Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico
Autor(a) principal: | |
---|---|
Data de Publicação: | 2015 |
Tipo de documento: | Tese |
Idioma: | por |
Título da fonte: | Repositório Institucional da UFSCAR |
Texto Completo: | https://repositorio.ufscar.br/handle/ufscar/7818 |
Resumo: | The increase in the consumer electronics equipment, especially, the cell has aroused the academia and society in general interest. Such equipment when obsolete became part of the so-called junk mail. Among the components of this type of waste, are the printed circuit boards (PCB’s). The concentration of toxic elements such as Cd, Cr and Pb these PCB has proved high. Because of this situation becomes important to develop analytical methodologies for evaluation of these dangerous elements in PCB. Among the analytical techniques available, the most used in the determination of these elements has been the ICP OES. The evaluation of samples PCB by ICP OES performed in this study revealed that in addition to the regulated elements by RoHS (Cd, Cr and Pb), are present in high quantities, the elements Ba (2% w/w) and As (400 mg/kg). The Cu element was the one with the highest levels of concentration in some samples amounted to 35% (m/m). The use of a multivariate analysis such as PCA, showed some correlation between certain elements of the PCB. This is observed for the elements Ba and Ni, and also to the As, Cr and Fe. Alternatively to the use of techniques that require a pretreatment of the samples comes LIBS. The obtained emission spectra provided important information about the composition of these PCB’s. An analysis of the spectra reveals the presence of emission lines of elements such as Ba, Cd, Pb, Ni, Cu, Fe, Sb, among others. The elements that provide the most intense emission lines were Cu and Ba. Based on the obtained reference concentration by ICP OES and the values of the area and intensity of the spectra obtained, the construction of multivariate calibration models has been proposed. Employing MLR was possible to build the multivariate calibration models for elements of interest. However, due to lack of verified correction, among the area parameters, maximum intensity and reference concentrations, the proposed models are considered viable. However, the use of LIBS for characterization purposes samples for the presence of an element, shown to be feasible from a qualitative point of view. |
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Santos, Jozemir Miranda dosPereira Filho, Edenir Rodrigueshttp://lattes.cnpq.br/3394181280355442http://lattes.cnpq.br/370170296374002522852daf-0c7e-4477-88ef-d9685bb32d882016-10-13T19:49:15Z2016-10-13T19:49:15Z2015-11-26SANTOS, Jozemir Miranda dos. Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico. 2015. Tese (Doutorado em Química) – Universidade Federal de São Carlos, São Carlos, 2015. Disponível em: https://repositorio.ufscar.br/handle/ufscar/7818.https://repositorio.ufscar.br/handle/ufscar/7818The increase in the consumer electronics equipment, especially, the cell has aroused the academia and society in general interest. Such equipment when obsolete became part of the so-called junk mail. Among the components of this type of waste, are the printed circuit boards (PCB’s). The concentration of toxic elements such as Cd, Cr and Pb these PCB has proved high. Because of this situation becomes important to develop analytical methodologies for evaluation of these dangerous elements in PCB. Among the analytical techniques available, the most used in the determination of these elements has been the ICP OES. The evaluation of samples PCB by ICP OES performed in this study revealed that in addition to the regulated elements by RoHS (Cd, Cr and Pb), are present in high quantities, the elements Ba (2% w/w) and As (400 mg/kg). The Cu element was the one with the highest levels of concentration in some samples amounted to 35% (m/m). The use of a multivariate analysis such as PCA, showed some correlation between certain elements of the PCB. This is observed for the elements Ba and Ni, and also to the As, Cr and Fe. Alternatively to the use of techniques that require a pretreatment of the samples comes LIBS. The obtained emission spectra provided important information about the composition of these PCB’s. An analysis of the spectra reveals the presence of emission lines of elements such as Ba, Cd, Pb, Ni, Cu, Fe, Sb, among others. The elements that provide the most intense emission lines were Cu and Ba. Based on the obtained reference concentration by ICP OES and the values of the area and intensity of the spectra obtained, the construction of multivariate calibration models has been proposed. Employing MLR was possible to build the multivariate calibration models for elements of interest. However, due to lack of verified correction, among the area parameters, maximum intensity and reference concentrations, the proposed models are considered viable. However, the use of LIBS for characterization purposes samples for the presence of an element, shown to be feasible from a qualitative point of view.O aumento no consumo de equipamentos eletroeletrônicos, em especial os celulares têm despertado o interesse acadêmico e da sociedade em geral. Tais equipamentos quando obsoletos passam a compor o denominado lixo eletrônico. Entre os componentes desse tipo de lixo, estão as placas de circuito impresso (PCI). A concentração de elementos tóxicos, como por exemplo, Cd, Cr e Pb nestas PCI’s tem se mostrado elevadas. Devido a esse panorama torna-se importante o desenvolvimento de metodologias analíticas para avaliação desses elementos perigosos em PCI. Entre as técnicas analíticas disponíveis, a mais utilizada na determinação desses elementos tem sido a ICP OES. A avaliação de amostras de PCI por ICP OES realizada neste trabalho, revelou que além dos elementos mencionados pela RoHS (Cd, Cr e Pb), estão presentes em quantidades elevadas, os elementos Ba (até 2% m/m) e As (até 400 mg/kg). O elemento Cu foi o que apresentou os maiores teores de concentração, em algumas amostras atingiu os 35% (m/m). O uso de uma análise multivariada, como a PCA, revelou a correlação entre alguns elementos determinados nas PCI’s. Isso é observado para os elementos Ba e Ni, e ainda para os elementos As, Cr e Fe. Alternativamente ao uso de técnicas que necessitam de um pré-tratamento das amostras, surge a LIBS. Os espectros de emissão obtidos forneceram informações importantes sobre a composição dessas PCI’s. Uma análise dos espectros obtidos revelou a presença de linhas de emissão de elementos, como por exemplo, Ba, Cd, Pb, Ni, Cu, Fe, Sb, dentre outros. Os elementos que forneceram as linhas de emissão mais intensas foram o Cu e o Ba. A partir das concentrações de referência obtidas por ICP OES e dos valores da área e intensidade obtidas dos espectros, foi proposto a construção de modelos de calibração multivariada. Empregando Regressão Linear Múltipla (MLR) foi possível construir os modelos de calibração multivariada para os elementos de interesse. Entretanto, devido a falta de correção verificada, entre os parâmetros área, intensidade máxima e concentrações de referência, os modelos propostos são considerados não confiáveis. Contudo, a utilização da LIBS para fins de caracterização de amostras quanto a presença de um determinado elemento, mostrou-se viável e aplicável do ponto de vista qualitativo.Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)porUniversidade Federal de São CarlosCâmpus São CarlosPrograma de Pós-Graduação em Química - PPGQUFSCarLixo eletrônicoEspectroanalíticaLIBSQuimiometriaCIENCIAS EXATAS E DA TERRA::QUIMICA::QUIMICA ANALITICAUso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônicoTechniques espectroanalíticas use the boards samples assessment of printed circuit electronic wasteinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/doctoralThesisOnline600600cc86aeec-dd0e-4a5e-9ae0-d3a038091433info:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFSCARinstname:Universidade Federal de São Carlos (UFSCAR)instacron:UFSCARORIGINALTeseJMS.pdfTeseJMS.pdfapplication/pdf2119796https://repositorio.ufscar.br/bitstream/ufscar/7818/1/TeseJMS.pdfb78891c13a589bb6546e47a89e7da228MD51LICENSElicense.txtlicense.txttext/plain; charset=utf-81957https://repositorio.ufscar.br/bitstream/ufscar/7818/2/license.txtae0398b6f8b235e40ad82cba6c50031dMD52TEXTTeseJMS.pdf.txtTeseJMS.pdf.txtExtracted texttext/plain181577https://repositorio.ufscar.br/bitstream/ufscar/7818/3/TeseJMS.pdf.txtc3de588844998cf616a343d3880b7b09MD53THUMBNAILTeseJMS.pdf.jpgTeseJMS.pdf.jpgIM Thumbnailimage/jpeg10758https://repositorio.ufscar.br/bitstream/ufscar/7818/4/TeseJMS.pdf.jpg4bc1a7bf6089af1277522776a06bc3d6MD54ufscar/78182023-09-18 18:31:00.055oai:repositorio.ufscar.br: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Repositório InstitucionalPUBhttps://repositorio.ufscar.br/oai/requestopendoar:43222023-09-18T18:31Repositório Institucional da UFSCAR - Universidade Federal de São Carlos (UFSCAR)false |
dc.title.por.fl_str_mv |
Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico |
dc.title.alternative.eng.fl_str_mv |
Techniques espectroanalíticas use the boards samples assessment of printed circuit electronic waste |
title |
Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico |
spellingShingle |
Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico Santos, Jozemir Miranda dos Lixo eletrônico Espectroanalítica LIBS Quimiometria CIENCIAS EXATAS E DA TERRA::QUIMICA::QUIMICA ANALITICA |
title_short |
Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico |
title_full |
Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico |
title_fullStr |
Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico |
title_full_unstemmed |
Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico |
title_sort |
Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico |
author |
Santos, Jozemir Miranda dos |
author_facet |
Santos, Jozemir Miranda dos |
author_role |
author |
dc.contributor.authorlattes.por.fl_str_mv |
http://lattes.cnpq.br/3701702963740025 |
dc.contributor.author.fl_str_mv |
Santos, Jozemir Miranda dos |
dc.contributor.advisor1.fl_str_mv |
Pereira Filho, Edenir Rodrigues |
dc.contributor.advisor1Lattes.fl_str_mv |
http://lattes.cnpq.br/3394181280355442 |
dc.contributor.authorID.fl_str_mv |
22852daf-0c7e-4477-88ef-d9685bb32d88 |
contributor_str_mv |
Pereira Filho, Edenir Rodrigues |
dc.subject.por.fl_str_mv |
Lixo eletrônico Espectroanalítica LIBS Quimiometria |
topic |
Lixo eletrônico Espectroanalítica LIBS Quimiometria CIENCIAS EXATAS E DA TERRA::QUIMICA::QUIMICA ANALITICA |
dc.subject.cnpq.fl_str_mv |
CIENCIAS EXATAS E DA TERRA::QUIMICA::QUIMICA ANALITICA |
description |
The increase in the consumer electronics equipment, especially, the cell has aroused the academia and society in general interest. Such equipment when obsolete became part of the so-called junk mail. Among the components of this type of waste, are the printed circuit boards (PCB’s). The concentration of toxic elements such as Cd, Cr and Pb these PCB has proved high. Because of this situation becomes important to develop analytical methodologies for evaluation of these dangerous elements in PCB. Among the analytical techniques available, the most used in the determination of these elements has been the ICP OES. The evaluation of samples PCB by ICP OES performed in this study revealed that in addition to the regulated elements by RoHS (Cd, Cr and Pb), are present in high quantities, the elements Ba (2% w/w) and As (400 mg/kg). The Cu element was the one with the highest levels of concentration in some samples amounted to 35% (m/m). The use of a multivariate analysis such as PCA, showed some correlation between certain elements of the PCB. This is observed for the elements Ba and Ni, and also to the As, Cr and Fe. Alternatively to the use of techniques that require a pretreatment of the samples comes LIBS. The obtained emission spectra provided important information about the composition of these PCB’s. An analysis of the spectra reveals the presence of emission lines of elements such as Ba, Cd, Pb, Ni, Cu, Fe, Sb, among others. The elements that provide the most intense emission lines were Cu and Ba. Based on the obtained reference concentration by ICP OES and the values of the area and intensity of the spectra obtained, the construction of multivariate calibration models has been proposed. Employing MLR was possible to build the multivariate calibration models for elements of interest. However, due to lack of verified correction, among the area parameters, maximum intensity and reference concentrations, the proposed models are considered viable. However, the use of LIBS for characterization purposes samples for the presence of an element, shown to be feasible from a qualitative point of view. |
publishDate |
2015 |
dc.date.issued.fl_str_mv |
2015-11-26 |
dc.date.accessioned.fl_str_mv |
2016-10-13T19:49:15Z |
dc.date.available.fl_str_mv |
2016-10-13T19:49:15Z |
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info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/doctoralThesis |
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doctoralThesis |
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publishedVersion |
dc.identifier.citation.fl_str_mv |
SANTOS, Jozemir Miranda dos. Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico. 2015. Tese (Doutorado em Química) – Universidade Federal de São Carlos, São Carlos, 2015. Disponível em: https://repositorio.ufscar.br/handle/ufscar/7818. |
dc.identifier.uri.fl_str_mv |
https://repositorio.ufscar.br/handle/ufscar/7818 |
identifier_str_mv |
SANTOS, Jozemir Miranda dos. Uso de técnicas espectroanalíticas na avaliação de amostras de placas de circuito impresso de lixo eletrônico. 2015. Tese (Doutorado em Química) – Universidade Federal de São Carlos, São Carlos, 2015. Disponível em: https://repositorio.ufscar.br/handle/ufscar/7818. |
url |
https://repositorio.ufscar.br/handle/ufscar/7818 |
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por |
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por |
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openAccess |
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Universidade Federal de São Carlos Câmpus São Carlos |
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Programa de Pós-Graduação em Química - PPGQ |
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UFSCar |
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Universidade Federal de São Carlos Câmpus São Carlos |
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