Defeitos extensos em semicondutores: discordância parcial de 90°

Detalhes bibliográficos
Autor(a) principal: Arantes Junior, Jeverson Teodoro
Data de Publicação: 2004
Tipo de documento: Dissertação
Idioma: por
Título da fonte: Repositório Institucional da UFU
Texto Completo: https://repositorio.ufu.br/handle/123456789/27337
http://doi.org/10.14393/ufu.di.2004.20
Resumo: In the present work we investigate electronic and structural properties of a 90° partial dislocation in Si [111]. The calculations were made with first-principles methods based on Density Functional Theory (DFT) with the local density approximation (LDA) as stated by Ceperley and Alder and parametrized by Perdew and Zunger and generalized gradients (GGA). The electron-ion in-teraction were described using norm-conserving pseudopotentials by Bachelet-Hamman-Schlíiter (BHS) in the Kleinman-Bylander form and ultrtasoft pseu­dopotentials based on Vanderbilt development. In Silicon, as well as in other zinc-blende semiconductors, dislocations generally belong to the [111] glide plane, lying along the [110] directions, that is the most closely-packed plane for Silicon, leading to reconstructions. How-ever, for a structure wíthout reconstruction, our calculation indicate one energy o o formation of 0.57 (eV/A), which reconstructs with an energy gain of 0.13 (eV/ A) and is identified by single period (SP) reconstruction. Inserting alternating kinks in the core of it, we have a double period (DP) reconstruction that lower o the energy of the system by 0.1 (eV/A) related to SP, being the most stable reconstruction. Acting as sources and sinks for point defects, the dislocation structural component is related primarily with the strain and stress field inside and outside the core that interacts with stress field caused by impurities. These interactions have important effects on transport properties of carries. In this way, we study Ge and As substitutional and vacancy in the presence of a Silicon 90° partial dislocation. For As substitutional and a vacancy in a SP reconstruction we observe an energy difference, for one site far from the core and one inside the core, of 0.26 eV and 0.98 eV respectively in favor of a site in the core. Although for Ge substitutional no preference were observed. Concluding, we did a comparative study between LDA (GGA) approxi­mation with norm-conserving (ultrasoft) pseudopotential for SP and DP recons­tructions in a 90° partial dislocation. Now, using an ultrasoft pseudopotential and GGA, we did a systematic study of a vacancy in both reconstructions. This shows that for DP, the most energetically site is not in the core, but above it with an energy difference of the 0.31 eV related to the most energetically favorable site in the core.
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spelling Defeitos extensos em semicondutores: discordância parcial de 90°Extensive semiconductor defects - 90 ° partial disagreementMecânica quânticaSimulaçãoSemicondutoresComputadoresFísicaCNPQ::CIENCIAS EXATAS E DA TERRA::FISICAIn the present work we investigate electronic and structural properties of a 90° partial dislocation in Si [111]. The calculations were made with first-principles methods based on Density Functional Theory (DFT) with the local density approximation (LDA) as stated by Ceperley and Alder and parametrized by Perdew and Zunger and generalized gradients (GGA). The electron-ion in-teraction were described using norm-conserving pseudopotentials by Bachelet-Hamman-Schlíiter (BHS) in the Kleinman-Bylander form and ultrtasoft pseu­dopotentials based on Vanderbilt development. In Silicon, as well as in other zinc-blende semiconductors, dislocations generally belong to the [111] glide plane, lying along the [110] directions, that is the most closely-packed plane for Silicon, leading to reconstructions. How-ever, for a structure wíthout reconstruction, our calculation indicate one energy o o formation of 0.57 (eV/A), which reconstructs with an energy gain of 0.13 (eV/ A) and is identified by single period (SP) reconstruction. Inserting alternating kinks in the core of it, we have a double period (DP) reconstruction that lower o the energy of the system by 0.1 (eV/A) related to SP, being the most stable reconstruction. Acting as sources and sinks for point defects, the dislocation structural component is related primarily with the strain and stress field inside and outside the core that interacts with stress field caused by impurities. These interactions have important effects on transport properties of carries. In this way, we study Ge and As substitutional and vacancy in the presence of a Silicon 90° partial dislocation. For As substitutional and a vacancy in a SP reconstruction we observe an energy difference, for one site far from the core and one inside the core, of 0.26 eV and 0.98 eV respectively in favor of a site in the core. Although for Ge substitutional no preference were observed. Concluding, we did a comparative study between LDA (GGA) approxi­mation with norm-conserving (ultrasoft) pseudopotential for SP and DP recons­tructions in a 90° partial dislocation. Now, using an ultrasoft pseudopotential and GGA, we did a systematic study of a vacancy in both reconstructions. This shows that for DP, the most energetically site is not in the core, but above it with an energy difference of the 0.31 eV related to the most energetically favorable site in the core.Dissertação (Mestrado)No presente trabalho, investigamos propriedades eletrônicas, estruturais e energias de formação de discordâncias parciais de 90° com suas reconstruções em silício [111]. Os cálculos foram feitos através de métodos de primeiros princípios, baseados na teoria do funcional da densidade com aproximação lo­cal (LDA) para o termo de exchange utilizando a correlação de Ceperley-Alder parametrizada por Perdew e Zunger e gradientes generalizados (GGA). A in­teração elétron-íon foi descrita utilizando pseudopotenciais de norma conser­vada descrito por Bachelet-Hamman-Schlíiter (BHS) na forma de Kleinman-Bylander e também pseudo potências ultrasuaves descritos por Vanderbilt. o Encontramos uma estrutura não reconstruída cuja energia é de 0.57 (eV/ A). No entanto, o núcleo da discordância encontra-se entre planos [111] muito próximos, podendo reconstruir-se facilmente. Esta reconstrução é conhecida O como Single Period (SP), que baixa a energia de 0.13 (eV/A) em relação à não reconstrução. Através da introdução de degraus em cada sítio da rede ao longo da linha da discordância, temos a reconstrução Double Period (DP), que baixa o a energia de 0.1 (eV/A) em relação à SP, sendo portanto, a mais estável. Funcionando como uma armadilha para impurezas, a discordância possui uma componente estrutural relacionada com os campos de tensões no núcleo e fora dele que interage com as tensões produzidas pela impureza. Estas in­terações afetam propriedades de transporte de portadores. Neste contexto, estudamos Ge e As substitucionais e vacâncias na presença da discordância com reconstrução SP. Para o As substitucional e a vacância, observamos uma diferença de energia, para um sítio longe e outro no núcleo da discordância, de 0.26 eV e 0.98 eV respectivamente, a favor da posição no núcleo. Entretando. o Ge substitucional, não apresentou preferência em relação a um sítio longe e outro no núcleo do defeito extenso. Como conclusão deste trabalho, fizemos um estudo comparativo entre as aproximações LDA (GGA) para as reconstruções SP e DP, calculando sistema­ticamente a interação da vacâncias na reconstruções, mostrando que o sítio mais estável para a vacância na DP não se encontra no núcleo da discordância, mas acima deste. Sendo 0.31 eV energeticamente mais favorável que no núcleo.Universidade Federal de UberlândiaBrasilPrograma de Pós-graduação em FísicaSchmidt, Tome Maurohttp://lattes.cnpq.br/5594585359874582Marleta, AlexandreAntonelli, AlexArantes Junior, Jeverson Teodoro2019-11-11T22:29:00Z2019-11-11T22:29:00Z2004info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfARANTES JUNIOR, Jeverson Teodoro. Defeitos extensos em semicondutores: discordância parcial de 90°. 2004. 106 f. Dissertação (Mestrado em Física) - Universidade Federal de Uberlândia, Uberlândia, 2019. DOI http://doi.org/10.14393/ufu.di.2004.20https://repositorio.ufu.br/handle/123456789/27337http://doi.org/10.14393/ufu.di.2004.20porAttribution-NonCommercial-NoDerivs 3.0 United Stateshttp://creativecommons.org/licenses/by-nc-nd/3.0/us/info:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFUinstname:Universidade Federal de Uberlândia (UFU)instacron:UFU2020-02-14T13:49:53Zoai:repositorio.ufu.br:123456789/27337Repositório InstitucionalONGhttp://repositorio.ufu.br/oai/requestdiinf@dirbi.ufu.bropendoar:2020-02-14T13:49:53Repositório Institucional da UFU - Universidade Federal de Uberlândia (UFU)false
dc.title.none.fl_str_mv Defeitos extensos em semicondutores: discordância parcial de 90°
Extensive semiconductor defects - 90 ° partial disagreement
title Defeitos extensos em semicondutores: discordância parcial de 90°
spellingShingle Defeitos extensos em semicondutores: discordância parcial de 90°
Arantes Junior, Jeverson Teodoro
Mecânica quântica
Simulação
Semicondutores
Computadores
Física
CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA
title_short Defeitos extensos em semicondutores: discordância parcial de 90°
title_full Defeitos extensos em semicondutores: discordância parcial de 90°
title_fullStr Defeitos extensos em semicondutores: discordância parcial de 90°
title_full_unstemmed Defeitos extensos em semicondutores: discordância parcial de 90°
title_sort Defeitos extensos em semicondutores: discordância parcial de 90°
author Arantes Junior, Jeverson Teodoro
author_facet Arantes Junior, Jeverson Teodoro
author_role author
dc.contributor.none.fl_str_mv Schmidt, Tome Mauro
http://lattes.cnpq.br/5594585359874582
Marleta, Alexandre
Antonelli, Alex
dc.contributor.author.fl_str_mv Arantes Junior, Jeverson Teodoro
dc.subject.por.fl_str_mv Mecânica quântica
Simulação
Semicondutores
Computadores
Física
CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA
topic Mecânica quântica
Simulação
Semicondutores
Computadores
Física
CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA
description In the present work we investigate electronic and structural properties of a 90° partial dislocation in Si [111]. The calculations were made with first-principles methods based on Density Functional Theory (DFT) with the local density approximation (LDA) as stated by Ceperley and Alder and parametrized by Perdew and Zunger and generalized gradients (GGA). The electron-ion in-teraction were described using norm-conserving pseudopotentials by Bachelet-Hamman-Schlíiter (BHS) in the Kleinman-Bylander form and ultrtasoft pseu­dopotentials based on Vanderbilt development. In Silicon, as well as in other zinc-blende semiconductors, dislocations generally belong to the [111] glide plane, lying along the [110] directions, that is the most closely-packed plane for Silicon, leading to reconstructions. How-ever, for a structure wíthout reconstruction, our calculation indicate one energy o o formation of 0.57 (eV/A), which reconstructs with an energy gain of 0.13 (eV/ A) and is identified by single period (SP) reconstruction. Inserting alternating kinks in the core of it, we have a double period (DP) reconstruction that lower o the energy of the system by 0.1 (eV/A) related to SP, being the most stable reconstruction. Acting as sources and sinks for point defects, the dislocation structural component is related primarily with the strain and stress field inside and outside the core that interacts with stress field caused by impurities. These interactions have important effects on transport properties of carries. In this way, we study Ge and As substitutional and vacancy in the presence of a Silicon 90° partial dislocation. For As substitutional and a vacancy in a SP reconstruction we observe an energy difference, for one site far from the core and one inside the core, of 0.26 eV and 0.98 eV respectively in favor of a site in the core. Although for Ge substitutional no preference were observed. Concluding, we did a comparative study between LDA (GGA) approxi­mation with norm-conserving (ultrasoft) pseudopotential for SP and DP recons­tructions in a 90° partial dislocation. Now, using an ultrasoft pseudopotential and GGA, we did a systematic study of a vacancy in both reconstructions. This shows that for DP, the most energetically site is not in the core, but above it with an energy difference of the 0.31 eV related to the most energetically favorable site in the core.
publishDate 2004
dc.date.none.fl_str_mv 2004
2019-11-11T22:29:00Z
2019-11-11T22:29:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/masterThesis
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status_str publishedVersion
dc.identifier.uri.fl_str_mv ARANTES JUNIOR, Jeverson Teodoro. Defeitos extensos em semicondutores: discordância parcial de 90°. 2004. 106 f. Dissertação (Mestrado em Física) - Universidade Federal de Uberlândia, Uberlândia, 2019. DOI http://doi.org/10.14393/ufu.di.2004.20
https://repositorio.ufu.br/handle/123456789/27337
http://doi.org/10.14393/ufu.di.2004.20
identifier_str_mv ARANTES JUNIOR, Jeverson Teodoro. Defeitos extensos em semicondutores: discordância parcial de 90°. 2004. 106 f. Dissertação (Mestrado em Física) - Universidade Federal de Uberlândia, Uberlândia, 2019. DOI http://doi.org/10.14393/ufu.di.2004.20
url https://repositorio.ufu.br/handle/123456789/27337
http://doi.org/10.14393/ufu.di.2004.20
dc.language.iso.fl_str_mv por
language por
dc.rights.driver.fl_str_mv Attribution-NonCommercial-NoDerivs 3.0 United States
http://creativecommons.org/licenses/by-nc-nd/3.0/us/
info:eu-repo/semantics/openAccess
rights_invalid_str_mv Attribution-NonCommercial-NoDerivs 3.0 United States
http://creativecommons.org/licenses/by-nc-nd/3.0/us/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Universidade Federal de Uberlândia
Brasil
Programa de Pós-graduação em Física
publisher.none.fl_str_mv Universidade Federal de Uberlândia
Brasil
Programa de Pós-graduação em Física
dc.source.none.fl_str_mv reponame:Repositório Institucional da UFU
instname:Universidade Federal de Uberlândia (UFU)
instacron:UFU
instname_str Universidade Federal de Uberlândia (UFU)
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institution UFU
reponame_str Repositório Institucional da UFU
collection Repositório Institucional da UFU
repository.name.fl_str_mv Repositório Institucional da UFU - Universidade Federal de Uberlândia (UFU)
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