Data processing within rows for sugarcane yield mapping

• Autor(a) principal: Maldaner, Leonardo Felipe
• Data de Publicação: 2020
• Outros Autores: Molin, José Paulo
• Tipo de documento: Artigo
• Idioma: eng
• Título da fonte: Scientia Agrícola (Online)
• Texto Completo: https://www.revistas.usp.br/sa/article/view/182954
• topic: yield monitor; sugarcane variability; line maps

The mapping of sugarcane yield is still not as widely available as it is for grain crops. Sugarcane harvesters cut and process the cane in a single or maximum of two rows, facilitating the monitoring of cane yield and its behavior on a small scale. This study tested a method for sugarcane yield data cleaning, investigating if the data recording frequency influences the characterization of yield variations in mapping high-resolution spatial data within a single row. Four data sets from yield monitors of single row harvesting were used. A cleaning process with global and anisotropic filtering in a single sugarcane row was applied. The local outlier cleaner compares the yield value of a point with its nearest neighbors within the same row. Even after the elimination of outliers, there is great variation in yield between the rows, and this variation is much smaller in a single row. A frequency of 2 Hz was required for identifying and characterizing small yield variations within the sugarcane rows whilst other frequencies tried (0.2 and 0.1 Hz) resulted in loss of information on yield variability within the row. The difference between the root mean square error (RMSE) of ordinary kriging (OK) and inverse distance weighting (IDW) techniques is large enough to suggest the use of an individual yield line. Individual yield lines saved information in the data generated by the yield monitor unlike IDW and OK interpolation methods which omitted information over short distances within the rows and compromised the quality of high-resolution maps.