Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating

Detalhes bibliográficos
Autor(a) principal: Bazzo, João Paulo
Data de Publicação: 2011
Outros Autores: Lukasievicz, Tiago, Vogt, Marcio, Oliveira, Valmir de, Kalinowsky, Hypolito Jose, Silva, Jean Carlos Cardozo da
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UTFPR (da Universidade Tecnológica Federal do Paraná (RIUT))
Texto Completo: http://repositorio.utfpr.edu.br/jspui/handle/1/475
Resumo: This paper proposes a new technique to monitor the junction temperature of an insulated gate bipolar transistor (IGBT) through direct measurement using an optical fiber sensor mounted on the chip structure. Some features of the sensor such as electromagnetic immunity, small size and fast response time allow the identification of temperature changes generated by the energy loss during device operation. In addition to the online monitoring of the junction temperature, results show the thermal characteristics of the IGBT, which can be used to develop an accurate model to simulate the heat generated during the device conduction and switching processes.
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spelling 2013-05-29T15:48:01Z2011BAZZO, João Paulo et al. Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating. In: INTERNATIONAL CONFERENCE ON OPTICAL FIBER SENSORS, 21., 2011, Ottawa. Anais… Ottawa: Proceedings of SPIE, 2011.http://repositorio.utfpr.edu.br/jspui/handle/1/47510.1117/12.885329This paper proposes a new technique to monitor the junction temperature of an insulated gate bipolar transistor (IGBT) through direct measurement using an optical fiber sensor mounted on the chip structure. Some features of the sensor such as electromagnetic immunity, small size and fast response time allow the identification of temperature changes generated by the energy loss during device operation. In addition to the online monitoring of the junction temperature, results show the thermal characteristics of the IGBT, which can be used to develop an accurate model to simulate the heat generated during the device conduction and switching processes.5000engProceedings of SPIEhttp://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=753240An error occurred getting the license - uri.info:eu-repo/semantics/openAccessSemicondutores - JunçõesFibras ópticasAnálise térmicaDetectores ópticosSemiconductors - JunctionsOptical fibersThermal analysisOptical detectorsMonitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg gratinginfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectPato BrancoBazzo, João PauloLukasievicz, TiagoVogt, MarcioOliveira, Valmir deKalinowsky, Hypolito JoseSilva, Jean Carlos Cardozo dareponame:Repositório Institucional da UTFPR (da Universidade Tecnológica Federal do Paraná (RIUT))instname:Universidade Tecnológica Federal do Paraná (UTFPR)instacron:UTFPRTHUMBNAILOFS_Bazzo, João Paulo_2011.pdf.jpgOFS_Bazzo, João Paulo_2011.pdf.jpgGenerated Thumbnailimage/jpeg1746http://repositorio.utfpr.edu.br:8080/jspui/bitstream/1/475/6/OFS_Bazzo%2c%20Jo%c3%a3o%20Paulo_2011.pdf.jpg7e38c1b095f8a154dc95f35db445d06eMD56ORIGINALOFS_Bazzo, João Paulo_2011.pdfOFS_Bazzo, João Paulo_2011.pdfapplication/pdf543098http://repositorio.utfpr.edu.br:8080/jspui/bitstream/1/475/3/OFS_Bazzo%2c%20Jo%c3%a3o%20Paulo_2011.pdf543277488160a321e5de784ff2404d41MD53LICENSElicense.txtlicense.txttext/plain; charset=utf-81748http://repositorio.utfpr.edu.br:8080/jspui/bitstream/1/475/4/license.txt8a4605be74aa9ea9d79846c1fba20a33MD54TEXTOFS_Bazzo, João Paulo_2011.pdf.txtOFS_Bazzo, João Paulo_2011.pdf.txtExtracted texttext/plain11559http://repositorio.utfpr.edu.br:8080/jspui/bitstream/1/475/5/OFS_Bazzo%2c%20Jo%c3%a3o%20Paulo_2011.pdf.txtf5abc8c10ca38d36a40531f0ea5eb764MD551/4752016-08-09 17:35:03.619oai:repositorio.utfpr.edu.br:1/475Tk9URTogUExBQ0UgWU9VUiBPV04gTElDRU5TRSBIRVJFClRoaXMgc2FtcGxlIGxpY2Vuc2UgaXMgcHJvdmlkZWQgZm9yIGluZm9ybWF0aW9uYWwgcHVycG9zZXMgb25seS4KCk5PTi1FWENMVVNJVkUgRElTVFJJQlVUSU9OIExJQ0VOU0UKCkJ5IHNpZ25pbmcgYW5kIHN1Ym1pdHRpbmcgdGhpcyBsaWNlbnNlLCB5b3UgKHRoZSBhdXRob3Iocykgb3IgY29weXJpZ2h0Cm93bmVyKSBncmFudHMgdG8gRFNwYWNlIFVuaXZlcnNpdHkgKERTVSkgdGhlIG5vbi1leGNsdXNpdmUgcmlnaHQgdG8gcmVwcm9kdWNlLAp0cmFuc2xhdGUgKGFzIGRlZmluZWQgYmVsb3cpLCBhbmQvb3IgZGlzdHJpYnV0ZSB5b3VyIHN1Ym1pc3Npb24gKGluY2x1ZGluZwp0aGUgYWJzdHJhY3QpIHdvcmxkd2lkZSBpbiBwcmludCBhbmQgZWxlY3Ryb25pYyBmb3JtYXQgYW5kIGluIGFueSBtZWRpdW0sCmluY2x1ZGluZyBidXQgbm90IGxpbWl0ZWQgdG8gYXVkaW8gb3IgdmlkZW8uCgpZb3UgYWdyZWUgdGhhdCBEU1UgbWF5LCB3aXRob3V0IGNoYW5naW5nIHRoZSBjb250ZW50LCB0cmFuc2xhdGUgdGhlCnN1Ym1pc3Npb24gdG8gYW55IG1lZGl1bSBvciBmb3JtYXQgZm9yIHRoZSBwdXJwb3NlIG9mIHByZXNlcnZhdGlvbi4KCllvdSBhbHNvIGFncmVlIHRoYXQgRFNVIG1heSBrZWVwIG1vcmUgdGhhbiBvbmUgY29weSBvZiB0aGlzIHN1Ym1pc3Npb24gZm9yCnB1cnBvc2VzIG9mIHNlY3VyaXR5LCBiYWNrLXVwIGFuZCBwcmVzZXJ2YXRpb24uCgpZb3UgcmVwcmVzZW50IHRoYXQgdGhlIHN1Ym1pc3Npb24gaXMgeW91ciBvcmlnaW5hbCB3b3JrLCBhbmQgdGhhdCB5b3UgaGF2ZQp0aGUgcmlnaHQgdG8gZ3JhbnQgdGhlIHJpZ2h0cyBjb250YWluZWQgaW4gdGhpcyBsaWNlbnNlLiBZb3UgYWxzbyByZXByZXNlbnQKdGhhdCB5b3VyIHN1Ym1pc3Npb24gZG9lcyBub3QsIHRvIHRoZSBiZXN0IG9mIHlvdXIga25vd2xlZGdlLCBpbmZyaW5nZSB1cG9uCmFueW9uZSdzIGNvcHlyaWdodC4KCklmIHRoZSBzdWJtaXNzaW9uIGNvbnRhaW5zIG1hdGVyaWFsIGZvciB3aGljaCB5b3UgZG8gbm90IGhvbGQgY29weXJpZ2h0LAp5b3UgcmVwcmVzZW50IHRoYXQgeW91IGhhdmUgb2J0YWluZWQgdGhlIHVucmVzdHJpY3RlZCBwZXJtaXNzaW9uIG9mIHRoZQpjb3B5cmlnaHQgb3duZXIgdG8gZ3JhbnQgRFNVIHRoZSByaWdodHMgcmVxdWlyZWQgYnkgdGhpcyBsaWNlbnNlLCBhbmQgdGhhdApzdWNoIHRoaXJkLXBhcnR5IG93bmVkIG1hdGVyaWFsIGlzIGNsZWFybHkgaWRlbnRpZmllZCBhbmQgYWNrbm93bGVkZ2VkCndpdGhpbiB0aGUgdGV4dCBvciBjb250ZW50IG9mIHRoZSBzdWJtaXNzaW9uLgoKSUYgVEhFIFNVQk1JU1NJT04gSVMgQkFTRUQgVVBPTiBXT1JLIFRIQVQgSEFTIEJFRU4gU1BPTlNPUkVEIE9SIFNVUFBPUlRFRApCWSBBTiBBR0VOQ1kgT1IgT1JHQU5JWkFUSU9OIE9USEVSIFRIQU4gRFNVLCBZT1UgUkVQUkVTRU5UIFRIQVQgWU9VIEhBVkUKRlVMRklMTEVEIEFOWSBSSUdIVCBPRiBSRVZJRVcgT1IgT1RIRVIgT0JMSUdBVElPTlMgUkVRVUlSRUQgQlkgU1VDSApDT05UUkFDVCBPUiBBR1JFRU1FTlQuCgpEU1Ugd2lsbCBjbGVhcmx5IGlkZW50aWZ5IHlvdXIgbmFtZShzKSBhcyB0aGUgYXV0aG9yKHMpIG9yIG93bmVyKHMpIG9mIHRoZQpzdWJtaXNzaW9uLCBhbmQgd2lsbCBub3QgbWFrZSBhbnkgYWx0ZXJhdGlvbiwgb3RoZXIgdGhhbiBhcyBhbGxvd2VkIGJ5IHRoaXMKbGljZW5zZSwgdG8geW91ciBzdWJtaXNzaW9uLgo=Repositório de PublicaçõesPUBhttp://repositorio.utfpr.edu.br:8080/oai/requestopendoar:2016-08-09T20:35:03Repositório Institucional da UTFPR (da Universidade Tecnológica Federal do Paraná (RIUT)) - Universidade Tecnológica Federal do Paraná (UTFPR)false
dc.title.pt_BR.fl_str_mv Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
title Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
spellingShingle Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
Bazzo, João Paulo
Semicondutores - Junções
Fibras ópticas
Análise térmica
Detectores ópticos
Semiconductors - Junctions
Optical fibers
Thermal analysis
Optical detectors
title_short Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
title_full Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
title_fullStr Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
title_full_unstemmed Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
title_sort Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating
author Bazzo, João Paulo
author_facet Bazzo, João Paulo
Lukasievicz, Tiago
Vogt, Marcio
Oliveira, Valmir de
Kalinowsky, Hypolito Jose
Silva, Jean Carlos Cardozo da
author_role author
author2 Lukasievicz, Tiago
Vogt, Marcio
Oliveira, Valmir de
Kalinowsky, Hypolito Jose
Silva, Jean Carlos Cardozo da
author2_role author
author
author
author
author
dc.contributor.author.fl_str_mv Bazzo, João Paulo
Lukasievicz, Tiago
Vogt, Marcio
Oliveira, Valmir de
Kalinowsky, Hypolito Jose
Silva, Jean Carlos Cardozo da
dc.subject.por.fl_str_mv Semicondutores - Junções
Fibras ópticas
Análise térmica
Detectores ópticos
Semiconductors - Junctions
Optical fibers
Thermal analysis
Optical detectors
topic Semicondutores - Junções
Fibras ópticas
Análise térmica
Detectores ópticos
Semiconductors - Junctions
Optical fibers
Thermal analysis
Optical detectors
description This paper proposes a new technique to monitor the junction temperature of an insulated gate bipolar transistor (IGBT) through direct measurement using an optical fiber sensor mounted on the chip structure. Some features of the sensor such as electromagnetic immunity, small size and fast response time allow the identification of temperature changes generated by the energy loss during device operation. In addition to the online monitoring of the junction temperature, results show the thermal characteristics of the IGBT, which can be used to develop an accurate model to simulate the heat generated during the device conduction and switching processes.
publishDate 2011
dc.date.issued.fl_str_mv 2011
dc.date.accessioned.fl_str_mv 2013-05-29T15:48:01Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
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status_str publishedVersion
dc.identifier.citation.fl_str_mv BAZZO, João Paulo et al. Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating. In: INTERNATIONAL CONFERENCE ON OPTICAL FIBER SENSORS, 21., 2011, Ottawa. Anais… Ottawa: Proceedings of SPIE, 2011.
dc.identifier.uri.fl_str_mv http://repositorio.utfpr.edu.br/jspui/handle/1/475
dc.identifier.DOI.pt_BR.fl_str_mv 10.1117/12.885329
identifier_str_mv BAZZO, João Paulo et al. Monitoring the junction temperature of an IGBT through direct measurement using a fiber Bragg grating. In: INTERNATIONAL CONFERENCE ON OPTICAL FIBER SENSORS, 21., 2011, Ottawa. Anais… Ottawa: Proceedings of SPIE, 2011.
10.1117/12.885329
url http://repositorio.utfpr.edu.br/jspui/handle/1/475
dc.language.iso.fl_str_mv eng
language eng
dc.relation.ispartof.pt_BR.fl_str_mv Proceedings of SPIE
dc.relation.uri.pt_BR.fl_str_mv http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=753240
dc.rights.driver.fl_str_mv An error occurred getting the license - uri.
info:eu-repo/semantics/openAccess
rights_invalid_str_mv An error occurred getting the license - uri.
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Pato Branco
publisher.none.fl_str_mv Pato Branco
dc.source.none.fl_str_mv reponame:Repositório Institucional da UTFPR (da Universidade Tecnológica Federal do Paraná (RIUT))
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