Multiple diffraction simulation in the study of epitaxial layers

Detalhes bibliográficos
Autor(a) principal: COSTA, C.A.B.S.
Data de Publicação: 2014
Outros Autores: CARDOSO, L.P., MAZZOCCHI, V.L., PARENTE, C.B.R., INTERNATIONAL CONFERENCE ON THE SCIENCE AND TECHNOLOGY OF DEFECT CONTROL IN SEMICONDUCTORS
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/14855
id IPEN_79a388ece92a8a23fdfca6013365b99c
oai_identifier_str oai:repositorio.ipen.br:123456789/14855
network_acronym_str IPEN
network_name_str Repositório Institucional do IPEN
repository_id_str 4510
spelling 2014-11-17T17:39:07Z2014-11-18T17:47:47Z2015-04-02T01:15:24Z2014-11-17T17:39:07Z2014-11-18T17:47:47Z2015-04-02T01:15:24ZSept. 17-22, 1989http://repositorio.ipen.br/handle/123456789/14855Made available in DSpace on 2014-11-17T17:39:07Z (GMT). No. of bitstreams: 0Made available in DSpace on 2014-11-18T17:47:47Z (GMT). No. of bitstreams: 0Made available in DSpace on 2015-04-02T01:15:24Z (GMT). No. of bitstreams: 0semiconductor materialslayersepitaxyx-ray diffractionsimulationMultiple diffraction simulation in the study of epitaxial layersinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectIYokohama, JapanCOSTA, C.A.B.S.CARDOSO, L.P.MAZZOCCHI, V.L.PARENTE, C.B.R.INTERNATIONAL CONFERENCE ON THE SCIENCE AND TECHNOLOGY OF DEFECT CONTROL IN SEMICONDUCTORSinfo:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN038981989MAZZOCCHI, V.L.PARENTE, C.B.R.91-12-1360052370COSTA, C.A.B.S.:-1:-1:SCARDOSO, L.P.:3600:-1:NMAZZOCCHI, V.L.:52:-1:NPARENTE, C.B.R.:370:-1:NORIGINAL03898.pdf03898.pdfapplication/pdf1740068http://repositorio.ipen.br/bitstream/123456789/14855/1/03898.pdf2129552bee272f9e1b91f6f61f941ac7MD51123456789/148552016-03-14 18:33:41.793oai:repositorio.ipen.br:123456789/14855Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102016-03-14T18:33:41Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Multiple diffraction simulation in the study of epitaxial layers
title Multiple diffraction simulation in the study of epitaxial layers
spellingShingle Multiple diffraction simulation in the study of epitaxial layers
COSTA, C.A.B.S.
semiconductor materials
layers
epitaxy
x-ray diffraction
simulation
title_short Multiple diffraction simulation in the study of epitaxial layers
title_full Multiple diffraction simulation in the study of epitaxial layers
title_fullStr Multiple diffraction simulation in the study of epitaxial layers
title_full_unstemmed Multiple diffraction simulation in the study of epitaxial layers
title_sort Multiple diffraction simulation in the study of epitaxial layers
author COSTA, C.A.B.S.
author_facet COSTA, C.A.B.S.
CARDOSO, L.P.
MAZZOCCHI, V.L.
PARENTE, C.B.R.
INTERNATIONAL CONFERENCE ON THE SCIENCE AND TECHNOLOGY OF DEFECT CONTROL IN SEMICONDUCTORS
author_role author
author2 CARDOSO, L.P.
MAZZOCCHI, V.L.
PARENTE, C.B.R.
INTERNATIONAL CONFERENCE ON THE SCIENCE AND TECHNOLOGY OF DEFECT CONTROL IN SEMICONDUCTORS
author2_role author
author
author
author
dc.contributor.author.fl_str_mv COSTA, C.A.B.S.
CARDOSO, L.P.
MAZZOCCHI, V.L.
PARENTE, C.B.R.
INTERNATIONAL CONFERENCE ON THE SCIENCE AND TECHNOLOGY OF DEFECT CONTROL IN SEMICONDUCTORS
dc.subject.por.fl_str_mv semiconductor materials
layers
epitaxy
x-ray diffraction
simulation
topic semiconductor materials
layers
epitaxy
x-ray diffraction
simulation
publishDate 2014
dc.date.evento.pt_BR.fl_str_mv Sept. 17-22, 1989
dc.date.accessioned.fl_str_mv 2014-11-17T17:39:07Z
2014-11-18T17:47:47Z
2015-04-02T01:15:24Z
dc.date.available.fl_str_mv 2014-11-17T17:39:07Z
2014-11-18T17:47:47Z
2015-04-02T01:15:24Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://repositorio.ipen.br/handle/123456789/14855
url http://repositorio.ipen.br/handle/123456789/14855
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.coverage.pt_BR.fl_str_mv I
dc.source.none.fl_str_mv reponame:Repositório Institucional do IPEN
instname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron:IPEN
instname_str Instituto de Pesquisas Energéticas e Nucleares (IPEN)
instacron_str IPEN
institution IPEN
reponame_str Repositório Institucional do IPEN
collection Repositório Institucional do IPEN
bitstream.url.fl_str_mv http://repositorio.ipen.br/bitstream/123456789/14855/1/03898.pdf
bitstream.checksum.fl_str_mv 2129552bee272f9e1b91f6f61f941ac7
bitstream.checksumAlgorithm.fl_str_mv MD5
repository.name.fl_str_mv Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)
repository.mail.fl_str_mv bibl@ipen.br
_version_ 1767254216831664128

Registros relacionados