Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition
Autor(a) principal: | |
---|---|
Data de Publicação: | 2017 |
Outros Autores: | , , , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UNESP |
Texto Completo: | http://dx.doi.org/10.1063/1.4994939 http://hdl.handle.net/11449/170331 |
Resumo: | The compositional dependence of the piezoelectric properties of self-polarized PbZr1-xTixO3 (PZT) thin films deposited on Pt/TiO2/SiO2/Si substrates (x = 0.47, 0.49 and 0.50) was investigated by in situ synchrotron X-ray diffraction and electrical measurements. The latter evidenced an imprint effect in the studied PZT films, which is pronounced for films with the composition of x = 0.50 and tends to disappear for x = 0.47. These findings were confirmed by in situ X-ray diffraction along the crystalline [100] and [110] directions of the films with different compositions revealing asymmetric butterfly loops of the piezoelectric strain as a function of the electric field; the asymmetry is more pronounced for the PZT film with a composition of x = 0.50, thus indicating a higher built-in electric field. The enhancement of the dielectric permittivity and the effective piezoelectric coefficient at compositions around the morphotropic phase boundary were interpreted in terms of the polarization rotation mechanism and the monoclinic phase in the studied PZT thin films. |
id |
UNSP_f30730a3627a9db87701b6fb4c872bc0 |
---|---|
oai_identifier_str |
oai:repositorio.unesp.br:11449/170331 |
network_acronym_str |
UNSP |
network_name_str |
Repositório Institucional da UNESP |
repository_id_str |
2946 |
spelling |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and compositionThe compositional dependence of the piezoelectric properties of self-polarized PbZr1-xTixO3 (PZT) thin films deposited on Pt/TiO2/SiO2/Si substrates (x = 0.47, 0.49 and 0.50) was investigated by in situ synchrotron X-ray diffraction and electrical measurements. The latter evidenced an imprint effect in the studied PZT films, which is pronounced for films with the composition of x = 0.50 and tends to disappear for x = 0.47. These findings were confirmed by in situ X-ray diffraction along the crystalline [100] and [110] directions of the films with different compositions revealing asymmetric butterfly loops of the piezoelectric strain as a function of the electric field; the asymmetry is more pronounced for the PZT film with a composition of x = 0.50, thus indicating a higher built-in electric field. The enhancement of the dielectric permittivity and the effective piezoelectric coefficient at compositions around the morphotropic phase boundary were interpreted in terms of the polarization rotation mechanism and the monoclinic phase in the studied PZT thin films.Aix Marseille Univ Univ Toulon CNRS IM2NPSynchrotron SOLEIL L'Orme des Merisiers, Saint-Aubin-BP 48Universidade Federal Do TocantinsSão Paulo State University (UNESP) School of Natural Sciences and Engineering Department of Physics and ChemistryDepartment of Physics CICECO-Aveiro Institute of Materials University of AveiroITMO UniversityIM2NP UMR 7334 CNRS Aix-Marseille Universite Faculte des Sciences Campus de St Jerome, Case 262 Avenue Escadrille Normandie NiemenSão Paulo State University (UNESP) School of Natural Sciences and Engineering Department of Physics and ChemistryIM2NPL'Orme des MerisiersUniversidade Federal Do TocantinsUniversidade Estadual Paulista (Unesp)University of AveiroITMO UniversityFaculte des SciencesCornelius, T. W.Mocuta, C.Escoubas, S.Merabet, A.Texier, M.Lima, E. C.Araujo, E. B. [UNESP]Kholkin, A. L.Thomas, O.2018-12-11T16:50:19Z2018-12-11T16:50:19Z2017-10-28info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://dx.doi.org/10.1063/1.4994939Journal of Applied Physics, v. 122, n. 16, 2017.1089-75500021-8979http://hdl.handle.net/11449/17033110.1063/1.49949392-s2.0-850326180532-s2.0-85032618053.pdfScopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengJournal of Applied Physics0,7390,739info:eu-repo/semantics/openAccess2023-12-12T06:18:46Zoai:repositorio.unesp.br:11449/170331Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T20:07:33.062852Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false |
dc.title.none.fl_str_mv |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition |
title |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition |
spellingShingle |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition Cornelius, T. W. |
title_short |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition |
title_full |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition |
title_fullStr |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition |
title_full_unstemmed |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition |
title_sort |
Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition |
author |
Cornelius, T. W. |
author_facet |
Cornelius, T. W. Mocuta, C. Escoubas, S. Merabet, A. Texier, M. Lima, E. C. Araujo, E. B. [UNESP] Kholkin, A. L. Thomas, O. |
author_role |
author |
author2 |
Mocuta, C. Escoubas, S. Merabet, A. Texier, M. Lima, E. C. Araujo, E. B. [UNESP] Kholkin, A. L. Thomas, O. |
author2_role |
author author author author author author author author |
dc.contributor.none.fl_str_mv |
IM2NP L'Orme des Merisiers Universidade Federal Do Tocantins Universidade Estadual Paulista (Unesp) University of Aveiro ITMO University Faculte des Sciences |
dc.contributor.author.fl_str_mv |
Cornelius, T. W. Mocuta, C. Escoubas, S. Merabet, A. Texier, M. Lima, E. C. Araujo, E. B. [UNESP] Kholkin, A. L. Thomas, O. |
description |
The compositional dependence of the piezoelectric properties of self-polarized PbZr1-xTixO3 (PZT) thin films deposited on Pt/TiO2/SiO2/Si substrates (x = 0.47, 0.49 and 0.50) was investigated by in situ synchrotron X-ray diffraction and electrical measurements. The latter evidenced an imprint effect in the studied PZT films, which is pronounced for films with the composition of x = 0.50 and tends to disappear for x = 0.47. These findings were confirmed by in situ X-ray diffraction along the crystalline [100] and [110] directions of the films with different compositions revealing asymmetric butterfly loops of the piezoelectric strain as a function of the electric field; the asymmetry is more pronounced for the PZT film with a composition of x = 0.50, thus indicating a higher built-in electric field. The enhancement of the dielectric permittivity and the effective piezoelectric coefficient at compositions around the morphotropic phase boundary were interpreted in terms of the polarization rotation mechanism and the monoclinic phase in the studied PZT thin films. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-10-28 2018-12-11T16:50:19Z 2018-12-11T16:50:19Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://dx.doi.org/10.1063/1.4994939 Journal of Applied Physics, v. 122, n. 16, 2017. 1089-7550 0021-8979 http://hdl.handle.net/11449/170331 10.1063/1.4994939 2-s2.0-85032618053 2-s2.0-85032618053.pdf |
url |
http://dx.doi.org/10.1063/1.4994939 http://hdl.handle.net/11449/170331 |
identifier_str_mv |
Journal of Applied Physics, v. 122, n. 16, 2017. 1089-7550 0021-8979 10.1063/1.4994939 2-s2.0-85032618053 2-s2.0-85032618053.pdf |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
Journal of Applied Physics 0,739 0,739 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
Scopus reponame:Repositório Institucional da UNESP instname:Universidade Estadual Paulista (UNESP) instacron:UNESP |
instname_str |
Universidade Estadual Paulista (UNESP) |
instacron_str |
UNESP |
institution |
UNESP |
reponame_str |
Repositório Institucional da UNESP |
collection |
Repositório Institucional da UNESP |
repository.name.fl_str_mv |
Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP) |
repository.mail.fl_str_mv |
|
_version_ |
1808129162542579712 |