Capacitive impedance measurement : dual-frequency approach.
Autor(a) principal: | |
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Data de Publicação: | 2019 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFOP |
Texto Completo: | http://www.repositorio.ufop.br/handle/123456789/12712 https://doi.org/10.3390/s19112539 |
Resumo: | The most widely used technique for measuring capacitive impedances (or complex electrical permittivity) is to apply a frequency signal to the sensor and measure the amplitude and phase of the output signal. The technique, although efficient, involves high-speed circuits for phase measurement, especially when the medium under test has high conductivity. This paper presents a sensor to measure complex electrical permittivity based on an alternative approach to amplitude and phase measurement: The application of two distinct frequencies using a current-to-voltage converter circuit based in a transimpedance amplifier, and an 8-bit microcontroller. Since there is no need for phase measurement and the applied frequency is lower compared to the standard method, the circuit presents less complexity and cost than the traditional technique. The main advance presented in this work is the use of mathematical modeling of the frequency response of the circuit to make it possible for measuring the dielectric constant using a lower frequency than the higher cut-off frequency of the system, even when the medium under test has high conductivity (tested up to 1220 μS/cm). The proposed system caused a maximum error of 0.6% for the measurement of electrical conductivity and 2% for the relative dielectric constant, considering measurement ranges from 0 to 1220 μS/cm and from 1 to 80, respectively. |
id |
UFOP_532e8aeeee6fc408dfc631f0bc0ab67a |
---|---|
oai_identifier_str |
oai:localhost:123456789/12712 |
network_acronym_str |
UFOP |
network_name_str |
Repositório Institucional da UFOP |
repository_id_str |
3233 |
spelling |
Rêgo Segundo, Alan KardekPinto, Érica SilvaSantos, Gabriel AlmeidaMonteiro, Paulo Marcos de Barros2020-09-10T16:47:39Z2020-09-10T16:47:39Z2019RÊGO SEGUNDO, A. K. et al. Capacitive impedance measurement: dual-frequency approach. Sensors, v. 19, n. 11, 2019. Disponível em: <https://www.mdpi.com/1424-8220/19/11/2539>. Acesso em: 10 mar. 2020.1424-8220http://www.repositorio.ufop.br/handle/123456789/12712https://doi.org/10.3390/s19112539The most widely used technique for measuring capacitive impedances (or complex electrical permittivity) is to apply a frequency signal to the sensor and measure the amplitude and phase of the output signal. The technique, although efficient, involves high-speed circuits for phase measurement, especially when the medium under test has high conductivity. This paper presents a sensor to measure complex electrical permittivity based on an alternative approach to amplitude and phase measurement: The application of two distinct frequencies using a current-to-voltage converter circuit based in a transimpedance amplifier, and an 8-bit microcontroller. Since there is no need for phase measurement and the applied frequency is lower compared to the standard method, the circuit presents less complexity and cost than the traditional technique. The main advance presented in this work is the use of mathematical modeling of the frequency response of the circuit to make it possible for measuring the dielectric constant using a lower frequency than the higher cut-off frequency of the system, even when the medium under test has high conductivity (tested up to 1220 μS/cm). The proposed system caused a maximum error of 0.6% for the measurement of electrical conductivity and 2% for the relative dielectric constant, considering measurement ranges from 0 to 1220 μS/cm and from 1 to 80, respectively.This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Fonte: o próprio artigo.info:eu-repo/semantics/openAccessDielectric constantElectrical conductivityInstrumentationMicrocontrollerEmbedded systemCapacitive impedance measurement : dual-frequency approach.info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleengreponame:Repositório Institucional da UFOPinstname:Universidade Federal de Ouro Preto (UFOP)instacron:UFOPLICENSElicense.txtlicense.txttext/plain; charset=utf-8924http://www.repositorio.ufop.br/bitstream/123456789/12712/2/license.txt62604f8d955274beb56c80ce1ee5dcaeMD52ORIGINALARTIGO_CapacitiveImpedanceMeasurement.pdfARTIGO_CapacitiveImpedanceMeasurement.pdfapplication/pdf3533235http://www.repositorio.ufop.br/bitstream/123456789/12712/1/ARTIGO_CapacitiveImpedanceMeasurement.pdfd5770b13b4176d1c3257ab677159aeabMD51123456789/127122020-09-10 12:47:39.625oai:localhost: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ório InstitucionalPUBhttp://www.repositorio.ufop.br/oai/requestrepositorio@ufop.edu.bropendoar:32332020-09-10T16:47:39Repositório Institucional da UFOP - Universidade Federal de Ouro Preto (UFOP)false |
dc.title.pt_BR.fl_str_mv |
Capacitive impedance measurement : dual-frequency approach. |
title |
Capacitive impedance measurement : dual-frequency approach. |
spellingShingle |
Capacitive impedance measurement : dual-frequency approach. Rêgo Segundo, Alan Kardek Dielectric constant Electrical conductivity Instrumentation Microcontroller Embedded system |
title_short |
Capacitive impedance measurement : dual-frequency approach. |
title_full |
Capacitive impedance measurement : dual-frequency approach. |
title_fullStr |
Capacitive impedance measurement : dual-frequency approach. |
title_full_unstemmed |
Capacitive impedance measurement : dual-frequency approach. |
title_sort |
Capacitive impedance measurement : dual-frequency approach. |
author |
Rêgo Segundo, Alan Kardek |
author_facet |
Rêgo Segundo, Alan Kardek Pinto, Érica Silva Santos, Gabriel Almeida Monteiro, Paulo Marcos de Barros |
author_role |
author |
author2 |
Pinto, Érica Silva Santos, Gabriel Almeida Monteiro, Paulo Marcos de Barros |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Rêgo Segundo, Alan Kardek Pinto, Érica Silva Santos, Gabriel Almeida Monteiro, Paulo Marcos de Barros |
dc.subject.por.fl_str_mv |
Dielectric constant Electrical conductivity Instrumentation Microcontroller Embedded system |
topic |
Dielectric constant Electrical conductivity Instrumentation Microcontroller Embedded system |
description |
The most widely used technique for measuring capacitive impedances (or complex electrical permittivity) is to apply a frequency signal to the sensor and measure the amplitude and phase of the output signal. The technique, although efficient, involves high-speed circuits for phase measurement, especially when the medium under test has high conductivity. This paper presents a sensor to measure complex electrical permittivity based on an alternative approach to amplitude and phase measurement: The application of two distinct frequencies using a current-to-voltage converter circuit based in a transimpedance amplifier, and an 8-bit microcontroller. Since there is no need for phase measurement and the applied frequency is lower compared to the standard method, the circuit presents less complexity and cost than the traditional technique. The main advance presented in this work is the use of mathematical modeling of the frequency response of the circuit to make it possible for measuring the dielectric constant using a lower frequency than the higher cut-off frequency of the system, even when the medium under test has high conductivity (tested up to 1220 μS/cm). The proposed system caused a maximum error of 0.6% for the measurement of electrical conductivity and 2% for the relative dielectric constant, considering measurement ranges from 0 to 1220 μS/cm and from 1 to 80, respectively. |
publishDate |
2019 |
dc.date.issued.fl_str_mv |
2019 |
dc.date.accessioned.fl_str_mv |
2020-09-10T16:47:39Z |
dc.date.available.fl_str_mv |
2020-09-10T16:47:39Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.citation.fl_str_mv |
RÊGO SEGUNDO, A. K. et al. Capacitive impedance measurement: dual-frequency approach. Sensors, v. 19, n. 11, 2019. Disponível em: <https://www.mdpi.com/1424-8220/19/11/2539>. Acesso em: 10 mar. 2020. |
dc.identifier.uri.fl_str_mv |
http://www.repositorio.ufop.br/handle/123456789/12712 |
dc.identifier.issn.none.fl_str_mv |
1424-8220 |
dc.identifier.doi.pt_BR.fl_str_mv |
https://doi.org/10.3390/s19112539 |
identifier_str_mv |
RÊGO SEGUNDO, A. K. et al. Capacitive impedance measurement: dual-frequency approach. Sensors, v. 19, n. 11, 2019. Disponível em: <https://www.mdpi.com/1424-8220/19/11/2539>. Acesso em: 10 mar. 2020. 1424-8220 |
url |
http://www.repositorio.ufop.br/handle/123456789/12712 https://doi.org/10.3390/s19112539 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.source.none.fl_str_mv |
reponame:Repositório Institucional da UFOP instname:Universidade Federal de Ouro Preto (UFOP) instacron:UFOP |
instname_str |
Universidade Federal de Ouro Preto (UFOP) |
instacron_str |
UFOP |
institution |
UFOP |
reponame_str |
Repositório Institucional da UFOP |
collection |
Repositório Institucional da UFOP |
bitstream.url.fl_str_mv |
http://www.repositorio.ufop.br/bitstream/123456789/12712/2/license.txt http://www.repositorio.ufop.br/bitstream/123456789/12712/1/ARTIGO_CapacitiveImpedanceMeasurement.pdf |
bitstream.checksum.fl_str_mv |
62604f8d955274beb56c80ce1ee5dcae d5770b13b4176d1c3257ab677159aeab |
bitstream.checksumAlgorithm.fl_str_mv |
MD5 MD5 |
repository.name.fl_str_mv |
Repositório Institucional da UFOP - Universidade Federal de Ouro Preto (UFOP) |
repository.mail.fl_str_mv |
repositorio@ufop.edu.br |
_version_ |
1801685722162266112 |