Aplicações clássicas da técnica de espalhamento de raios-x a baixo ângulo em materiais nanoestruturados

• Autor(a) principal: Fermino, Tainá Zampieri [UNESP]
• Data de Publicação: 2011
• Tipo de documento: Trabalho de conclusão de curso
• Idioma: por
• Título da fonte: Repositório Institucional da UNESP
• Texto Completo: http://hdl.handle.net/11449/118997
• topic: Raios X; Raio X - Espalhamento a baixo ângulo; Nanoestrutura; X-rays; Small-angle x-ray scattering; Nanostructures

The small angle X-ray scattering (SAXS) technique has been used with very much versatility and success in the structural characterization of nanostructured materials. The present work deals with a study of the principles of the SAXS technique and of some classical models employed in the structural characterization of nanostructured materials. Particularly, the study of the models and of the associated methodologies is applied to a set of samples of silica gels, of varied typical structures, prepared in the Laboratório de Novos Materiais of the Departamento de Física of the IGCE. The work discusses in an introductory chapter the principles of the SAXS technique and the foundation of classical models often used in the structural characterization of materials. The classical models and the associated methodologies were applied to a variety of silica gel structures. The studies include: i) the scattering from a system of particles - Guinier's law; ii) the asymptotic scattering from a two-phase system - Porod's law; iii) systematic deviation from Porod's law - Surface Fractal; iv) heterogeneities in solids with random size distribution - DAB Model; and v) the scattering from mass fractal structures. The analyses were carried out from experimental SAXS data obtained in several opportunities at the Laboratório Nacional de Luz Síncrotron (LNLS)