Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.

Detalhes bibliográficos
Autor(a) principal: Sabioni, Antônio Claret Soares
Data de Publicação: 1993
Outros Autores: Freire Júnior, Fernando Lázaro, Leite Filho, Carlos Vieira Barros, Amami, B. A., Dolin, C., Monty, C., Millot, F.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFOP
Texto Completo: http://www.repositorio.ufop.br/handle/123456789/1131
Resumo: Oxygen self-diffusion in Fe,_,0 single crystals has been studied by means of the isotope exchange method in Hz/Hz”0 atmospheres. The ‘*O concentration profiles were determined by using two different techniques based on ion beams: secondary ion mass spectrometry (SIMS) and nuclear reaction analysis (NRA); the latter by means of the narrow nuclear resonance reaction ‘“O(p, o)“N at 629 keV, r = 2.1 keV. The diffusion coefficients obtained from the analysis of the measured profiles are in good agreement with those found in the literature. To compare the depth resolution and sensitivity of both techniques, the “0 profiles of implanted Cr,O, single crystals (Erso = 50 keV, fluence = 1.6 X lOI ions/cm’) were also measured.
id UFOP_13676e7f5c506d7546575d856f79ec5f
oai_identifier_str oai:repositorio.ufop.br:123456789/1131
network_acronym_str UFOP
network_name_str Repositório Institucional da UFOP
repository_id_str 3233
spelling Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.Oxygen self-diffusion in Fe,_,0 single crystals has been studied by means of the isotope exchange method in Hz/Hz”0 atmospheres. The ‘*O concentration profiles were determined by using two different techniques based on ion beams: secondary ion mass spectrometry (SIMS) and nuclear reaction analysis (NRA); the latter by means of the narrow nuclear resonance reaction ‘“O(p, o)“N at 629 keV, r = 2.1 keV. The diffusion coefficients obtained from the analysis of the measured profiles are in good agreement with those found in the literature. To compare the depth resolution and sensitivity of both techniques, the “0 profiles of implanted Cr,O, single crystals (Erso = 50 keV, fluence = 1.6 X lOI ions/cm’) were also measured.2012-07-16T15:47:57Z2012-07-16T15:47:57Z1993info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfSABIONI, A. C. S. et al. Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 73, n. 1, p. 85-89, jan. 1993. Disponível em: <https://www.sciencedirect.com/science/article/pii/0168583X9396056I>. Acesso em: 16 jul. 2012.0168583Xhttp://www.repositorio.ufop.br/handle/123456789/1131O periódico Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms concede permissão para depósito do artigo no Repositório Institucional da UFOP. Número da licença: 3345930873045.info:eu-repo/semantics/openAccessSabioni, Antônio Claret SoaresFreire Júnior, Fernando LázaroLeite Filho, Carlos Vieira BarrosAmami, B. A.Dolin, C.Monty, C.Millot, F.engreponame:Repositório Institucional da UFOPinstname:Universidade Federal de Ouro Preto (UFOP)instacron:UFOP2024-11-10T17:36:05Zoai:repositorio.ufop.br:123456789/1131Repositório InstitucionalPUBhttp://www.repositorio.ufop.br/oai/requestrepositorio@ufop.edu.bropendoar:32332024-11-10T17:36:05Repositório Institucional da UFOP - Universidade Federal de Ouro Preto (UFOP)false
dc.title.none.fl_str_mv Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
spellingShingle Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
Sabioni, Antônio Claret Soares
title_short Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title_full Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title_fullStr Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title_full_unstemmed Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title_sort Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
author Sabioni, Antônio Claret Soares
author_facet Sabioni, Antônio Claret Soares
Freire Júnior, Fernando Lázaro
Leite Filho, Carlos Vieira Barros
Amami, B. A.
Dolin, C.
Monty, C.
Millot, F.
author_role author
author2 Freire Júnior, Fernando Lázaro
Leite Filho, Carlos Vieira Barros
Amami, B. A.
Dolin, C.
Monty, C.
Millot, F.
author2_role author
author
author
author
author
author
dc.contributor.author.fl_str_mv Sabioni, Antônio Claret Soares
Freire Júnior, Fernando Lázaro
Leite Filho, Carlos Vieira Barros
Amami, B. A.
Dolin, C.
Monty, C.
Millot, F.
description Oxygen self-diffusion in Fe,_,0 single crystals has been studied by means of the isotope exchange method in Hz/Hz”0 atmospheres. The ‘*O concentration profiles were determined by using two different techniques based on ion beams: secondary ion mass spectrometry (SIMS) and nuclear reaction analysis (NRA); the latter by means of the narrow nuclear resonance reaction ‘“O(p, o)“N at 629 keV, r = 2.1 keV. The diffusion coefficients obtained from the analysis of the measured profiles are in good agreement with those found in the literature. To compare the depth resolution and sensitivity of both techniques, the “0 profiles of implanted Cr,O, single crystals (Erso = 50 keV, fluence = 1.6 X lOI ions/cm’) were also measured.
publishDate 1993
dc.date.none.fl_str_mv 1993
2012-07-16T15:47:57Z
2012-07-16T15:47:57Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv SABIONI, A. C. S. et al. Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 73, n. 1, p. 85-89, jan. 1993. Disponível em: <https://www.sciencedirect.com/science/article/pii/0168583X9396056I>. Acesso em: 16 jul. 2012.
0168583X
http://www.repositorio.ufop.br/handle/123456789/1131
identifier_str_mv SABIONI, A. C. S. et al. Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 73, n. 1, p. 85-89, jan. 1993. Disponível em: <https://www.sciencedirect.com/science/article/pii/0168583X9396056I>. Acesso em: 16 jul. 2012.
0168583X
url http://www.repositorio.ufop.br/handle/123456789/1131
dc.language.iso.fl_str_mv eng
language eng
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFOP
instname:Universidade Federal de Ouro Preto (UFOP)
instacron:UFOP
instname_str Universidade Federal de Ouro Preto (UFOP)
instacron_str UFOP
institution UFOP
reponame_str Repositório Institucional da UFOP
collection Repositório Institucional da UFOP
repository.name.fl_str_mv Repositório Institucional da UFOP - Universidade Federal de Ouro Preto (UFOP)
repository.mail.fl_str_mv repositorio@ufop.edu.br
_version_ 1823329378366390272

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