Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas
Autor(a) principal: | |
---|---|
Data de Publicação: | 2008 |
Tipo de documento: | Dissertação |
Idioma: | por |
Título da fonte: | LOCUS Repositório Institucional da UFV |
Texto Completo: | http://locus.ufv.br/handle/123456789/4229 |
Resumo: | Fountains of renewable energies are occupying an important space in scientific inquiries. Within this Proton Exchange Membrane Fuel Cells (PEMFC) stand out. Studies show that the elevation of PEMFC s operation temperature results in the increase of its efficiency. Nevertheless, in these work conditions there appears to be a necessity in improving electrolyte water retention. The electrolyte traditionally used in these cells is the Nafion ® polymer. One of the ways to improve the retention of water in the polymer in elevated temperatures is the incorporation of hydrophilic particles (ex: silica). In this work atomic force microscopy was used (Atomic Force Microscopy - AFM) to characterize the surface of Nafion membranes with nanoparticles of incorporated silica through two methods ( Casting and Sol - gel ). The AFM tests were carried out in-situ to approximate the characterization conditions to the operation conditions of an electrolyte in the PEMFC. In these experiments the semi-contact method was used to avoid damage to the surface of the polymer. Samples were used without incorporated nanoparticles as a base of comparison to identify the influence of the presence of the particles in the characteristics of the surface of the electrolyte.The obtained images of the sample manufactured by the Casting method presented two distinct sides, for the sample without nanoparticles as well as for the sample with incorporated silica nanoparticles. The first side is characterized by the presence of grooves caused by the contact of the sample with the substrate of the preparation membrane. The second side for the sample without nanoparticles presents a decreased roughness compared to the same side for the Doped sample. In the sample Doped by the Casting method, its second side is characterized by two regions, the first shows a surface totally recovered by particles and the second a surface with scattered, randomly spread particles. The silica particles have an average diameter of (0.3 ± 0.1) µm. The samples manufactured by the Sol - gel method are produced from a commercial film and this film was also characterized. The images from the commercial film present two distinct sides, one with decreased roughness, not atomically flat and another with well oriented grooves. The images of the sample particles with incorporated silica through the Sol - gel method presents randomly distributed particles on the whole surface, without any significant difference between its two sides. It should be noted that the lack of grooves in one of the faces of Doped Nafion by the Sol gel method is a result of the incorporation process of the silica particles. |
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Santos, Danielle Fernandes Amaro doshttp://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4213731Y9Teixeira, álvaro Vianna Novaes de Carvalhohttp://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4761363J4Ferreira, Sukarno Olavohttp://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4786429E5Munford, Maximiliano Luishttp://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4791596H8Menezes Sobrinho, Ismael Limahttp://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4790268E3Couto, Marcos da Silvahttp://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4781688P4Ceotto Filho, Ginohttp://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4763744E22015-03-26T13:35:07Z2009-05-062015-03-26T13:35:07Z2008-10-31SANTOS, Danielle Fernandes Amaro dos. Atomic force microscopy in-situ of polymeric Nafion membrane surfaces with nanoparticles of incorporated silica. 2008. 80 f. Dissertação (Mestrado em Física Teórica e Computacional; Preparação e Caracterização de Materiais; Sensores e Dispositivos.) - Universidade Federal de Viçosa, Viçosa, 2008.http://locus.ufv.br/handle/123456789/4229Fountains of renewable energies are occupying an important space in scientific inquiries. Within this Proton Exchange Membrane Fuel Cells (PEMFC) stand out. Studies show that the elevation of PEMFC s operation temperature results in the increase of its efficiency. Nevertheless, in these work conditions there appears to be a necessity in improving electrolyte water retention. The electrolyte traditionally used in these cells is the Nafion ® polymer. One of the ways to improve the retention of water in the polymer in elevated temperatures is the incorporation of hydrophilic particles (ex: silica). In this work atomic force microscopy was used (Atomic Force Microscopy - AFM) to characterize the surface of Nafion membranes with nanoparticles of incorporated silica through two methods ( Casting and Sol - gel ). The AFM tests were carried out in-situ to approximate the characterization conditions to the operation conditions of an electrolyte in the PEMFC. In these experiments the semi-contact method was used to avoid damage to the surface of the polymer. Samples were used without incorporated nanoparticles as a base of comparison to identify the influence of the presence of the particles in the characteristics of the surface of the electrolyte.The obtained images of the sample manufactured by the Casting method presented two distinct sides, for the sample without nanoparticles as well as for the sample with incorporated silica nanoparticles. The first side is characterized by the presence of grooves caused by the contact of the sample with the substrate of the preparation membrane. The second side for the sample without nanoparticles presents a decreased roughness compared to the same side for the Doped sample. In the sample Doped by the Casting method, its second side is characterized by two regions, the first shows a surface totally recovered by particles and the second a surface with scattered, randomly spread particles. The silica particles have an average diameter of (0.3 ± 0.1) µm. The samples manufactured by the Sol - gel method are produced from a commercial film and this film was also characterized. The images from the commercial film present two distinct sides, one with decreased roughness, not atomically flat and another with well oriented grooves. The images of the sample particles with incorporated silica through the Sol - gel method presents randomly distributed particles on the whole surface, without any significant difference between its two sides. It should be noted that the lack of grooves in one of the faces of Doped Nafion by the Sol gel method is a result of the incorporation process of the silica particles.Fontes de energias renováveis vêm ocupando um espaço importante nas pesquisas científicas. Dentro desse panorama se destacam as Células a combustível de Membrana de Troca Protônica (Proton Exchange Membrane Fuel Cells - PEMFC). Estudos mostram que a elevação da temperatura de operação das PEMFCs resulta no aumento de sua eficiência. Contudo nessas condições de trabalho surge a necessidade de melhorar a retenção de água do eletrólito. O eletrólito tradicionalmente usado nessas células é o polímero Nafion®. Um dos caminhos para melhorar a retenção de água no polímero em temperaturas elevadas é a incorporação de partículas hidrofílicas (ex: sílica). Neste trabalho foi utilizada a microscopia de força atômica (Atomic Force Microscopy - AFM) para caracterizar a superfície de membranas de Nafion com nanopartículas de sílica incorporadas por dois métodos ( Casting e Sol-gel ). Os ensaios de AFM foram realizados in-situ para aproximar as condições de caracterização às condições de operação do eletrólito na PEMFC. Nesses experimentos foi usado o modo semi-contato para evitar a danificação da superfície do polímero. Foram usadas amostras sem nanopartículas incorporadas como base de comparação para identificar a influência da presença das partículas nas características da superfície do eletrólito.As imagens obtidas da amostra fabricada com o método Casting apresentaram dois lados distintos, tanto para amostra sem nanopartículas como para amostra com nanopartículas de sílica incorporadas. O primeiro lado é caracterizado pela presença de ranhuras causadas pelo contato da amostra com o substrato de preparo da membrana. O segundo lado para a amostra sem nanopartículas apresenta baixa rugosidade comparada com mesmo lado para amostra Dopada. Na amostra Dopada pelo método Casting, seu segundo lado é caracterizado por duas regiões, a primeira apresenta a superfície totalmente recoberta por partículas e a segunda uma superfície com partículas esparsas, espalhadas aleatoriamente. As partículas de sílica têm diâmetro médio de (0,3 ± 0,1) µm. As amostras fabricadas pelo método Sol-gel foram produzidas a partir de um filme comercial que também foi caracterizado. As imagens do filme comercial apresentaram lados distintos, um com baixa rugosidade, não atomicamente plano e outro com ranhuras bem orientadas. As imagens da amostra com partículas de sílica incorporadas pelo método Sol-gel apresentam partículas distribuídas aleatoriamente sobre toda a superfície, sem nenhuma diferença significativa entre seus dois lados. Aponta-se que a falta de ranhuras em uma das faces do Nafion Dopado pelo método Sol-gel é resultado do processo de incorporação das partículas de sílica.Conselho Nacional de Desenvolvimento Científico e Tecnológicoapplication/pdfporUniversidade Federal de ViçosaMestrado em Física AplicadaUFVBRFísica Teórica e Computacional; Preparação e Caracterização de Materiais; Sensores e Dispositivos.Microscopia de força atômicaPolímeroIn-situAtomic force microscopyPolymerIn-SituCNPQ::CIENCIAS EXATAS E DA TERRA::FISICA::FISICA DA MATERIA CONDENSADAMicroscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadasAtomic force microscopy in-situ of polymeric Nafion membrane surfaces with nanoparticles of incorporated silicainfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisinfo:eu-repo/semantics/openAccessreponame:LOCUS Repositório Institucional da UFVinstname:Universidade Federal de Viçosa (UFV)instacron:UFVORIGINALtexto completo.pdfapplication/pdf2377737https://locus.ufv.br//bitstream/123456789/4229/1/texto%20completo.pdf4f8e4c7714181665a5d834baac89b99dMD51TEXTtexto completo.pdf.txttexto completo.pdf.txtExtracted texttext/plain111228https://locus.ufv.br//bitstream/123456789/4229/2/texto%20completo.pdf.txt0af6af4ae259269b5808399589b7e116MD52THUMBNAILtexto completo.pdf.jpgtexto completo.pdf.jpgIM Thumbnailimage/jpeg3853https://locus.ufv.br//bitstream/123456789/4229/3/texto%20completo.pdf.jpgf8d7fa99b03ff7acdc51578657ee79f0MD53123456789/42292016-04-10 23:04:55.407oai:locus.ufv.br:123456789/4229Repositório InstitucionalPUBhttps://www.locus.ufv.br/oai/requestfabiojreis@ufv.bropendoar:21452016-04-11T02:04:55LOCUS Repositório Institucional da UFV - Universidade Federal de Viçosa (UFV)false |
dc.title.por.fl_str_mv |
Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas |
dc.title.alternative.eng.fl_str_mv |
Atomic force microscopy in-situ of polymeric Nafion membrane surfaces with nanoparticles of incorporated silica |
title |
Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas |
spellingShingle |
Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas Santos, Danielle Fernandes Amaro dos Microscopia de força atômica Polímero In-situ Atomic force microscopy Polymer In-Situ CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA::FISICA DA MATERIA CONDENSADA |
title_short |
Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas |
title_full |
Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas |
title_fullStr |
Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas |
title_full_unstemmed |
Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas |
title_sort |
Microscopia de força atômica in-situ de superfícies de membranas poliméricas de Nafion com nanopartículas de sílica incorporadas |
author |
Santos, Danielle Fernandes Amaro dos |
author_facet |
Santos, Danielle Fernandes Amaro dos |
author_role |
author |
dc.contributor.authorLattes.por.fl_str_mv |
http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4213731Y9 |
dc.contributor.author.fl_str_mv |
Santos, Danielle Fernandes Amaro dos |
dc.contributor.advisor-co1.fl_str_mv |
Teixeira, álvaro Vianna Novaes de Carvalho |
dc.contributor.advisor-co1Lattes.fl_str_mv |
http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4761363J4 |
dc.contributor.advisor-co2.fl_str_mv |
Ferreira, Sukarno Olavo |
dc.contributor.advisor-co2Lattes.fl_str_mv |
http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4786429E5 |
dc.contributor.advisor1.fl_str_mv |
Munford, Maximiliano Luis |
dc.contributor.advisor1Lattes.fl_str_mv |
http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4791596H8 |
dc.contributor.referee1.fl_str_mv |
Menezes Sobrinho, Ismael Lima |
dc.contributor.referee1Lattes.fl_str_mv |
http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4790268E3 |
dc.contributor.referee2.fl_str_mv |
Couto, Marcos da Silva |
dc.contributor.referee2Lattes.fl_str_mv |
http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4781688P4 |
dc.contributor.referee3.fl_str_mv |
Ceotto Filho, Gino |
dc.contributor.referee3Lattes.fl_str_mv |
http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4763744E2 |
contributor_str_mv |
Teixeira, álvaro Vianna Novaes de Carvalho Ferreira, Sukarno Olavo Munford, Maximiliano Luis Menezes Sobrinho, Ismael Lima Couto, Marcos da Silva Ceotto Filho, Gino |
dc.subject.por.fl_str_mv |
Microscopia de força atômica Polímero In-situ |
topic |
Microscopia de força atômica Polímero In-situ Atomic force microscopy Polymer In-Situ CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA::FISICA DA MATERIA CONDENSADA |
dc.subject.eng.fl_str_mv |
Atomic force microscopy Polymer In-Situ |
dc.subject.cnpq.fl_str_mv |
CNPQ::CIENCIAS EXATAS E DA TERRA::FISICA::FISICA DA MATERIA CONDENSADA |
description |
Fountains of renewable energies are occupying an important space in scientific inquiries. Within this Proton Exchange Membrane Fuel Cells (PEMFC) stand out. Studies show that the elevation of PEMFC s operation temperature results in the increase of its efficiency. Nevertheless, in these work conditions there appears to be a necessity in improving electrolyte water retention. The electrolyte traditionally used in these cells is the Nafion ® polymer. One of the ways to improve the retention of water in the polymer in elevated temperatures is the incorporation of hydrophilic particles (ex: silica). In this work atomic force microscopy was used (Atomic Force Microscopy - AFM) to characterize the surface of Nafion membranes with nanoparticles of incorporated silica through two methods ( Casting and Sol - gel ). The AFM tests were carried out in-situ to approximate the characterization conditions to the operation conditions of an electrolyte in the PEMFC. In these experiments the semi-contact method was used to avoid damage to the surface of the polymer. Samples were used without incorporated nanoparticles as a base of comparison to identify the influence of the presence of the particles in the characteristics of the surface of the electrolyte.The obtained images of the sample manufactured by the Casting method presented two distinct sides, for the sample without nanoparticles as well as for the sample with incorporated silica nanoparticles. The first side is characterized by the presence of grooves caused by the contact of the sample with the substrate of the preparation membrane. The second side for the sample without nanoparticles presents a decreased roughness compared to the same side for the Doped sample. In the sample Doped by the Casting method, its second side is characterized by two regions, the first shows a surface totally recovered by particles and the second a surface with scattered, randomly spread particles. The silica particles have an average diameter of (0.3 ± 0.1) µm. The samples manufactured by the Sol - gel method are produced from a commercial film and this film was also characterized. The images from the commercial film present two distinct sides, one with decreased roughness, not atomically flat and another with well oriented grooves. The images of the sample particles with incorporated silica through the Sol - gel method presents randomly distributed particles on the whole surface, without any significant difference between its two sides. It should be noted that the lack of grooves in one of the faces of Doped Nafion by the Sol gel method is a result of the incorporation process of the silica particles. |
publishDate |
2008 |
dc.date.issued.fl_str_mv |
2008-10-31 |
dc.date.available.fl_str_mv |
2009-05-06 2015-03-26T13:35:07Z |
dc.date.accessioned.fl_str_mv |
2015-03-26T13:35:07Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/masterThesis |
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masterThesis |
status_str |
publishedVersion |
dc.identifier.citation.fl_str_mv |
SANTOS, Danielle Fernandes Amaro dos. Atomic force microscopy in-situ of polymeric Nafion membrane surfaces with nanoparticles of incorporated silica. 2008. 80 f. Dissertação (Mestrado em Física Teórica e Computacional; Preparação e Caracterização de Materiais; Sensores e Dispositivos.) - Universidade Federal de Viçosa, Viçosa, 2008. |
dc.identifier.uri.fl_str_mv |
http://locus.ufv.br/handle/123456789/4229 |
identifier_str_mv |
SANTOS, Danielle Fernandes Amaro dos. Atomic force microscopy in-situ of polymeric Nafion membrane surfaces with nanoparticles of incorporated silica. 2008. 80 f. Dissertação (Mestrado em Física Teórica e Computacional; Preparação e Caracterização de Materiais; Sensores e Dispositivos.) - Universidade Federal de Viçosa, Viçosa, 2008. |
url |
http://locus.ufv.br/handle/123456789/4229 |
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por |
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Universidade Federal de Viçosa |
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Mestrado em Física Aplicada |
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UFV |
dc.publisher.country.fl_str_mv |
BR |
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Física Teórica e Computacional; Preparação e Caracterização de Materiais; Sensores e Dispositivos. |
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Universidade Federal de Viçosa |
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