A semiconductor strain gage tactile transducer
Autor(a) principal: | |
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Data de Publicação: | 2001 |
Outros Autores: | , , |
Tipo de documento: | Artigo de conferência |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1109/IMTC.2001.928854 http://hdl.handle.net/11449/37978 |
Resumo: | This paper describes the development of a semiconductor strain gage tactile transducer. It was designed with the goal of measuring finger forces without affecting the hand dexterity. The transducer structure was manufactured with stainless steel and has small dimensions ( 4 min diameter and I min thickness). It is light and suitable to connect to the finger pads. It has a device that prevents its damage when forces are applied. The semiconductor strain gage was used over due its small size and high sensitivity, although it has high temperature sensitivity. Theory, design and construction details are presented the signal conditioning circuit is very simple because the semiconductor strain gage sensitivity is high. It presents linear response from 0 to 100 N, 0.5 N resolution, fall time of 7.2 ms, good repeatability, and small hysteresis. The semiconductor strain gage transducer has characteristics that can make it very useful in Rehabilitation Engineering, Robotics, and Medicine. |
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A semiconductor strain gage tactile transducersemiconductor strain gagetactile transducerforce sensorfinger forcesemiconductor sensorThis paper describes the development of a semiconductor strain gage tactile transducer. It was designed with the goal of measuring finger forces without affecting the hand dexterity. The transducer structure was manufactured with stainless steel and has small dimensions ( 4 min diameter and I min thickness). It is light and suitable to connect to the finger pads. It has a device that prevents its damage when forces are applied. The semiconductor strain gage was used over due its small size and high sensitivity, although it has high temperature sensitivity. Theory, design and construction details are presented the signal conditioning circuit is very simple because the semiconductor strain gage sensitivity is high. It presents linear response from 0 to 100 N, 0.5 N resolution, fall time of 7.2 ms, good repeatability, and small hysteresis. The semiconductor strain gage transducer has characteristics that can make it very useful in Rehabilitation Engineering, Robotics, and Medicine.State Univ São Paulo, Dept Elect Engn, BR-15385000 Ilha Solteira, SP, BrazilState Univ São Paulo, Dept Elect Engn, BR-15385000 Ilha Solteira, SP, BrazilInstitute of Electrical and Electronics Engineers (IEEE)Universidade Estadual Paulista (Unesp)Obana, F. Y.Carvalho, A. A.Gualda, R.da Silva, J. G.2014-05-20T15:28:05Z2014-05-20T15:28:05Z2001-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObject429-432http://dx.doi.org/10.1109/IMTC.2001.928854Imtc/2001: Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Vols 1-3. New York: IEEE, p. 429-432, 2001.1091-5281http://hdl.handle.net/11449/3797810.1109/IMTC.2001.928854WOS:0001725509000770250066159980825Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengImtc/2001: Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Vols 1-30,198info:eu-repo/semantics/openAccess2024-07-04T19:11:55Zoai:repositorio.unesp.br:11449/37978Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T23:08:06.974899Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
A semiconductor strain gage tactile transducer |
title |
A semiconductor strain gage tactile transducer |
spellingShingle |
A semiconductor strain gage tactile transducer Obana, F. Y. semiconductor strain gage tactile transducer force sensor finger force semiconductor sensor |
title_short |
A semiconductor strain gage tactile transducer |
title_full |
A semiconductor strain gage tactile transducer |
title_fullStr |
A semiconductor strain gage tactile transducer |
title_full_unstemmed |
A semiconductor strain gage tactile transducer |
title_sort |
A semiconductor strain gage tactile transducer |
author |
Obana, F. Y. |
author_facet |
Obana, F. Y. Carvalho, A. A. Gualda, R. da Silva, J. G. |
author_role |
author |
author2 |
Carvalho, A. A. Gualda, R. da Silva, J. G. |
author2_role |
author author author |
dc.contributor.none.fl_str_mv |
Universidade Estadual Paulista (Unesp) |
dc.contributor.author.fl_str_mv |
Obana, F. Y. Carvalho, A. A. Gualda, R. da Silva, J. G. |
dc.subject.por.fl_str_mv |
semiconductor strain gage tactile transducer force sensor finger force semiconductor sensor |
topic |
semiconductor strain gage tactile transducer force sensor finger force semiconductor sensor |
description |
This paper describes the development of a semiconductor strain gage tactile transducer. It was designed with the goal of measuring finger forces without affecting the hand dexterity. The transducer structure was manufactured with stainless steel and has small dimensions ( 4 min diameter and I min thickness). It is light and suitable to connect to the finger pads. It has a device that prevents its damage when forces are applied. The semiconductor strain gage was used over due its small size and high sensitivity, although it has high temperature sensitivity. Theory, design and construction details are presented the signal conditioning circuit is very simple because the semiconductor strain gage sensitivity is high. It presents linear response from 0 to 100 N, 0.5 N resolution, fall time of 7.2 ms, good repeatability, and small hysteresis. The semiconductor strain gage transducer has characteristics that can make it very useful in Rehabilitation Engineering, Robotics, and Medicine. |
publishDate |
2001 |
dc.date.none.fl_str_mv |
2001-01-01 2014-05-20T15:28:05Z 2014-05-20T15:28:05Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/conferenceObject |
format |
conferenceObject |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1109/IMTC.2001.928854 Imtc/2001: Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Vols 1-3. New York: IEEE, p. 429-432, 2001. 1091-5281 http://hdl.handle.net/11449/37978 10.1109/IMTC.2001.928854 WOS:000172550900077 0250066159980825 |
url |
http://dx.doi.org/10.1109/IMTC.2001.928854 http://hdl.handle.net/11449/37978 |
identifier_str_mv |
Imtc/2001: Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Vols 1-3. New York: IEEE, p. 429-432, 2001. 1091-5281 10.1109/IMTC.2001.928854 WOS:000172550900077 0250066159980825 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Imtc/2001: Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Vols 1-3 0,198 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
429-432 |
dc.publisher.none.fl_str_mv |
Institute of Electrical and Electronics Engineers (IEEE) |
publisher.none.fl_str_mv |
Institute of Electrical and Electronics Engineers (IEEE) |
dc.source.none.fl_str_mv |
Web of Science reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
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1808129493439610880 |