Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior

Detalhes bibliográficos
Autor(a) principal: Nozaki, Ricardo
Data de Publicação: 2014
Outros Autores: Tusset, Angelo M., Navarro, Hélio A., Bueno, Atila M. [UNESP], Brasil, Reyolando, Balthazar, José M. [UNESP], Da Silva, Marcelo A. Pereira
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1115/IMECE2014-38386
http://hdl.handle.net/11449/177325
Resumo: This paper presents results obtained numerically by an experimental approach. The sensor of the atomic force microscope generated cantilever deflections series that were recorded in data files as a function of time and as a function of tip-sample distance. With these series of deflections, we attempted to adjust parameters and refine models of classical oscillators atomic force microscope, making them more sensitive to tip-sample distance, through the method of system identification proposed by [12]. This method allows us to choose any model and, through its analytical solution, compare the results obtained with the experiment. The reconstruction of the state space is done with the intention of observing different phase portraits for different distances between sample-tip.
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spelling Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behaviorThis paper presents results obtained numerically by an experimental approach. The sensor of the atomic force microscope generated cantilever deflections series that were recorded in data files as a function of time and as a function of tip-sample distance. With these series of deflections, we attempted to adjust parameters and refine models of classical oscillators atomic force microscope, making them more sensitive to tip-sample distance, through the method of system identification proposed by [12]. This method allows us to choose any model and, through its analytical solution, compare the results obtained with the experiment. The reconstruction of the state space is done with the intention of observing different phase portraits for different distances between sample-tip.University of São PauloFederal Technological, University of ParanáUNESP-SorocabaFederal University of ABCUNESP-BauruUniversity of São, Paulo and Central, University PaulistaUNESP-SorocabaUNESP-BauruUniversidade de São Paulo (USP)Federal Technological, University of ParanáUniversidade Estadual Paulista (Unesp)Federal University of ABCUniversity of São, Paulo and Central, University PaulistaNozaki, RicardoTusset, Angelo M.Navarro, Hélio A.Bueno, Atila M. [UNESP]Brasil, ReyolandoBalthazar, José M. [UNESP]Da Silva, Marcelo A. Pereira2018-12-11T17:24:58Z2018-12-11T17:24:58Z2014-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjecthttp://dx.doi.org/10.1115/IMECE2014-38386ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE), v. 4A.http://hdl.handle.net/11449/17732510.1115/IMECE2014-383862-s2.0-84926370618Scopusreponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)info:eu-repo/semantics/openAccess2021-10-23T21:47:04Zoai:repositorio.unesp.br:11449/177325Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T22:08:34.489705Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
title Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
spellingShingle Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
Nozaki, Ricardo
title_short Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
title_full Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
title_fullStr Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
title_full_unstemmed Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
title_sort Signals generated by a sensor that captures the cantilever deflection of the atomic force microscope with nonlinear behavior
author Nozaki, Ricardo
author_facet Nozaki, Ricardo
Tusset, Angelo M.
Navarro, Hélio A.
Bueno, Atila M. [UNESP]
Brasil, Reyolando
Balthazar, José M. [UNESP]
Da Silva, Marcelo A. Pereira
author_role author
author2 Tusset, Angelo M.
Navarro, Hélio A.
Bueno, Atila M. [UNESP]
Brasil, Reyolando
Balthazar, José M. [UNESP]
Da Silva, Marcelo A. Pereira
author2_role author
author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade de São Paulo (USP)
Federal Technological, University of Paraná
Universidade Estadual Paulista (Unesp)
Federal University of ABC
University of São, Paulo and Central, University Paulista
dc.contributor.author.fl_str_mv Nozaki, Ricardo
Tusset, Angelo M.
Navarro, Hélio A.
Bueno, Atila M. [UNESP]
Brasil, Reyolando
Balthazar, José M. [UNESP]
Da Silva, Marcelo A. Pereira
description This paper presents results obtained numerically by an experimental approach. The sensor of the atomic force microscope generated cantilever deflections series that were recorded in data files as a function of time and as a function of tip-sample distance. With these series of deflections, we attempted to adjust parameters and refine models of classical oscillators atomic force microscope, making them more sensitive to tip-sample distance, through the method of system identification proposed by [12]. This method allows us to choose any model and, through its analytical solution, compare the results obtained with the experiment. The reconstruction of the state space is done with the intention of observing different phase portraits for different distances between sample-tip.
publishDate 2014
dc.date.none.fl_str_mv 2014-01-01
2018-12-11T17:24:58Z
2018-12-11T17:24:58Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1115/IMECE2014-38386
ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE), v. 4A.
http://hdl.handle.net/11449/177325
10.1115/IMECE2014-38386
2-s2.0-84926370618
url http://dx.doi.org/10.1115/IMECE2014-38386
http://hdl.handle.net/11449/177325
identifier_str_mv ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE), v. 4A.
10.1115/IMECE2014-38386
2-s2.0-84926370618
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.source.none.fl_str_mv Scopus
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
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