Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes
Autor(a) principal: | |
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Data de Publicação: | 2008 |
Outros Autores: | , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Institucional da UFBA |
Texto Completo: | http://www.repositorio.ufba.br/ri/handle/ri/5995 |
Resumo: | Acesso restrito: Texto completo. p. 870-873 |
id |
UFBA-2_d43ba7ac00b62f7c23504a455d27e3f0 |
---|---|
oai_identifier_str |
oai:repositorio.ufba.br:ri/5995 |
network_acronym_str |
UFBA-2 |
network_name_str |
Repositório Institucional da UFBA |
repository_id_str |
1932 |
spelling |
Macedo, Andréia G.Vasconcelos, Elder A. deValaski, RogérioMuchenski, FábioSilva Jr, Eronides F. daSilva, Antônio F. daRoman, Lucimara S.Macedo, Andréia G.Vasconcelos, Elder A. deValaski, RogérioMuchenski, FábioSilva Jr, Eronides F. daSilva, Antônio F. daRoman, Lucimara S.2012-05-30T17:29:06Z20080040-6090http://www.repositorio.ufba.br/ri/handle/ri/5995v. 517, n. 2Acesso restrito: Texto completo. p. 870-873We investigated the electrical and optical properties of porous Si (PS) light-emitting diodes using fluorinated tin oxide (FTO) as transparent electrodes. At high forward bias, the current–voltage characteristic is space charge limited. At low forward bias, it follows an exponential law. Whereas the electroluminescence (EL) in devices with non-fluorinated indium–tin oxide electrodes degrades in few minutes, EL intensity in devices with FTO electrodes shows little degradation after 1300 min of operation. This result indicates that the well known beneficial effects of fluorinated species in the improvement of resistance to irradiation and carrier injection degradation in metal–oxide–semiconductor devices might be also observed in PS devices.Submitted by JURANDI DE SOUZA SILVA (jssufba@hotmail.com) on 2012-05-30T17:29:06Z No. of bitstreams: 1 __ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf: 271686 bytes, checksum: 1841299c374097092889f5a7c42eadf7 (MD5)Made available in DSpace on 2012-05-30T17:29:06Z (GMT). No. of bitstreams: 1 __ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf: 271686 bytes, checksum: 1841299c374097092889f5a7c42eadf7 (MD5) Previous issue date: 2008http://dx.doi.org/10.1016/j.tsf.2008.07.007reponame:Repositório Institucional da UFBAinstname:Universidade Federal da Bahia (UFBA)instacron:UFBAPorous siliconPhotoluminescenceFluorine doped tin oxideLight-emitting diodesEnhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodesTHIN SOLID FILMSinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/article10000-01-01enginfo:eu-repo/semantics/openAccessORIGINAL__ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf__ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdfapplication/pdf271686https://repositorio.ufba.br/bitstream/ri/5995/1/__ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf1841299c374097092889f5a7c42eadf7MD51LICENSElicense.txtlicense.txttext/plain1762https://repositorio.ufba.br/bitstream/ri/5995/2/license.txt1b89a9a0548218172d7c829f87a0eab9MD52TEXT__ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf.txt__ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf.txtExtracted texttext/plain20386https://repositorio.ufba.br/bitstream/ri/5995/3/__ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf.txt155d5d53b71e927493025c544228cef8MD53ri/59952022-07-05 14:03:48.314oai:repositorio.ufba.br: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Repositório InstitucionalPUBhttp://192.188.11.11:8080/oai/requestopendoar:19322022-07-05T17:03:48Repositório Institucional da UFBA - Universidade Federal da Bahia (UFBA)false |
dc.title.pt_BR.fl_str_mv |
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes |
dc.title.alternative.pt_BR.fl_str_mv |
THIN SOLID FILMS |
title |
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes |
spellingShingle |
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes Macedo, Andréia G. Porous silicon Photoluminescence Fluorine doped tin oxide Light-emitting diodes |
title_short |
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes |
title_full |
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes |
title_fullStr |
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes |
title_full_unstemmed |
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes |
title_sort |
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes |
author |
Macedo, Andréia G. |
author_facet |
Macedo, Andréia G. Vasconcelos, Elder A. de Valaski, Rogério Muchenski, Fábio Silva Jr, Eronides F. da Silva, Antônio F. da Roman, Lucimara S. |
author_role |
author |
author2 |
Vasconcelos, Elder A. de Valaski, Rogério Muchenski, Fábio Silva Jr, Eronides F. da Silva, Antônio F. da Roman, Lucimara S. |
author2_role |
author author author author author author |
dc.contributor.author.fl_str_mv |
Macedo, Andréia G. Vasconcelos, Elder A. de Valaski, Rogério Muchenski, Fábio Silva Jr, Eronides F. da Silva, Antônio F. da Roman, Lucimara S. Macedo, Andréia G. Vasconcelos, Elder A. de Valaski, Rogério Muchenski, Fábio Silva Jr, Eronides F. da Silva, Antônio F. da Roman, Lucimara S. |
dc.subject.por.fl_str_mv |
Porous silicon Photoluminescence Fluorine doped tin oxide Light-emitting diodes |
topic |
Porous silicon Photoluminescence Fluorine doped tin oxide Light-emitting diodes |
description |
Acesso restrito: Texto completo. p. 870-873 |
publishDate |
2008 |
dc.date.issued.fl_str_mv |
2008 |
dc.date.accessioned.fl_str_mv |
2012-05-30T17:29:06Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://www.repositorio.ufba.br/ri/handle/ri/5995 |
dc.identifier.issn.none.fl_str_mv |
0040-6090 |
dc.identifier.number.pt_BR.fl_str_mv |
v. 517, n. 2 |
identifier_str_mv |
0040-6090 v. 517, n. 2 |
url |
http://www.repositorio.ufba.br/ri/handle/ri/5995 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.source.pt_BR.fl_str_mv |
http://dx.doi.org/10.1016/j.tsf.2008.07.007 |
dc.source.none.fl_str_mv |
reponame:Repositório Institucional da UFBA instname:Universidade Federal da Bahia (UFBA) instacron:UFBA |
instname_str |
Universidade Federal da Bahia (UFBA) |
instacron_str |
UFBA |
institution |
UFBA |
reponame_str |
Repositório Institucional da UFBA |
collection |
Repositório Institucional da UFBA |
bitstream.url.fl_str_mv |
https://repositorio.ufba.br/bitstream/ri/5995/1/__ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf https://repositorio.ufba.br/bitstream/ri/5995/2/license.txt https://repositorio.ufba.br/bitstream/ri/5995/3/__ac.els-cdn.com_S004060...f59a4b8a28017c678978c4bd20746.pdf.txt |
bitstream.checksum.fl_str_mv |
1841299c374097092889f5a7c42eadf7 1b89a9a0548218172d7c829f87a0eab9 155d5d53b71e927493025c544228cef8 |
bitstream.checksumAlgorithm.fl_str_mv |
MD5 MD5 MD5 |
repository.name.fl_str_mv |
Repositório Institucional da UFBA - Universidade Federal da Bahia (UFBA) |
repository.mail.fl_str_mv |
|
_version_ |
1808459400047755264 |