Radar absorbing materials based on titanium thin film obtained by sputtering technique

Detalhes bibliográficos
Autor(a) principal: Soethe,Viviane Lilian
Data de Publicação: 2011
Outros Autores: Nohara,Evandro Luis, Fontana,Luis César, Rezende,Mirabel Cerqueira
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Journal of Aerospace Technology and Management (Online)
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462011000300279
Resumo: Abstract: Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties.
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spelling Radar absorbing materials based on titanium thin film obtained by sputtering techniqueRadar absorbing materialMagnetron sputteringThin filmTitaniumAbstract: Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties.Departamento de Ciência e Tecnologia Aeroespacial2011-12-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462011000300279Journal of Aerospace Technology and Management v.3 n.3 2011reponame:Journal of Aerospace Technology and Management (Online)instname:Departamento de Ciência e Tecnologia Aeroespacial (DCTA)instacron:DCTA10.5028/jatm.2011.03030511info:eu-repo/semantics/openAccessSoethe,Viviane LilianNohara,Evandro LuisFontana,Luis CésarRezende,Mirabel Cerqueiraeng2017-05-18T00:00:00Zoai:scielo:S2175-91462011000300279Revistahttp://www.jatm.com.br/ONGhttps://old.scielo.br/oai/scielo-oai.php||secretary@jatm.com.br2175-91461984-9648opendoar:2017-05-18T00:00Journal of Aerospace Technology and Management (Online) - Departamento de Ciência e Tecnologia Aeroespacial (DCTA)false
dc.title.none.fl_str_mv Radar absorbing materials based on titanium thin film obtained by sputtering technique
title Radar absorbing materials based on titanium thin film obtained by sputtering technique
spellingShingle Radar absorbing materials based on titanium thin film obtained by sputtering technique
Soethe,Viviane Lilian
Radar absorbing material
Magnetron sputtering
Thin film
Titanium
title_short Radar absorbing materials based on titanium thin film obtained by sputtering technique
title_full Radar absorbing materials based on titanium thin film obtained by sputtering technique
title_fullStr Radar absorbing materials based on titanium thin film obtained by sputtering technique
title_full_unstemmed Radar absorbing materials based on titanium thin film obtained by sputtering technique
title_sort Radar absorbing materials based on titanium thin film obtained by sputtering technique
author Soethe,Viviane Lilian
author_facet Soethe,Viviane Lilian
Nohara,Evandro Luis
Fontana,Luis César
Rezende,Mirabel Cerqueira
author_role author
author2 Nohara,Evandro Luis
Fontana,Luis César
Rezende,Mirabel Cerqueira
author2_role author
author
author
dc.contributor.author.fl_str_mv Soethe,Viviane Lilian
Nohara,Evandro Luis
Fontana,Luis César
Rezende,Mirabel Cerqueira
dc.subject.por.fl_str_mv Radar absorbing material
Magnetron sputtering
Thin film
Titanium
topic Radar absorbing material
Magnetron sputtering
Thin film
Titanium
description Abstract: Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties.
publishDate 2011
dc.date.none.fl_str_mv 2011-12-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462011000300279
url http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2175-91462011000300279
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.5028/jatm.2011.03030511
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Departamento de Ciência e Tecnologia Aeroespacial
publisher.none.fl_str_mv Departamento de Ciência e Tecnologia Aeroespacial
dc.source.none.fl_str_mv Journal of Aerospace Technology and Management v.3 n.3 2011
reponame:Journal of Aerospace Technology and Management (Online)
instname:Departamento de Ciência e Tecnologia Aeroespacial (DCTA)
instacron:DCTA
instname_str Departamento de Ciência e Tecnologia Aeroespacial (DCTA)
instacron_str DCTA
institution DCTA
reponame_str Journal of Aerospace Technology and Management (Online)
collection Journal of Aerospace Technology and Management (Online)
repository.name.fl_str_mv Journal of Aerospace Technology and Management (Online) - Departamento de Ciência e Tecnologia Aeroespacial (DCTA)
repository.mail.fl_str_mv ||secretary@jatm.com.br
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