Direct probing of semiconductor barium titanate via electrostatic force microscopy
Autor(a) principal: | |
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Data de Publicação: | 2007 |
Outros Autores: | , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Cerâmica (São Paulo. Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015 |
Resumo: | Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage was mapped up to 10 V and the distribution of potential across the sample showed changes in regions that matched the grain boundaries, displaying a constant barrier width of 145.2 nm. |
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USP-29 |
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Cerâmica (São Paulo. Online) |
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|
spelling |
Direct probing of semiconductor barium titanate via electrostatic force microscopyelectrostatic force microscopyelectric potentialbarriersbarium titanateElectrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage was mapped up to 10 V and the distribution of potential across the sample showed changes in regions that matched the grain boundaries, displaying a constant barrier width of 145.2 nm.Associação Brasileira de Cerâmica2007-06-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015Cerâmica v.53 n.326 2007reponame:Cerâmica (São Paulo. Online)instname:Universidade de São Paulo (USP)instacron:USP10.1590/S0366-69132007000200015info:eu-repo/semantics/openAccessGheno,S. M.Hasegawa,H. L.Paulin Filho,P. I.eng2007-08-30T00:00:00Zoai:scielo:S0366-69132007000200015Revistahttps://www.scielo.br/j/ce/PUBhttps://old.scielo.br/oai/scielo-oai.phpceram.abc@gmail.com||ceram.abc@gmail.com1678-45530366-6913opendoar:2007-08-30T00:00Cerâmica (São Paulo. Online) - Universidade de São Paulo (USP)false |
dc.title.none.fl_str_mv |
Direct probing of semiconductor barium titanate via electrostatic force microscopy |
title |
Direct probing of semiconductor barium titanate via electrostatic force microscopy |
spellingShingle |
Direct probing of semiconductor barium titanate via electrostatic force microscopy Gheno,S. M. electrostatic force microscopy electric potential barriers barium titanate |
title_short |
Direct probing of semiconductor barium titanate via electrostatic force microscopy |
title_full |
Direct probing of semiconductor barium titanate via electrostatic force microscopy |
title_fullStr |
Direct probing of semiconductor barium titanate via electrostatic force microscopy |
title_full_unstemmed |
Direct probing of semiconductor barium titanate via electrostatic force microscopy |
title_sort |
Direct probing of semiconductor barium titanate via electrostatic force microscopy |
author |
Gheno,S. M. |
author_facet |
Gheno,S. M. Hasegawa,H. L. Paulin Filho,P. I. |
author_role |
author |
author2 |
Hasegawa,H. L. Paulin Filho,P. I. |
author2_role |
author author |
dc.contributor.author.fl_str_mv |
Gheno,S. M. Hasegawa,H. L. Paulin Filho,P. I. |
dc.subject.por.fl_str_mv |
electrostatic force microscopy electric potential barriers barium titanate |
topic |
electrostatic force microscopy electric potential barriers barium titanate |
description |
Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage was mapped up to 10 V and the distribution of potential across the sample showed changes in regions that matched the grain boundaries, displaying a constant barrier width of 145.2 nm. |
publishDate |
2007 |
dc.date.none.fl_str_mv |
2007-06-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/S0366-69132007000200015 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Associação Brasileira de Cerâmica |
publisher.none.fl_str_mv |
Associação Brasileira de Cerâmica |
dc.source.none.fl_str_mv |
Cerâmica v.53 n.326 2007 reponame:Cerâmica (São Paulo. Online) instname:Universidade de São Paulo (USP) instacron:USP |
instname_str |
Universidade de São Paulo (USP) |
instacron_str |
USP |
institution |
USP |
reponame_str |
Cerâmica (São Paulo. Online) |
collection |
Cerâmica (São Paulo. Online) |
repository.name.fl_str_mv |
Cerâmica (São Paulo. Online) - Universidade de São Paulo (USP) |
repository.mail.fl_str_mv |
ceram.abc@gmail.com||ceram.abc@gmail.com |
_version_ |
1748936780963381248 |