Structural characterization of the Co/sub 2/FeZ(Z=Al, Si, Ga, and Ge) Heusler compounds by x-ray diffraction and extended x-ray absorption fine structure spectroscopy

• Autor(a) principal: Balke, Benjamin
• Data de Publicação: 2007
• Outros Autores: Wurmehl, Sabine, Fecher, Gerhard H., Felser, Claudia, Alves, Maria do Carmo Martins, Bernardi, Fabiano, Morais, Jonder
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Repositório Institucional da UFRGS
• Texto Completo: http://hdl.handle.net/10183/141394
• topic: Ligas de heusler; Difração de raios X; Espectroscopia

This work reports on the structure of Fe containing, Co2-based Heusler compounds that are suitable for magnetoelectronic applications. The compounds Co2FeZ where Z=Al, Si, Ga, and Ge were investigated using the x-ray diffraction XRD and extended x-ray absorption fine structure EXAFS techniques. Using XRD, it was shown conclusively that Co2FeAl crystallizes in the B2 structure whereas Co2FeSi crystallizes in the L21 structure. For compounds containing Ga or Ge, the XRD technique cannot be used to easily distinguish between the two structures. For this reason, the EXAFS technique was used to elucidate the structure of these two compounds. Analysis of the EXAFS data indicated that both compounds crystallize in the L21 structure.