Physical properties and reentrant behavior in PLZT thin films
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1080/00150193.2017.1289792 http://hdl.handle.net/11449/162787 |
Resumo: | La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films. |
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Physical properties and reentrant behavior in PLZT thin filmsPLZTthin filmsrelaxorsdipole glassLa-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films.Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Russian Foundation for Basic ResearchGovernment of the Russian FederationFCT/MECFEDERSao Paulo State Univ, Dept Chem & Phys, Ilha Solteira, SP, BrazilUral Fed Univ, Sch Nat Sci & Math, Ekaterinburg, RussiaUniv Aveiro, Dept Phys, Aveiro, PortugalUniv Aveiro, CICECO Aveiro Inst Mat, Aveiro, PortugalSao Paulo State Univ, Dept Chem & Phys, Ilha Solteira, SP, BrazilCNPq: 304604/2015-1CNPq: 400677/2014-8CNPq: 232241/2014-7Russian Foundation for Basic Research: 16-02-00821-aGovernment of the Russian Federation: 02.A03.21.0006FCT/MEC: FCT UID/CTM/50011/2013Taylor & Francis LtdUniversidade Estadual Paulista (Unesp)Ural Fed UnivUniv AveiroMelo, M. [UNESP]Araujo, E. B. [UNESP]Neradovskaya, E. A.Turygin, A. P.Esin, A. A.Shur, V. YaKholkin, A. L.2018-11-26T17:31:23Z2018-11-26T17:31:23Z2017-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article1-9application/pdfhttp://dx.doi.org/10.1080/00150193.2017.1289792Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 509, n. 1, p. 1-9, 2017.0015-0193http://hdl.handle.net/11449/16278710.1080/00150193.2017.1289792WOS:000401196300001WOS000401196300001.pdfWeb of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengFerroelectrics0,260info:eu-repo/semantics/openAccess2024-07-10T14:07:07Zoai:repositorio.unesp.br:11449/162787Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T13:39:21.094386Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Physical properties and reentrant behavior in PLZT thin films |
title |
Physical properties and reentrant behavior in PLZT thin films |
spellingShingle |
Physical properties and reentrant behavior in PLZT thin films Melo, M. [UNESP] PLZT thin films relaxors dipole glass |
title_short |
Physical properties and reentrant behavior in PLZT thin films |
title_full |
Physical properties and reentrant behavior in PLZT thin films |
title_fullStr |
Physical properties and reentrant behavior in PLZT thin films |
title_full_unstemmed |
Physical properties and reentrant behavior in PLZT thin films |
title_sort |
Physical properties and reentrant behavior in PLZT thin films |
author |
Melo, M. [UNESP] |
author_facet |
Melo, M. [UNESP] Araujo, E. B. [UNESP] Neradovskaya, E. A. Turygin, A. P. Esin, A. A. Shur, V. Ya Kholkin, A. L. |
author_role |
author |
author2 |
Araujo, E. B. [UNESP] Neradovskaya, E. A. Turygin, A. P. Esin, A. A. Shur, V. Ya Kholkin, A. L. |
author2_role |
author author author author author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) Ural Fed Univ Univ Aveiro |
dc.contributor.author.fl_str_mv |
Melo, M. [UNESP] Araujo, E. B. [UNESP] Neradovskaya, E. A. Turygin, A. P. Esin, A. A. Shur, V. Ya Kholkin, A. L. |
dc.subject.por.fl_str_mv |
PLZT thin films relaxors dipole glass |
topic |
PLZT thin films relaxors dipole glass |
description |
La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-01-01 2018-11-26T17:31:23Z 2018-11-26T17:31:23Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.none.fl_str_mv |
|
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1080/00150193.2017.1289792 Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 509, n. 1, p. 1-9, 2017. 0015-0193 http://hdl.handle.net/11449/162787 10.1080/00150193.2017.1289792 WOS:000401196300001 WOS000401196300001.pdf |
identifier_str_mv |
Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 509, n. 1, p. 1-9, 2017. 0015-0193 10.1080/00150193.2017.1289792 WOS:000401196300001 WOS000401196300001.pdf |
url |
http://dx.doi.org/10.1080/00150193.2017.1289792 http://hdl.handle.net/11449/162787 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Ferroelectrics 0,260 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
1-9 application/pdf |
dc.publisher.none.fl_str_mv |
Taylor & Francis Ltd |
publisher.none.fl_str_mv |
Taylor & Francis Ltd |
dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808128258013659136 |