A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns

Detalhes bibliográficos
Autor(a) principal: DIOGO JOSE COSTA ALVES
Data de Publicação: 2009
Tipo de documento: Dissertação
Título da fonte: Portal de Dados Abertos da CAPES
id BRCRIS_004bcbd6bc435b90305dc025c286ff7a
network_acronym_str CAPES
network_name_str Portal de Dados Abertos da CAPES
dc.title.pt-BR.fl_str_mv A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
title A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
spellingShingle A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
DIOGO JOSE COSTA ALVES
title_short A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
title_full A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
title_fullStr A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
title_full_unstemmed A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
title_sort A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns
publishDate 2009
format masterThesis
author_role author
author DIOGO JOSE COSTA ALVES
author_facet DIOGO JOSE COSTA ALVES
dc.contributor.authorLattes.fl_str_mv http://lattes.cnpq.br/3735816017129951
dc.contributor.advisor1.fl_str_mv Edna Natividade Silva Barros
dc.contributor.advisor1Lattes.fl_str_mv http://lattes.cnpq.br/6291354144339437
dc.publisher.none.fl_str_mv UNIVERSIDADE FEDERAL DE PERNAMBUCO
publisher.none.fl_str_mv UNIVERSIDADE FEDERAL DE PERNAMBUCO
instname_str UNIVERSIDADE FEDERAL DE PERNAMBUCO
reponame_str Portal de Dados Abertos da CAPES
collection Portal de Dados Abertos da CAPES
spelling CAPESPortal de Dados Abertos da CAPESA LBIST Architecture that reuses Manufacturing Compressed Scan Test PatternsA LBIST Architecture that reuses Manufacturing Compressed Scan Test PatternsA LBIST Architecture that reuses Manufacturing Compressed Scan Test PatternsA LBIST Architecture that reuses Manufacturing Compressed Scan Test PatternsA LBIST Architecture that reuses Manufacturing Compressed Scan Test PatternsA LBIST Architecture that reuses Manufacturing Compressed Scan Test PatternsA LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns2009masterThesisauthorDIOGO JOSE COSTA ALVEShttp://lattes.cnpq.br/3735816017129951Edna Natividade Silva Barroshttp://lattes.cnpq.br/6291354144339437UNIVERSIDADE FEDERAL DE PERNAMBUCOUNIVERSIDADE FEDERAL DE PERNAMBUCOUNIVERSIDADE FEDERAL DE PERNAMBUCOPortal de Dados Abertos da CAPESPortal de Dados Abertos da CAPES
identifier_str_mv ALVES, DIOGO JOSE COSTA. A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns. 2009. Tese.
dc.identifier.citation.fl_str_mv ALVES, DIOGO JOSE COSTA. A LBIST Architecture that reuses Manufacturing Compressed Scan Test Patterns. 2009. Tese.
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