The interface behavior analysis of thin film during ball indentation testing

• Autor(a) principal: Dias, Avelino Manuel da Silva
• Data de Publicação: 2016
• Outros Autores: Silva, Everton Carneiro da
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Repositório Institucional da UFRN
• Texto Completo: https://repositorio.ufrn.br/handle/123456789/45441
• topic: finite element; ball indentation testing; thin film; interface behavior

The search for improved tribology properties in materials contributes to the development of processes that extend the useful life of components and their applications in increasingly severe environments. In this respect, thin ceramic films have been used to enhance the properties of components that operate under these conditions. However, expensive experimental assays are needed to assess the behavior of these films and system compounds by films and substrates. These experimental analyses are also destructive, requiring the use of sophisticated equipment and specialized hand tools. On the other hand, with advances in computational mechanics, the application of numerical analysis to solve numerous technological problems has become increasingly common, owing to its low operational costs. This study aims to simulate indentation testing with a spherical penetrator in systems composed of thin CrAlN ceramic film deposited on AISI 4140 metallic substrate using a Finite Element commercial code. The main objective of this study was to evaluate the field behavior of stresses in the contact region of the indenter with the sample and on the film-substrate interface.