Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films

Detalhes bibliográficos
Autor(a) principal: Tezel,Fatma Meydaneri
Data de Publicação: 2017
Outros Autores: Kariper,İshak Afşin
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Materials research (São Carlos. Online)
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000601563
Resumo: AgI thin films were grown on amorphous commercial glass substrates with chemical bath deposition (CBD) at different pH values (2, 3, 4, 5, 6), 6 hours deposition time and 60 °C. The structure of the nanocrystals was characterized by X-ray diffraction (XRD). The ratio of Ag+ and I- ions changed the crystalline structures. The presence of the Ag+ ions produces the γ-phase of AgI and excess of iodine concentration produces β-phase of AgI. The pH: 4 was like a transition pH for these phases. The number of crystallites per unit area has maximum value at pH: 5, as the structure is re-crystallization to hexagonal phase. Also, the thicknesses of produced thin films were decreased with increased pH values. Therefore, transmission, reflection, extinction coefficients and refractive index of the materials were affected by thicknesses, and calculated to be 32, 35, 3, 11, 9 (%) - 27, 25, 61, 45, 49 (%) - 0.036, 0.032, 0.067, 0.107, 0.075 and 3.21, 3.02, 5.16, 8.35, 5.70 in 550 nm at pH: 2-3-4-5-6 values, respectively. The exciton peaks of AgI were observed at between 320 and 420 nm. Surface properties were investigated by using scanning electron microscopy (SEM).
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spelling Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin FilmsAgIcrystal growthpH effectchemical bath depositionoptical and surface propertiesAgI thin films were grown on amorphous commercial glass substrates with chemical bath deposition (CBD) at different pH values (2, 3, 4, 5, 6), 6 hours deposition time and 60 °C. The structure of the nanocrystals was characterized by X-ray diffraction (XRD). The ratio of Ag+ and I- ions changed the crystalline structures. The presence of the Ag+ ions produces the γ-phase of AgI and excess of iodine concentration produces β-phase of AgI. The pH: 4 was like a transition pH for these phases. The number of crystallites per unit area has maximum value at pH: 5, as the structure is re-crystallization to hexagonal phase. Also, the thicknesses of produced thin films were decreased with increased pH values. Therefore, transmission, reflection, extinction coefficients and refractive index of the materials were affected by thicknesses, and calculated to be 32, 35, 3, 11, 9 (%) - 27, 25, 61, 45, 49 (%) - 0.036, 0.032, 0.067, 0.107, 0.075 and 3.21, 3.02, 5.16, 8.35, 5.70 in 550 nm at pH: 2-3-4-5-6 values, respectively. The exciton peaks of AgI were observed at between 320 and 420 nm. Surface properties were investigated by using scanning electron microscopy (SEM).ABM, ABC, ABPol2017-12-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000601563Materials Research v.20 n.6 2017reponame:Materials research (São Carlos. Online)instname:Universidade Federal de São Carlos (UFSCAR)instacron:ABM ABC ABPOL10.1590/1980-5373-mr-2017-0319info:eu-repo/semantics/openAccessTezel,Fatma MeydaneriKariper,İshak Afşineng2018-05-18T00:00:00Zoai:scielo:S1516-14392017000601563Revistahttp://www.scielo.br/mrPUBhttps://old.scielo.br/oai/scielo-oai.phpdedz@power.ufscar.br1980-53731516-1439opendoar:2018-05-18T00:00Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR)false
dc.title.none.fl_str_mv Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films
title Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films
spellingShingle Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films
Tezel,Fatma Meydaneri
AgI
crystal growth
pH effect
chemical bath deposition
optical and surface properties
title_short Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films
title_full Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films
title_fullStr Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films
title_full_unstemmed Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films
title_sort Effect of pH on Optic and Structural Characterization of Chemical Deposited AgI Thin Films
author Tezel,Fatma Meydaneri
author_facet Tezel,Fatma Meydaneri
Kariper,İshak Afşin
author_role author
author2 Kariper,İshak Afşin
author2_role author
dc.contributor.author.fl_str_mv Tezel,Fatma Meydaneri
Kariper,İshak Afşin
dc.subject.por.fl_str_mv AgI
crystal growth
pH effect
chemical bath deposition
optical and surface properties
topic AgI
crystal growth
pH effect
chemical bath deposition
optical and surface properties
description AgI thin films were grown on amorphous commercial glass substrates with chemical bath deposition (CBD) at different pH values (2, 3, 4, 5, 6), 6 hours deposition time and 60 °C. The structure of the nanocrystals was characterized by X-ray diffraction (XRD). The ratio of Ag+ and I- ions changed the crystalline structures. The presence of the Ag+ ions produces the γ-phase of AgI and excess of iodine concentration produces β-phase of AgI. The pH: 4 was like a transition pH for these phases. The number of crystallites per unit area has maximum value at pH: 5, as the structure is re-crystallization to hexagonal phase. Also, the thicknesses of produced thin films were decreased with increased pH values. Therefore, transmission, reflection, extinction coefficients and refractive index of the materials were affected by thicknesses, and calculated to be 32, 35, 3, 11, 9 (%) - 27, 25, 61, 45, 49 (%) - 0.036, 0.032, 0.067, 0.107, 0.075 and 3.21, 3.02, 5.16, 8.35, 5.70 in 550 nm at pH: 2-3-4-5-6 values, respectively. The exciton peaks of AgI were observed at between 320 and 420 nm. Surface properties were investigated by using scanning electron microscopy (SEM).
publishDate 2017
dc.date.none.fl_str_mv 2017-12-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000601563
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000601563
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/1980-5373-mr-2017-0319
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv ABM, ABC, ABPol
publisher.none.fl_str_mv ABM, ABC, ABPol
dc.source.none.fl_str_mv Materials Research v.20 n.6 2017
reponame:Materials research (São Carlos. Online)
instname:Universidade Federal de São Carlos (UFSCAR)
instacron:ABM ABC ABPOL
instname_str Universidade Federal de São Carlos (UFSCAR)
instacron_str ABM ABC ABPOL
institution ABM ABC ABPOL
reponame_str Materials research (São Carlos. Online)
collection Materials research (São Carlos. Online)
repository.name.fl_str_mv Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR)
repository.mail.fl_str_mv dedz@power.ufscar.br
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