New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix

Detalhes bibliográficos
Autor(a) principal: Sanchez, Dario Ferreira
Data de Publicação: 2013
Outros Autores: Marmitt, Gabriel Guterres, Marin, Cristiane, Baptista, Daniel Lorscheitter, Azevedo, Gustavo de Medeiros, Grande, Pedro Luis, Fichtner, Paulo Fernando Papaleo
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Institucional da UFRGS
Texto Completo: http://hdl.handle.net/10183/93392
Resumo: In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films. This includes the determination of the nanoparticle characteristics (location, size distribution and number concentration) as well as the depth distribution and concentration of the NP atomic components dispersed in the matrix. Our studies are performed considering a model case system consisting of planar arrangements of Au NPs (size range from 1 to 10 nm) containing three distinct Au concentrations embedded in a SiO2 film.
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spelling Sanchez, Dario FerreiraMarmitt, Gabriel GuterresMarin, CristianeBaptista, Daniel LorscheitterAzevedo, Gustavo de MedeirosGrande, Pedro LuisFichtner, Paulo Fernando Papaleo2014-04-13T01:50:01Z20132045-2322http://hdl.handle.net/10183/93392000911636In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films. This includes the determination of the nanoparticle characteristics (location, size distribution and number concentration) as well as the depth distribution and concentration of the NP atomic components dispersed in the matrix. Our studies are performed considering a model case system consisting of planar arrangements of Au NPs (size range from 1 to 10 nm) containing three distinct Au concentrations embedded in a SiO2 film.application/pdfengScientific reports. London. Vol. 3 (Dec. 2013), 3414, 6 p.NanopartículasPropriedades estruturaisEspalhamentoMicroscopia eletrônica de transmissãoNew approach for structural characterization of planar sets of nanoparticles embedded into a solid matrixEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSORIGINAL000911636.pdf000911636.pdfTexto completo (inglês)application/pdf2396225http://www.lume.ufrgs.br/bitstream/10183/93392/1/000911636.pdffb66f10324f14de5824629b0e73e598dMD51TEXT000911636.pdf.txt000911636.pdf.txtExtracted Texttext/plain25804http://www.lume.ufrgs.br/bitstream/10183/93392/2/000911636.pdf.txtd444ac7258b8b55de7ea6cfe22f8e0ccMD52THUMBNAIL000911636.pdf.jpg000911636.pdf.jpgGenerated Thumbnailimage/jpeg2077http://www.lume.ufrgs.br/bitstream/10183/93392/3/000911636.pdf.jpg4b95dd93f2ed9c06ceb5a153fa99a3c0MD5310183/933922023-07-29 03:36:28.632306oai:www.lume.ufrgs.br:10183/93392Repositório de PublicaçõesPUBhttps://lume.ufrgs.br/oai/requestopendoar:2023-07-29T06:36:28Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false
dc.title.pt_BR.fl_str_mv New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
spellingShingle New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
Sanchez, Dario Ferreira
Nanopartículas
Propriedades estruturais
Espalhamento
Microscopia eletrônica de transmissão
title_short New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_full New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_fullStr New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_full_unstemmed New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
title_sort New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix
author Sanchez, Dario Ferreira
author_facet Sanchez, Dario Ferreira
Marmitt, Gabriel Guterres
Marin, Cristiane
Baptista, Daniel Lorscheitter
Azevedo, Gustavo de Medeiros
Grande, Pedro Luis
Fichtner, Paulo Fernando Papaleo
author_role author
author2 Marmitt, Gabriel Guterres
Marin, Cristiane
Baptista, Daniel Lorscheitter
Azevedo, Gustavo de Medeiros
Grande, Pedro Luis
Fichtner, Paulo Fernando Papaleo
author2_role author
author
author
author
author
author
dc.contributor.author.fl_str_mv Sanchez, Dario Ferreira
Marmitt, Gabriel Guterres
Marin, Cristiane
Baptista, Daniel Lorscheitter
Azevedo, Gustavo de Medeiros
Grande, Pedro Luis
Fichtner, Paulo Fernando Papaleo
dc.subject.por.fl_str_mv Nanopartículas
Propriedades estruturais
Espalhamento
Microscopia eletrônica de transmissão
topic Nanopartículas
Propriedades estruturais
Espalhamento
Microscopia eletrônica de transmissão
description In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films. This includes the determination of the nanoparticle characteristics (location, size distribution and number concentration) as well as the depth distribution and concentration of the NP atomic components dispersed in the matrix. Our studies are performed considering a model case system consisting of planar arrangements of Au NPs (size range from 1 to 10 nm) containing three distinct Au concentrations embedded in a SiO2 film.
publishDate 2013
dc.date.issued.fl_str_mv 2013
dc.date.accessioned.fl_str_mv 2014-04-13T01:50:01Z
dc.type.driver.fl_str_mv Estrangeiro
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/10183/93392
dc.identifier.issn.pt_BR.fl_str_mv 2045-2322
dc.identifier.nrb.pt_BR.fl_str_mv 000911636
identifier_str_mv 2045-2322
000911636
url http://hdl.handle.net/10183/93392
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Scientific reports. London. Vol. 3 (Dec. 2013), 3414, 6 p.
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