Radar absorbing materials based on titanium thin film obtained by sputtering technique
Autor(a) principal: | |
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Data de Publicação: | 2011 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Journal of Aerospace Technology and Management (Online) |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462011000300279 |
Resumo: | Abstract: Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties. |
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Radar absorbing materials based on titanium thin film obtained by sputtering techniqueRadar absorbing materialMagnetron sputteringThin filmTitaniumAbstract: Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties.Departamento de Ciência e Tecnologia Aeroespacial2011-12-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462011000300279Journal of Aerospace Technology and Management v.3 n.3 2011reponame:Journal of Aerospace Technology and Management (Online)instname:Departamento de Ciência e Tecnologia Aeroespacial (DCTA)instacron:DCTA10.5028/jatm.2011.03030511info:eu-repo/semantics/openAccessSoethe,Viviane LilianNohara,Evandro LuisFontana,Luis CésarRezende,Mirabel Cerqueiraeng2017-05-18T00:00:00Zoai:scielo:S2175-91462011000300279Revistahttp://www.jatm.com.br/ONGhttps://old.scielo.br/oai/scielo-oai.php||secretary@jatm.com.br2175-91461984-9648opendoar:2017-05-18T00:00Journal of Aerospace Technology and Management (Online) - Departamento de Ciência e Tecnologia Aeroespacial (DCTA)false |
dc.title.none.fl_str_mv |
Radar absorbing materials based on titanium thin film obtained by sputtering technique |
title |
Radar absorbing materials based on titanium thin film obtained by sputtering technique |
spellingShingle |
Radar absorbing materials based on titanium thin film obtained by sputtering technique Soethe,Viviane Lilian Radar absorbing material Magnetron sputtering Thin film Titanium |
title_short |
Radar absorbing materials based on titanium thin film obtained by sputtering technique |
title_full |
Radar absorbing materials based on titanium thin film obtained by sputtering technique |
title_fullStr |
Radar absorbing materials based on titanium thin film obtained by sputtering technique |
title_full_unstemmed |
Radar absorbing materials based on titanium thin film obtained by sputtering technique |
title_sort |
Radar absorbing materials based on titanium thin film obtained by sputtering technique |
author |
Soethe,Viviane Lilian |
author_facet |
Soethe,Viviane Lilian Nohara,Evandro Luis Fontana,Luis César Rezende,Mirabel Cerqueira |
author_role |
author |
author2 |
Nohara,Evandro Luis Fontana,Luis César Rezende,Mirabel Cerqueira |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Soethe,Viviane Lilian Nohara,Evandro Luis Fontana,Luis César Rezende,Mirabel Cerqueira |
dc.subject.por.fl_str_mv |
Radar absorbing material Magnetron sputtering Thin film Titanium |
topic |
Radar absorbing material Magnetron sputtering Thin film Titanium |
description |
Abstract: Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties. |
publishDate |
2011 |
dc.date.none.fl_str_mv |
2011-12-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462011000300279 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462011000300279 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.5028/jatm.2011.03030511 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Departamento de Ciência e Tecnologia Aeroespacial |
publisher.none.fl_str_mv |
Departamento de Ciência e Tecnologia Aeroespacial |
dc.source.none.fl_str_mv |
Journal of Aerospace Technology and Management v.3 n.3 2011 reponame:Journal of Aerospace Technology and Management (Online) instname:Departamento de Ciência e Tecnologia Aeroespacial (DCTA) instacron:DCTA |
instname_str |
Departamento de Ciência e Tecnologia Aeroespacial (DCTA) |
instacron_str |
DCTA |
institution |
DCTA |
reponame_str |
Journal of Aerospace Technology and Management (Online) |
collection |
Journal of Aerospace Technology and Management (Online) |
repository.name.fl_str_mv |
Journal of Aerospace Technology and Management (Online) - Departamento de Ciência e Tecnologia Aeroespacial (DCTA) |
repository.mail.fl_str_mv |
||secretary@jatm.com.br |
_version_ |
1754732530477563904 |