Role of the plasma activation degree on densification of organosilicon films

Detalhes bibliográficos
Autor(a) principal: Rangel, Rita C.C. [UNESP]
Data de Publicação: 2020
Outros Autores: Cruz, Nilson C. [UNESP], Rangel, Elidiane C. [UNESP]
Tipo de documento: Conjunto de dados
Idioma: eng
Título da fonte: Repositório Institucional da UNESP (dados de pesquisa)
Texto Completo: http://dx.doi.org/10.3390/ma13010025
http://hdl.handle.net/11449/201572
Resumo: The possibility of controlling the density of organosilicon films was investigated by tuning the plasma activation degree without providing extra energy to the structure, as usually reported in the literature. For this purpose, thin films were deposited in plasmas fed with hexamethyldisiloxane/Ar mixtures at a total pressure of 9.5 Pa. The power of the radiofrequency excitation signal, P, ranged from 50 to 300W to alter the average energy of the plasma species while the electrical configuration was chosen to avoid direct ion bombardment of the growing films. In this way, it was possible to evaluate the effect of P on the film properties. Thickness and deposition rate were derived from profilometry data. X-ray energy dispersive and infrared spectroscopies were, respectively, applied to analyze the chemical composition and molecular structure of the layers. Surface topography and roughness were determined by atomic force microscopy while nanoindentation was used to evaluate the mechanical properties of the films. From electrochemical impedance spectroscopy the total resistance to the flow of electrolyte species was derived. The main alteration observed in the structure with changing P is related to the proportion of the methyl functional which remains connected to the Si backbone. Chain crosslinking and film density are affected by this structural modification induced by homogeneous and heterogeneous plasma reactions. The density increase resulted in a film with hardness comparable to that of the silica and more resistant to the permeation of oxidative species, but preserving the organosilicon nature of the structure.
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spelling Role of the plasma activation degree on densification of organosilicon filmsCorrosion barrierDensificationHMDSOOrganosiliconPECVDSiOxCyHzThe possibility of controlling the density of organosilicon films was investigated by tuning the plasma activation degree without providing extra energy to the structure, as usually reported in the literature. For this purpose, thin films were deposited in plasmas fed with hexamethyldisiloxane/Ar mixtures at a total pressure of 9.5 Pa. The power of the radiofrequency excitation signal, P, ranged from 50 to 300W to alter the average energy of the plasma species while the electrical configuration was chosen to avoid direct ion bombardment of the growing films. In this way, it was possible to evaluate the effect of P on the film properties. Thickness and deposition rate were derived from profilometry data. X-ray energy dispersive and infrared spectroscopies were, respectively, applied to analyze the chemical composition and molecular structure of the layers. Surface topography and roughness were determined by atomic force microscopy while nanoindentation was used to evaluate the mechanical properties of the films. From electrochemical impedance spectroscopy the total resistance to the flow of electrolyte species was derived. The main alteration observed in the structure with changing P is related to the proportion of the methyl functional which remains connected to the Si backbone. Chain crosslinking and film density are affected by this structural modification induced by homogeneous and heterogeneous plasma reactions. The density increase resulted in a film with hardness comparable to that of the silica and more resistant to the permeation of oxidative species, but preserving the organosilicon nature of the structure.Laboratory of Technological Plasmas (LaPTec) São Paulo State University (UNESP) Science and Technology Institute of Sorocaba (ICTS), Av. Três de Março, 511Laboratory of Technological Plasmas (LaPTec) São Paulo State University (UNESP) Science and Technology Institute of Sorocaba (ICTS), Av. Três de Março, 511Universidade Estadual Paulista (Unesp)Rangel, Rita C.C. [UNESP]Cruz, Nilson C. [UNESP]Rangel, Elidiane C. [UNESP]2020-12-12T02:36:07Z2020-12-12T02:36:07Z2020-01-01Artigoinfo:eu-repo/semantics/datasetinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/dataset25http://dx.doi.org/10.3390/ma13010025Materials, v. 13, n. 1, p. 25-, 2020.1996-1944http://hdl.handle.net/11449/20157210.3390/ma130100252-s2.0-85079776224Scopusreponame:Repositório Institucional da UNESP (dados de pesquisa)instname:Universidade Estadual Paulista (UNESP)instacron:UNSPengMaterialsinfo:eu-repo/semantics/openAccess2021-10-22T20:28:43Zoai:repositorio.unesp.br:11449/201572Repositório de Dados de PesquisaPUBhttp://repositorio.unesp.br/oai/requestrepositoriounesp@unesp.bropendoar:2021-10-22T20:28:43Repositório Institucional da UNESP (dados de pesquisa) - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Role of the plasma activation degree on densification of organosilicon films
title Role of the plasma activation degree on densification of organosilicon films
spellingShingle Role of the plasma activation degree on densification of organosilicon films
Rangel, Rita C.C. [UNESP]
Corrosion barrier
Densification
HMDSO
Organosilicon
PECVD
SiOxCyHz
title_short Role of the plasma activation degree on densification of organosilicon films
title_full Role of the plasma activation degree on densification of organosilicon films
title_fullStr Role of the plasma activation degree on densification of organosilicon films
title_full_unstemmed Role of the plasma activation degree on densification of organosilicon films
title_sort Role of the plasma activation degree on densification of organosilicon films
author Rangel, Rita C.C. [UNESP]
author_facet Rangel, Rita C.C. [UNESP]
Cruz, Nilson C. [UNESP]
Rangel, Elidiane C. [UNESP]
author_role author
author2 Cruz, Nilson C. [UNESP]
Rangel, Elidiane C. [UNESP]
author2_role author
author
dc.contributor.none.fl_str_mv Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Rangel, Rita C.C. [UNESP]
Cruz, Nilson C. [UNESP]
Rangel, Elidiane C. [UNESP]
dc.subject.por.fl_str_mv Corrosion barrier
Densification
HMDSO
Organosilicon
PECVD
SiOxCyHz
topic Corrosion barrier
Densification
HMDSO
Organosilicon
PECVD
SiOxCyHz
description The possibility of controlling the density of organosilicon films was investigated by tuning the plasma activation degree without providing extra energy to the structure, as usually reported in the literature. For this purpose, thin films were deposited in plasmas fed with hexamethyldisiloxane/Ar mixtures at a total pressure of 9.5 Pa. The power of the radiofrequency excitation signal, P, ranged from 50 to 300W to alter the average energy of the plasma species while the electrical configuration was chosen to avoid direct ion bombardment of the growing films. In this way, it was possible to evaluate the effect of P on the film properties. Thickness and deposition rate were derived from profilometry data. X-ray energy dispersive and infrared spectroscopies were, respectively, applied to analyze the chemical composition and molecular structure of the layers. Surface topography and roughness were determined by atomic force microscopy while nanoindentation was used to evaluate the mechanical properties of the films. From electrochemical impedance spectroscopy the total resistance to the flow of electrolyte species was derived. The main alteration observed in the structure with changing P is related to the proportion of the methyl functional which remains connected to the Si backbone. Chain crosslinking and film density are affected by this structural modification induced by homogeneous and heterogeneous plasma reactions. The density increase resulted in a film with hardness comparable to that of the silica and more resistant to the permeation of oxidative species, but preserving the organosilicon nature of the structure.
publishDate 2020
dc.date.none.fl_str_mv 2020-12-12T02:36:07Z
2020-12-12T02:36:07Z
2020-01-01
dc.type.driver.fl_str_mv Artigo
info:eu-repo/semantics/dataset
info:eu-repo/semantics/publishedVersion
dc.type.driver.none.fl_str_mv info:eu-repo/semantics/dataset
format dataset
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.3390/ma13010025
Materials, v. 13, n. 1, p. 25-, 2020.
1996-1944
http://hdl.handle.net/11449/201572
10.3390/ma13010025
2-s2.0-85079776224
url http://dx.doi.org/10.3390/ma13010025
http://hdl.handle.net/11449/201572
identifier_str_mv Materials, v. 13, n. 1, p. 25-, 2020.
1996-1944
10.3390/ma13010025
2-s2.0-85079776224
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Materials
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 25
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP (dados de pesquisa)
instname:Universidade Estadual Paulista (UNESP)
instacron:UNSP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNSP
institution UNSP
reponame_str Repositório Institucional da UNESP (dados de pesquisa)
collection Repositório Institucional da UNESP (dados de pesquisa)
repository.name.fl_str_mv Repositório Institucional da UNESP (dados de pesquisa) - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv repositoriounesp@unesp.br
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