Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor
Autor(a) principal: | |
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Data de Publicação: | 2016 |
Outros Autores: | , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Materials research (São Carlos. Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000100267 |
Resumo: | Fluorine-doped tin oxide (SnO2:F) was investigate as the sensitive part of a pH sensor in the extended-gate field effect transistors (EGFET) device, which provided a linear response for pH range from 2 to 12; the sensitivity was 37 mV.pH-1 for experiments performed in absence of light. Neutral pH, leads to a transistor’s electric current remained practically constant, suggesting that pH 7 correspond to the isoelectric point of the SnO2:F samples. For acid and alkaline pH, the power law varied along time and stabilized at about 10 min. UV-vis light did not alter the results. The transistor’s electric current increased with the operating temperature increases. Once that small change in the operating conditions can alter the results, the physical mechanisms underlying the sensing process must be clearly understood. It is essential to monitor transient response and measurements conditions. |
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Materials research (São Carlos. Online) |
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Effects of Measurements Conditions on an Extended-Gate FET used as pH sensorExtended-gate FETFluorine-doped tin oxidepH sensorTemperature dependenceTime evolutionFluorine-doped tin oxide (SnO2:F) was investigate as the sensitive part of a pH sensor in the extended-gate field effect transistors (EGFET) device, which provided a linear response for pH range from 2 to 12; the sensitivity was 37 mV.pH-1 for experiments performed in absence of light. Neutral pH, leads to a transistor’s electric current remained practically constant, suggesting that pH 7 correspond to the isoelectric point of the SnO2:F samples. For acid and alkaline pH, the power law varied along time and stabilized at about 10 min. UV-vis light did not alter the results. The transistor’s electric current increased with the operating temperature increases. Once that small change in the operating conditions can alter the results, the physical mechanisms underlying the sensing process must be clearly understood. It is essential to monitor transient response and measurements conditions.ABM, ABC, ABPol2016-02-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000100267Materials Research v.19 n.1 2016reponame:Materials research (São Carlos. Online)instname:Universidade Federal de São Carlos (UFSCAR)instacron:ABM ABC ABPOL10.1590/1980-5373-MR-2015-0248info:eu-repo/semantics/openAccessFernandes,Jessica ColnaghiNascimento,Raphael Aparecido SanchesMulato,Marceloeng2016-03-29T00:00:00Zoai:scielo:S1516-14392016000100267Revistahttp://www.scielo.br/mrPUBhttps://old.scielo.br/oai/scielo-oai.phpdedz@power.ufscar.br1980-53731516-1439opendoar:2016-03-29T00:00Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR)false |
dc.title.none.fl_str_mv |
Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor |
title |
Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor |
spellingShingle |
Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor Fernandes,Jessica Colnaghi Extended-gate FET Fluorine-doped tin oxide pH sensor Temperature dependence Time evolution |
title_short |
Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor |
title_full |
Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor |
title_fullStr |
Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor |
title_full_unstemmed |
Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor |
title_sort |
Effects of Measurements Conditions on an Extended-Gate FET used as pH sensor |
author |
Fernandes,Jessica Colnaghi |
author_facet |
Fernandes,Jessica Colnaghi Nascimento,Raphael Aparecido Sanches Mulato,Marcelo |
author_role |
author |
author2 |
Nascimento,Raphael Aparecido Sanches Mulato,Marcelo |
author2_role |
author author |
dc.contributor.author.fl_str_mv |
Fernandes,Jessica Colnaghi Nascimento,Raphael Aparecido Sanches Mulato,Marcelo |
dc.subject.por.fl_str_mv |
Extended-gate FET Fluorine-doped tin oxide pH sensor Temperature dependence Time evolution |
topic |
Extended-gate FET Fluorine-doped tin oxide pH sensor Temperature dependence Time evolution |
description |
Fluorine-doped tin oxide (SnO2:F) was investigate as the sensitive part of a pH sensor in the extended-gate field effect transistors (EGFET) device, which provided a linear response for pH range from 2 to 12; the sensitivity was 37 mV.pH-1 for experiments performed in absence of light. Neutral pH, leads to a transistor’s electric current remained practically constant, suggesting that pH 7 correspond to the isoelectric point of the SnO2:F samples. For acid and alkaline pH, the power law varied along time and stabilized at about 10 min. UV-vis light did not alter the results. The transistor’s electric current increased with the operating temperature increases. Once that small change in the operating conditions can alter the results, the physical mechanisms underlying the sensing process must be clearly understood. It is essential to monitor transient response and measurements conditions. |
publishDate |
2016 |
dc.date.none.fl_str_mv |
2016-02-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000100267 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392016000100267 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/1980-5373-MR-2015-0248 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
ABM, ABC, ABPol |
publisher.none.fl_str_mv |
ABM, ABC, ABPol |
dc.source.none.fl_str_mv |
Materials Research v.19 n.1 2016 reponame:Materials research (São Carlos. Online) instname:Universidade Federal de São Carlos (UFSCAR) instacron:ABM ABC ABPOL |
instname_str |
Universidade Federal de São Carlos (UFSCAR) |
instacron_str |
ABM ABC ABPOL |
institution |
ABM ABC ABPOL |
reponame_str |
Materials research (São Carlos. Online) |
collection |
Materials research (São Carlos. Online) |
repository.name.fl_str_mv |
Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR) |
repository.mail.fl_str_mv |
dedz@power.ufscar.br |
_version_ |
1754212667849965568 |