Direct probing of semiconductor barium titanate via electrostatic force microscopy

Detalhes bibliográficos
Autor(a) principal: Gheno,S. M.
Data de Publicação: 2007
Outros Autores: Hasegawa,H. L., Paulin Filho,P. I.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Cerâmica (São Paulo. Online)
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015
Resumo: Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage was mapped up to 10 V and the distribution of potential across the sample showed changes in regions that matched the grain boundaries, displaying a constant barrier width of 145.2 nm.
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spelling Direct probing of semiconductor barium titanate via electrostatic force microscopyelectrostatic force microscopyelectric potentialbarriersbarium titanateElectrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage was mapped up to 10 V and the distribution of potential across the sample showed changes in regions that matched the grain boundaries, displaying a constant barrier width of 145.2 nm.Associação Brasileira de Cerâmica2007-06-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015Cerâmica v.53 n.326 2007reponame:Cerâmica (São Paulo. Online)instname:Universidade de São Paulo (USP)instacron:USP10.1590/S0366-69132007000200015info:eu-repo/semantics/openAccessGheno,S. M.Hasegawa,H. L.Paulin Filho,P. I.eng2007-08-30T00:00:00Zoai:scielo:S0366-69132007000200015Revistahttps://www.scielo.br/j/ce/PUBhttps://old.scielo.br/oai/scielo-oai.phpceram.abc@gmail.com||ceram.abc@gmail.com1678-45530366-6913opendoar:2007-08-30T00:00Cerâmica (São Paulo. Online) - Universidade de São Paulo (USP)false
dc.title.none.fl_str_mv Direct probing of semiconductor barium titanate via electrostatic force microscopy
title Direct probing of semiconductor barium titanate via electrostatic force microscopy
spellingShingle Direct probing of semiconductor barium titanate via electrostatic force microscopy
Gheno,S. M.
electrostatic force microscopy
electric potential
barriers
barium titanate
title_short Direct probing of semiconductor barium titanate via electrostatic force microscopy
title_full Direct probing of semiconductor barium titanate via electrostatic force microscopy
title_fullStr Direct probing of semiconductor barium titanate via electrostatic force microscopy
title_full_unstemmed Direct probing of semiconductor barium titanate via electrostatic force microscopy
title_sort Direct probing of semiconductor barium titanate via electrostatic force microscopy
author Gheno,S. M.
author_facet Gheno,S. M.
Hasegawa,H. L.
Paulin Filho,P. I.
author_role author
author2 Hasegawa,H. L.
Paulin Filho,P. I.
author2_role author
author
dc.contributor.author.fl_str_mv Gheno,S. M.
Hasegawa,H. L.
Paulin Filho,P. I.
dc.subject.por.fl_str_mv electrostatic force microscopy
electric potential
barriers
barium titanate
topic electrostatic force microscopy
electric potential
barriers
barium titanate
description Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were performed using noncontact scans at a constant tip-sample separation of 75 nm with varied bias voltages applied to the sample. The applied voltage was mapped up to 10 V and the distribution of potential across the sample showed changes in regions that matched the grain boundaries, displaying a constant barrier width of 145.2 nm.
publishDate 2007
dc.date.none.fl_str_mv 2007-06-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132007000200015
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/S0366-69132007000200015
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Associação Brasileira de Cerâmica
publisher.none.fl_str_mv Associação Brasileira de Cerâmica
dc.source.none.fl_str_mv Cerâmica v.53 n.326 2007
reponame:Cerâmica (São Paulo. Online)
instname:Universidade de São Paulo (USP)
instacron:USP
instname_str Universidade de São Paulo (USP)
instacron_str USP
institution USP
reponame_str Cerâmica (São Paulo. Online)
collection Cerâmica (São Paulo. Online)
repository.name.fl_str_mv Cerâmica (São Paulo. Online) - Universidade de São Paulo (USP)
repository.mail.fl_str_mv ceram.abc@gmail.com||ceram.abc@gmail.com
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