/S0103-50531997000200005
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Sociedade Brasileira de Química
publisher.none.fl_str_mv Sociedade Brasileira de Química
dc.source.none.fl_str_mv Journal of the Brazilian Chemical Society v.8 n.2 1997
reponame:Journal of the Brazilian Chemical Society (Online)
instname:Sociedade Brasileira de Química (SBQ)
instacron:SBQ
instname_str Sociedade Brasileira de Química (SBQ)
instacron_str SBQ
institution SBQ
reponame_str Journal of the Brazilian Chemical Society (Online)
collection Journal of the Brazilian Chemical Society (Online)
repository.name.fl_str_mv Journal of the Brazilian Chemical Society (Online) - Sociedade Brasileira de Química (SBQ)
repository.mail.fl_str_mv ||office@jbcs.sbq.org.br
_version_ 1750318163002654720

Registros relacionados