Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films
Autor(a) principal: | |
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Data de Publicação: | 2017 |
Outros Autores: | , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Materials research (São Carlos. Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000100062 |
Resumo: | Cobalt sulphide (CoS) thin films were synthesized using the Chemical Bath Deposition (CBD) technique. X-ray diffraction (XRD) analysis was used to study the structure and the crystallite size of CoS thin film. Scanning Electron Microscope (SEM) studies reveal the surface morphology of these films. The optical properties of the CoS thin films were determined using UV-Visible absorption spectrum. The optical band gap of the thin films was found to be 1.6 eV. Optical constants such as the refractive index, the extinction coefficient and the electric susceptibility were determined. The dielectric studies were carried out at different frequencies and at different temperatures for the prepared CoS thin films. In addition, the plasma energy of the valence electron, Penn gap or average energy gap, the Fermi energy and electronic polarizability of the thin films were determined. The AC electrical conductivity measurement was also carried out for the thin films. The activation energy was determined by using DC electrical conductivity measurement. |
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Materials research (São Carlos. Online) |
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Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin FilmsCoSCBDXRDSEMDielectric studiesAC and DC electrical conductivity measurementCobalt sulphide (CoS) thin films were synthesized using the Chemical Bath Deposition (CBD) technique. X-ray diffraction (XRD) analysis was used to study the structure and the crystallite size of CoS thin film. Scanning Electron Microscope (SEM) studies reveal the surface morphology of these films. The optical properties of the CoS thin films were determined using UV-Visible absorption spectrum. The optical band gap of the thin films was found to be 1.6 eV. Optical constants such as the refractive index, the extinction coefficient and the electric susceptibility were determined. The dielectric studies were carried out at different frequencies and at different temperatures for the prepared CoS thin films. In addition, the plasma energy of the valence electron, Penn gap or average energy gap, the Fermi energy and electronic polarizability of the thin films were determined. The AC electrical conductivity measurement was also carried out for the thin films. The activation energy was determined by using DC electrical conductivity measurement.ABM, ABC, ABPol2017-02-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000100062Materials Research v.20 n.1 2017reponame:Materials research (São Carlos. Online)instname:Universidade Federal de São Carlos (UFSCAR)instacron:ABM ABC ABPOL10.1590/1980-5373-mr-2016-0441info:eu-repo/semantics/openAccessGovindasamy,GeethaMurugasen,PriyaSagadevan,Suresheng2017-03-22T00:00:00Zoai:scielo:S1516-14392017000100062Revistahttp://www.scielo.br/mrPUBhttps://old.scielo.br/oai/scielo-oai.phpdedz@power.ufscar.br1980-53731516-1439opendoar:2017-03-22T00:00Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR)false |
dc.title.none.fl_str_mv |
Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films |
title |
Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films |
spellingShingle |
Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films Govindasamy,Geetha CoS CBD XRD SEM Dielectric studies AC and DC electrical conductivity measurement |
title_short |
Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films |
title_full |
Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films |
title_fullStr |
Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films |
title_full_unstemmed |
Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films |
title_sort |
Optical and Electrical Properties of Chemical Bath Deposited Cobalt Sulphide Thin Films |
author |
Govindasamy,Geetha |
author_facet |
Govindasamy,Geetha Murugasen,Priya Sagadevan,Suresh |
author_role |
author |
author2 |
Murugasen,Priya Sagadevan,Suresh |
author2_role |
author author |
dc.contributor.author.fl_str_mv |
Govindasamy,Geetha Murugasen,Priya Sagadevan,Suresh |
dc.subject.por.fl_str_mv |
CoS CBD XRD SEM Dielectric studies AC and DC electrical conductivity measurement |
topic |
CoS CBD XRD SEM Dielectric studies AC and DC electrical conductivity measurement |
description |
Cobalt sulphide (CoS) thin films were synthesized using the Chemical Bath Deposition (CBD) technique. X-ray diffraction (XRD) analysis was used to study the structure and the crystallite size of CoS thin film. Scanning Electron Microscope (SEM) studies reveal the surface morphology of these films. The optical properties of the CoS thin films were determined using UV-Visible absorption spectrum. The optical band gap of the thin films was found to be 1.6 eV. Optical constants such as the refractive index, the extinction coefficient and the electric susceptibility were determined. The dielectric studies were carried out at different frequencies and at different temperatures for the prepared CoS thin films. In addition, the plasma energy of the valence electron, Penn gap or average energy gap, the Fermi energy and electronic polarizability of the thin films were determined. The AC electrical conductivity measurement was also carried out for the thin films. The activation energy was determined by using DC electrical conductivity measurement. |
publishDate |
2017 |
dc.date.none.fl_str_mv |
2017-02-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000100062 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000100062 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/1980-5373-mr-2016-0441 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
ABM, ABC, ABPol |
publisher.none.fl_str_mv |
ABM, ABC, ABPol |
dc.source.none.fl_str_mv |
Materials Research v.20 n.1 2017 reponame:Materials research (São Carlos. Online) instname:Universidade Federal de São Carlos (UFSCAR) instacron:ABM ABC ABPOL |
instname_str |
Universidade Federal de São Carlos (UFSCAR) |
instacron_str |
ABM ABC ABPOL |
institution |
ABM ABC ABPOL |
reponame_str |
Materials research (São Carlos. Online) |
collection |
Materials research (São Carlos. Online) |
repository.name.fl_str_mv |
Materials research (São Carlos. Online) - Universidade Federal de São Carlos (UFSCAR) |
repository.mail.fl_str_mv |
dedz@power.ufscar.br |
_version_ |
1754212668809412608 |