Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.

Detalhes bibliográficos
Autor(a) principal: Sabioni, Antônio Claret Soares
Data de Publicação: 1993
Outros Autores: Freire Júnior, Fernando Lázaro, Leite Filho, Carlos Vieira Barros, Amami, B. A., Dolin, C., Monty, C., Millot, F.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFOP
Texto Completo: http://www.repositorio.ufop.br/handle/123456789/1131
Resumo: Oxygen self-diffusion in Fe,_,0 single crystals has been studied by means of the isotope exchange method in Hz/Hz”0 atmospheres. The ‘*O concentration profiles were determined by using two different techniques based on ion beams: secondary ion mass spectrometry (SIMS) and nuclear reaction analysis (NRA); the latter by means of the narrow nuclear resonance reaction ‘“O(p, o)“N at 629 keV, r = 2.1 keV. The diffusion coefficients obtained from the analysis of the measured profiles are in good agreement with those found in the literature. To compare the depth resolution and sensitivity of both techniques, the “0 profiles of implanted Cr,O, single crystals (Erso = 50 keV, fluence = 1.6 X lOI ions/cm’) were also measured.
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spelling Sabioni, Antônio Claret SoaresFreire Júnior, Fernando LázaroLeite Filho, Carlos Vieira BarrosAmami, B. A.Dolin, C.Monty, C.Millot, F.2012-07-16T15:47:57Z2012-07-16T15:47:57Z1993SABIONI, A. C. S. et al. Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 73, n. 1, p. 85-89, jan. 1993. Disponível em: <https://www.sciencedirect.com/science/article/pii/0168583X9396056I>. Acesso em: 16 jul. 2012.0168583Xhttp://www.repositorio.ufop.br/handle/123456789/1131Oxygen self-diffusion in Fe,_,0 single crystals has been studied by means of the isotope exchange method in Hz/Hz”0 atmospheres. The ‘*O concentration profiles were determined by using two different techniques based on ion beams: secondary ion mass spectrometry (SIMS) and nuclear reaction analysis (NRA); the latter by means of the narrow nuclear resonance reaction ‘“O(p, o)“N at 629 keV, r = 2.1 keV. The diffusion coefficients obtained from the analysis of the measured profiles are in good agreement with those found in the literature. To compare the depth resolution and sensitivity of both techniques, the “0 profiles of implanted Cr,O, single crystals (Erso = 50 keV, fluence = 1.6 X lOI ions/cm’) were also measured.Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleO periódico Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms concede permissão para depósito do artigo no Repositório Institucional da UFOP. Número da licença: 3345930873045.info:eu-repo/semantics/openAccessengreponame:Repositório Institucional da UFOPinstname:Universidade Federal de Ouro Preto (UFOP)instacron:UFOPLICENSElicense.txtlicense.txttext/plain; charset=utf-81748http://www.repositorio.ufop.br/bitstream/123456789/1131/5/license.txt8a4605be74aa9ea9d79846c1fba20a33MD55ORIGINALARTIGO_StudyOxygenSelf.pdfARTIGO_StudyOxygenSelf.pdfapplication/pdf387189http://www.repositorio.ufop.br/bitstream/123456789/1131/1/ARTIGO_StudyOxygenSelf.pdffd9315bdca6af011391485b75ade4651MD51123456789/11312019-02-27 10:24:26.6oai:localhost: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Repositório InstitucionalPUBhttp://www.repositorio.ufop.br/oai/requestrepositorio@ufop.edu.bropendoar:32332019-02-27T15:24:26Repositório Institucional da UFOP - Universidade Federal de Ouro Preto (UFOP)false
dc.title.pt_BR.fl_str_mv Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
spellingShingle Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
Sabioni, Antônio Claret Soares
title_short Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title_full Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title_fullStr Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title_full_unstemmed Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
title_sort Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS.
author Sabioni, Antônio Claret Soares
author_facet Sabioni, Antônio Claret Soares
Freire Júnior, Fernando Lázaro
Leite Filho, Carlos Vieira Barros
Amami, B. A.
Dolin, C.
Monty, C.
Millot, F.
author_role author
author2 Freire Júnior, Fernando Lázaro
Leite Filho, Carlos Vieira Barros
Amami, B. A.
Dolin, C.
Monty, C.
Millot, F.
author2_role author
author
author
author
author
author
dc.contributor.author.fl_str_mv Sabioni, Antônio Claret Soares
Freire Júnior, Fernando Lázaro
Leite Filho, Carlos Vieira Barros
Amami, B. A.
Dolin, C.
Monty, C.
Millot, F.
description Oxygen self-diffusion in Fe,_,0 single crystals has been studied by means of the isotope exchange method in Hz/Hz”0 atmospheres. The ‘*O concentration profiles were determined by using two different techniques based on ion beams: secondary ion mass spectrometry (SIMS) and nuclear reaction analysis (NRA); the latter by means of the narrow nuclear resonance reaction ‘“O(p, o)“N at 629 keV, r = 2.1 keV. The diffusion coefficients obtained from the analysis of the measured profiles are in good agreement with those found in the literature. To compare the depth resolution and sensitivity of both techniques, the “0 profiles of implanted Cr,O, single crystals (Erso = 50 keV, fluence = 1.6 X lOI ions/cm’) were also measured.
publishDate 1993
dc.date.issued.fl_str_mv 1993
dc.date.accessioned.fl_str_mv 2012-07-16T15:47:57Z
dc.date.available.fl_str_mv 2012-07-16T15:47:57Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
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dc.identifier.citation.fl_str_mv SABIONI, A. C. S. et al. Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 73, n. 1, p. 85-89, jan. 1993. Disponível em: <https://www.sciencedirect.com/science/article/pii/0168583X9396056I>. Acesso em: 16 jul. 2012.
dc.identifier.uri.fl_str_mv http://www.repositorio.ufop.br/handle/123456789/1131
dc.identifier.issn.none.fl_str_mv 0168583X
identifier_str_mv SABIONI, A. C. S. et al. Study of oxygen self-diffusion in oxides by ion beam techniques : comparison between nuclear reaction analysis and SIMS. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 73, n. 1, p. 85-89, jan. 1993. Disponível em: <https://www.sciencedirect.com/science/article/pii/0168583X9396056I>. Acesso em: 16 jul. 2012.
0168583X
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