Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results
Autor(a) principal: | |
---|---|
Data de Publicação: | 2013 |
Outros Autores: | , , |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1063/1.4804085 http://hdl.handle.net/11449/75415 |
Resumo: | The X-ray Fluorescence (XRF) analysis is a technique for the qualitative and quantitative determination of chemical constituents in a sample. This method is based on detection of the characteristic radiation intensities emitted by the elements of the sample, when properly excited. A variant of this technique is the Total Reflection X-ray Fluorescence (TXRF) that utilizes electromagnetic radiation as excitation source. In total reflection of X-ray, the angle of refraction of the incident beam tends to zero and the refracted beam is tangent to the sample support interface. Thus, there is a minimum angle of incidence at which no refracted beam exists and all incident radiation undergoes total reflection. In this study, we evaluated the influence of the energy variation of the beam of incident x-rays, using the MCNPX code (Monte Carlo NParticle) based on Monte Carlo method. © 2013 AIP Publishing LLC. |
id |
UNSP_844f1b5f8c5f4183ff8b1c808451fc58 |
---|---|
oai_identifier_str |
oai:repositorio.unesp.br:11449/75415 |
network_acronym_str |
UNSP |
network_name_str |
Repositório Institucional da UNESP |
repository_id_str |
2946 |
spelling |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary resultsDiagnostic X-rayMonte Carlo SimulationSynchrotron RadiationTXRFThe X-ray Fluorescence (XRF) analysis is a technique for the qualitative and quantitative determination of chemical constituents in a sample. This method is based on detection of the characteristic radiation intensities emitted by the elements of the sample, when properly excited. A variant of this technique is the Total Reflection X-ray Fluorescence (TXRF) that utilizes electromagnetic radiation as excitation source. In total reflection of X-ray, the angle of refraction of the incident beam tends to zero and the refracted beam is tangent to the sample support interface. Thus, there is a minimum angle of incidence at which no refracted beam exists and all incident radiation undergoes total reflection. In this study, we evaluated the influence of the energy variation of the beam of incident x-rays, using the MCNPX code (Monte Carlo NParticle) based on Monte Carlo method. © 2013 AIP Publishing LLC.Departamento de Física e Biofísica Instituto de Biociências de Botucatu Universidade Estadual Paulista Júlio de Mesquita FilhoDepartamento de Física e Biofísica Instituto de Biociências de Botucatu Universidade Estadual Paulista Júlio de Mesquita FilhoUniversidade Estadual Paulista (Unesp)Meira, Luiza L. C. [UNESP]Inocente, Guilherme F. [UNESP]Vieira, Letícia D. [UNESP]Mesa, Joel [UNESP]2014-05-27T11:29:30Z2014-05-27T11:29:30Z2013-05-20info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject66-69http://dx.doi.org/10.1063/1.4804085AIP Conference Proceedings, v. 1529, p. 66-69.0094-243X1551-7616http://hdl.handle.net/11449/7541510.1063/1.4804085WOS:0003197544000122-s2.0-84877774538Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengAIP Conference Proceedingsinfo:eu-repo/semantics/openAccess2021-10-23T21:41:32Zoai:repositorio.unesp.br:11449/75415Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462021-10-23T21:41:32Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results |
title |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results |
spellingShingle |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results Meira, Luiza L. C. [UNESP] Diagnostic X-ray Monte Carlo Simulation Synchrotron Radiation TXRF |
title_short |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results |
title_full |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results |
title_fullStr |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results |
title_full_unstemmed |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results |
title_sort |
Monte Carlo simulation applied in total reflection X-ray fluorescence: Preliminary results |
author |
Meira, Luiza L. C. [UNESP] |
author_facet |
Meira, Luiza L. C. [UNESP] Inocente, Guilherme F. [UNESP] Vieira, Letícia D. [UNESP] Mesa, Joel [UNESP] |
author_role |
author |
author2 |
Inocente, Guilherme F. [UNESP] Vieira, Letícia D. [UNESP] Mesa, Joel [UNESP] |
author2_role |
author author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
Meira, Luiza L. C. [UNESP] Inocente, Guilherme F. [UNESP] Vieira, Letícia D. [UNESP] Mesa, Joel [UNESP] |
dc.subject.por.fl_str_mv |
Diagnostic X-ray Monte Carlo Simulation Synchrotron Radiation TXRF |
topic |
Diagnostic X-ray Monte Carlo Simulation Synchrotron Radiation TXRF |
description |
The X-ray Fluorescence (XRF) analysis is a technique for the qualitative and quantitative determination of chemical constituents in a sample. This method is based on detection of the characteristic radiation intensities emitted by the elements of the sample, when properly excited. A variant of this technique is the Total Reflection X-ray Fluorescence (TXRF) that utilizes electromagnetic radiation as excitation source. In total reflection of X-ray, the angle of refraction of the incident beam tends to zero and the refracted beam is tangent to the sample support interface. Thus, there is a minimum angle of incidence at which no refracted beam exists and all incident radiation undergoes total reflection. In this study, we evaluated the influence of the energy variation of the beam of incident x-rays, using the MCNPX code (Monte Carlo NParticle) based on Monte Carlo method. © 2013 AIP Publishing LLC. |
publishDate |
2013 |
dc.date.none.fl_str_mv |
2013-05-20 2014-05-27T11:29:30Z 2014-05-27T11:29:30Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1063/1.4804085 AIP Conference Proceedings, v. 1529, p. 66-69. 0094-243X 1551-7616 http://hdl.handle.net/11449/75415 10.1063/1.4804085 WOS:000319754400012 2-s2.0-84877774538 |
url |
http://dx.doi.org/10.1063/1.4804085 http://hdl.handle.net/11449/75415 |
identifier_str_mv |
AIP Conference Proceedings, v. 1529, p. 66-69. 0094-243X 1551-7616 10.1063/1.4804085 WOS:000319754400012 2-s2.0-84877774538 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
AIP Conference Proceedings |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
66-69 |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1799965465810829312 |