Defect-induced photoluminescence of powdered silica glass

Detalhes bibliográficos
Autor(a) principal: Pizani, P. S.
Data de Publicação: 2008
Outros Autores: Joya, M. R., Pontes, F. M. [UNESP], Santos, L. P S, Godinho, M., Leite, E. R., Longo, Elson [UNESP]
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.4028/www.scientific.net/DDF.273-276.479
http://hdl.handle.net/11449/70350
Resumo: Visible photoluminescence was generated in standard soda-lime-silica glass powder, mechanically milled in a high-energy attrition mill. The broad emission band maximum shows a linear dependence on the exciting wavelength, suggesting the possibility to tune the PL emission. The photoluminescence was attributed to defect generation related to unsatisfied chemical bonds due to the high surface area. Raman scattering and ultraviolet-visible optical reflectance measurements corroborate this assertion. Transmission electron microscopy measurements indicate that the powder is composed by nanocrystallites with about 10-20 nanometers immersed in an amorphous media.
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spelling Defect-induced photoluminescence of powdered silica glassAttrition millPhotoluminescenceSilica glassSurface defectsEmission bandHigh-energy attrition millOptical reflectance measurementsCrystal defectsMechanical alloyingPowder metallurgyReflectometersTransmission electron microscopyFused silicaVisible photoluminescence was generated in standard soda-lime-silica glass powder, mechanically milled in a high-energy attrition mill. The broad emission band maximum shows a linear dependence on the exciting wavelength, suggesting the possibility to tune the PL emission. The photoluminescence was attributed to defect generation related to unsatisfied chemical bonds due to the high surface area. Raman scattering and ultraviolet-visible optical reflectance measurements corroborate this assertion. Transmission electron microscopy measurements indicate that the powder is composed by nanocrystallites with about 10-20 nanometers immersed in an amorphous media.Departamento de Física Universidade Federal de São Carlos, Caixa Postal 676, 13565-905 São Carlos, São PauloDepartamento de Química Faculdade de Ciências Universidade Estadual Paulista, Av. Luis E. C. Coube, 14-01, Bauru, São PauloDepartamento de Química Universidade Federal de São Carlos, Caixa Postal 676, 13565-905 São Carlos, São PauloDepartamento de Química Faculdade de Ciências Universidade Estadual Paulista, Av. Luis E. C. Coube, 14-01, Bauru, São PauloUniversidade Federal de São Carlos (UFSCar)Universidade Estadual Paulista (Unesp)Pizani, P. S.Joya, M. R.Pontes, F. M. [UNESP]Santos, L. P SGodinho, M.Leite, E. R.Longo, Elson [UNESP]2014-05-27T11:22:49Z2014-05-27T11:22:49Z2008-03-27info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject479-484http://dx.doi.org/10.4028/www.scientific.net/DDF.273-276.479Defect and Diffusion Forum, v. 273-276, p. 479-484.1012-0386http://hdl.handle.net/11449/7035010.4028/www.scientific.net/DDF.273-276.4792-s2.0-40949144941Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengDefect and Diffusion Forum0,129info:eu-repo/semantics/openAccess2024-04-29T18:17:23Zoai:repositorio.unesp.br:11449/70350Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T16:35:23.057779Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Defect-induced photoluminescence of powdered silica glass
title Defect-induced photoluminescence of powdered silica glass
spellingShingle Defect-induced photoluminescence of powdered silica glass
Pizani, P. S.
Attrition mill
Photoluminescence
Silica glass
Surface defects
Emission band
High-energy attrition mill
Optical reflectance measurements
Crystal defects
Mechanical alloying
Powder metallurgy
Reflectometers
Transmission electron microscopy
Fused silica
title_short Defect-induced photoluminescence of powdered silica glass
title_full Defect-induced photoluminescence of powdered silica glass
title_fullStr Defect-induced photoluminescence of powdered silica glass
title_full_unstemmed Defect-induced photoluminescence of powdered silica glass
title_sort Defect-induced photoluminescence of powdered silica glass
author Pizani, P. S.
author_facet Pizani, P. S.
Joya, M. R.
Pontes, F. M. [UNESP]
Santos, L. P S
Godinho, M.
Leite, E. R.
Longo, Elson [UNESP]
author_role author
author2 Joya, M. R.
Pontes, F. M. [UNESP]
Santos, L. P S
Godinho, M.
Leite, E. R.
Longo, Elson [UNESP]
author2_role author
author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade Federal de São Carlos (UFSCar)
Universidade Estadual Paulista (Unesp)
dc.contributor.author.fl_str_mv Pizani, P. S.
Joya, M. R.
Pontes, F. M. [UNESP]
Santos, L. P S
Godinho, M.
Leite, E. R.
Longo, Elson [UNESP]
dc.subject.por.fl_str_mv Attrition mill
Photoluminescence
Silica glass
Surface defects
Emission band
High-energy attrition mill
Optical reflectance measurements
Crystal defects
Mechanical alloying
Powder metallurgy
Reflectometers
Transmission electron microscopy
Fused silica
topic Attrition mill
Photoluminescence
Silica glass
Surface defects
Emission band
High-energy attrition mill
Optical reflectance measurements
Crystal defects
Mechanical alloying
Powder metallurgy
Reflectometers
Transmission electron microscopy
Fused silica
description Visible photoluminescence was generated in standard soda-lime-silica glass powder, mechanically milled in a high-energy attrition mill. The broad emission band maximum shows a linear dependence on the exciting wavelength, suggesting the possibility to tune the PL emission. The photoluminescence was attributed to defect generation related to unsatisfied chemical bonds due to the high surface area. Raman scattering and ultraviolet-visible optical reflectance measurements corroborate this assertion. Transmission electron microscopy measurements indicate that the powder is composed by nanocrystallites with about 10-20 nanometers immersed in an amorphous media.
publishDate 2008
dc.date.none.fl_str_mv 2008-03-27
2014-05-27T11:22:49Z
2014-05-27T11:22:49Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.4028/www.scientific.net/DDF.273-276.479
Defect and Diffusion Forum, v. 273-276, p. 479-484.
1012-0386
http://hdl.handle.net/11449/70350
10.4028/www.scientific.net/DDF.273-276.479
2-s2.0-40949144941
url http://dx.doi.org/10.4028/www.scientific.net/DDF.273-276.479
http://hdl.handle.net/11449/70350
identifier_str_mv Defect and Diffusion Forum, v. 273-276, p. 479-484.
1012-0386
10.4028/www.scientific.net/DDF.273-276.479
2-s2.0-40949144941
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Defect and Diffusion Forum
0,129
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 479-484
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1808128675048062976

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