Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities.
Autor(a) principal: | |
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Data de Publicação: | 2020 |
Outros Autores: | , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFOP |
Texto Completo: | http://www.repositorio.ufop.br/handle/123456789/12638 https://doi.org/10.3390/ma13020386 |
Resumo: | Titanium dioxide substrates have been synthesized by means of solid-state reactions with sintering temperatures varying from 1150 ◦C up to 1350 ◦C. X-ray diffraction and scanning electron microscopy (SEM) where employed to investigate the crystal structure, grain size and porosity of the resulting samples. The obtained ceramics are tetragonal (rutile phase) with average grain sizes varying from 2.94 µm up to 5.81 µm. The average grain size of samples increases with increasing temperature, while the porosity decreases. The effect of microstructure on the dielectric properties has been also studied. The reduction of porosity of samples significantly improves the dielectric parameters (relative dielectric permittivity and loss tangent) in comparison to those of commercial substrates, indicating that the obtained ceramic substrates could be useful in the miniaturization of telecommunication devices. |
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Freitas, Antonio Evangelista deManhabosco, Taíse MatteBatista, Ronaldo Junio CamposRêgo Segundo, Alan KardekAraujo, Humberto Xavier deAraujo, Fernando Gabriel da SilvaCosta, Adilson Rodrigues da2020-08-21T18:47:39Z2020-08-21T18:47:39Z2020FREITAS, A. E. de et al. Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. Materials, v. 13, n. 2, p. 386, 2020. Disponível em: <https://www.mdpi.com/1996-1944/13/2/386>. Acesso em: 10 mar. 2020.1996-1944http://www.repositorio.ufop.br/handle/123456789/12638https://doi.org/10.3390/ma13020386Titanium dioxide substrates have been synthesized by means of solid-state reactions with sintering temperatures varying from 1150 ◦C up to 1350 ◦C. X-ray diffraction and scanning electron microscopy (SEM) where employed to investigate the crystal structure, grain size and porosity of the resulting samples. The obtained ceramics are tetragonal (rutile phase) with average grain sizes varying from 2.94 µm up to 5.81 µm. The average grain size of samples increases with increasing temperature, while the porosity decreases. The effect of microstructure on the dielectric properties has been also studied. The reduction of porosity of samples significantly improves the dielectric parameters (relative dielectric permittivity and loss tangent) in comparison to those of commercial substrates, indicating that the obtained ceramic substrates could be useful in the miniaturization of telecommunication devices.This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Fonte: o próprio artigo.info:eu-repo/semantics/openAccessPermittivitySolid state sinteringPorosityDevelopment and characterization of titanium dioxide ceramic substrates with high dielectric permittivities.info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleengreponame:Repositório Institucional da UFOPinstname:Universidade Federal de Ouro Preto (UFOP)instacron:UFOPLICENSElicense.txtlicense.txttext/plain; charset=utf-8924http://www.repositorio.ufop.br/bitstream/123456789/12638/2/license.txt62604f8d955274beb56c80ce1ee5dcaeMD52ORIGINALARTIGO_DevelopmentCharacterizationTitanium.pdfARTIGO_DevelopmentCharacterizationTitanium.pdfapplication/pdf3030811http://www.repositorio.ufop.br/bitstream/123456789/12638/1/ARTIGO_DevelopmentCharacterizationTitanium.pdf34a6f87c7f6495039f387e46567939b3MD51123456789/126382020-08-21 14:47:39.756oai:localhost: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ório InstitucionalPUBhttp://www.repositorio.ufop.br/oai/requestrepositorio@ufop.edu.bropendoar:32332020-08-21T18:47:39Repositório Institucional da UFOP - Universidade Federal de Ouro Preto (UFOP)false |
dc.title.pt_BR.fl_str_mv |
Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. |
title |
Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. |
spellingShingle |
Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. Freitas, Antonio Evangelista de Permittivity Solid state sintering Porosity |
title_short |
Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. |
title_full |
Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. |
title_fullStr |
Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. |
title_full_unstemmed |
Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. |
title_sort |
Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. |
author |
Freitas, Antonio Evangelista de |
author_facet |
Freitas, Antonio Evangelista de Manhabosco, Taíse Matte Batista, Ronaldo Junio Campos Rêgo Segundo, Alan Kardek Araujo, Humberto Xavier de Araujo, Fernando Gabriel da Silva Costa, Adilson Rodrigues da |
author_role |
author |
author2 |
Manhabosco, Taíse Matte Batista, Ronaldo Junio Campos Rêgo Segundo, Alan Kardek Araujo, Humberto Xavier de Araujo, Fernando Gabriel da Silva Costa, Adilson Rodrigues da |
author2_role |
author author author author author author |
dc.contributor.author.fl_str_mv |
Freitas, Antonio Evangelista de Manhabosco, Taíse Matte Batista, Ronaldo Junio Campos Rêgo Segundo, Alan Kardek Araujo, Humberto Xavier de Araujo, Fernando Gabriel da Silva Costa, Adilson Rodrigues da |
dc.subject.por.fl_str_mv |
Permittivity Solid state sintering Porosity |
topic |
Permittivity Solid state sintering Porosity |
description |
Titanium dioxide substrates have been synthesized by means of solid-state reactions with sintering temperatures varying from 1150 ◦C up to 1350 ◦C. X-ray diffraction and scanning electron microscopy (SEM) where employed to investigate the crystal structure, grain size and porosity of the resulting samples. The obtained ceramics are tetragonal (rutile phase) with average grain sizes varying from 2.94 µm up to 5.81 µm. The average grain size of samples increases with increasing temperature, while the porosity decreases. The effect of microstructure on the dielectric properties has been also studied. The reduction of porosity of samples significantly improves the dielectric parameters (relative dielectric permittivity and loss tangent) in comparison to those of commercial substrates, indicating that the obtained ceramic substrates could be useful in the miniaturization of telecommunication devices. |
publishDate |
2020 |
dc.date.accessioned.fl_str_mv |
2020-08-21T18:47:39Z |
dc.date.available.fl_str_mv |
2020-08-21T18:47:39Z |
dc.date.issued.fl_str_mv |
2020 |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.citation.fl_str_mv |
FREITAS, A. E. de et al. Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. Materials, v. 13, n. 2, p. 386, 2020. Disponível em: <https://www.mdpi.com/1996-1944/13/2/386>. Acesso em: 10 mar. 2020. |
dc.identifier.uri.fl_str_mv |
http://www.repositorio.ufop.br/handle/123456789/12638 |
dc.identifier.issn.none.fl_str_mv |
1996-1944 |
dc.identifier.doi.pt_BR.fl_str_mv |
https://doi.org/10.3390/ma13020386 |
identifier_str_mv |
FREITAS, A. E. de et al. Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. Materials, v. 13, n. 2, p. 386, 2020. Disponível em: <https://www.mdpi.com/1996-1944/13/2/386>. Acesso em: 10 mar. 2020. 1996-1944 |
url |
http://www.repositorio.ufop.br/handle/123456789/12638 https://doi.org/10.3390/ma13020386 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
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openAccess |
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