Análise de cobertura de metal-metal por XRF

• Autor(a) principal: Lima, Daniel Frota
• Data de Publicação: 2011
• Tipo de documento: Dissertação
• Idioma: por
• Título da fonte: Biblioteca Digital de Teses e Dissertações da UERJ
• Texto Completo: http://www.bdtd.uerj.br/handle/1/7997
• topic: Artax 200; Electrodeposition of metal; X-Ray Fluorescence; XMudat Software; Artax 200; Eletrodeposição de metal. Fluorescência de raios X; Software XMudat; Galvanoplastia; CNPQ::ENGENHARIAS::ENGENHARIA DE MATERIAIS E METALURGICA

The proposal concerning the study was to measure the thickness of the deposit of a basemetal into another metal, ie, using the electrochemical processes of the electroplating orelectrodeposition of this metal, through the technique of X-ray fluorescence (XRF). The use of this technique was justified by the interest in reducing the excessive costs during the electrochemical process, as well as minimize the possible margins of error to obtain satisfactory results in the measures. In this paper, we include measures of the thickness of the nickel (Ni) and analysis of radiation mitigation and radiation incidents, according to the thickness of the elements Chromium (Cr) and zinc (Zn), taking as base metal element iron (Fe). As a result, in all cases were simulated processes of metal deposition which included the results of X-ray absorption, and neglect the influence of other factors such as temperature, pH, surface treatment, among others, which are necessary to consider in each case.