InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan

Detalhes bibliográficos
Autor(a) principal: Cardoso, Lisandro P.
Data de Publicação: 2008
Outros Autores: Menezes, Alan S. de, Santos, Adenilson O. dos, Bortoleto, Jose R. [UNESP], Cotta, Monica A., Morelhao, Sergio L.
Tipo de documento: Artigo de conferência
Idioma: eng
Título da fonte: Repositório Institucional da UNESP
Texto Completo: http://dx.doi.org/10.1107/S0108767308080987
http://hdl.handle.net/11449/197308
Resumo: Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
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spelling InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scansemiconductor epitaxyX-ray multiple diffractionstrain determinationCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Univ Estadual Campinas, Inst Fis Gleb Wataghin, Dept Fis Aplicada, BR-13083970 Campinas, SP, BrazilUNESP, ECA, BR-18087180 Sorocaba, SP, BrazilUniv Sao Paulo, Inst Fis, BR-05508090 Sao Paulo, SP, BrazilUNESP, ECA, BR-18087180 Sorocaba, SP, BrazilInt Union CrystallographyUniversidade Estadual de Campinas (UNICAMP)Universidade Estadual Paulista (Unesp)Universidade de São Paulo (USP)Cardoso, Lisandro P.Menezes, Alan S. deSantos, Adenilson O. dosBortoleto, Jose R. [UNESP]Cotta, Monica A.Morelhao, Sergio L.2020-12-10T20:12:48Z2020-12-10T20:12:48Z2008-01-01info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectC592-C592http://dx.doi.org/10.1107/S0108767308080987Acta Crystallographica A-foundation And Advances. Chester: Int Union Crystallography, v. 64, p. C592-C592, 2008.2053-2733http://hdl.handle.net/11449/19730810.1107/S0108767308080987WOS:000480420705297Web of Sciencereponame:Repositório Institucional da UNESPinstname:Universidade Estadual Paulista (UNESP)instacron:UNESPengActa Crystallographica A-foundation And Advancesinfo:eu-repo/semantics/openAccess2021-10-23T12:39:34Zoai:repositorio.unesp.br:11449/197308Repositório InstitucionalPUBhttp://repositorio.unesp.br/oai/requestopendoar:29462024-08-05T19:48:45.090907Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)false
dc.title.none.fl_str_mv InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
title InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
spellingShingle InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
Cardoso, Lisandro P.
semiconductor epitaxy
X-ray multiple diffraction
strain determination
title_short InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
title_full InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
title_fullStr InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
title_full_unstemmed InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
title_sort InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
author Cardoso, Lisandro P.
author_facet Cardoso, Lisandro P.
Menezes, Alan S. de
Santos, Adenilson O. dos
Bortoleto, Jose R. [UNESP]
Cotta, Monica A.
Morelhao, Sergio L.
author_role author
author2 Menezes, Alan S. de
Santos, Adenilson O. dos
Bortoleto, Jose R. [UNESP]
Cotta, Monica A.
Morelhao, Sergio L.
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade Estadual de Campinas (UNICAMP)
Universidade Estadual Paulista (Unesp)
Universidade de São Paulo (USP)
dc.contributor.author.fl_str_mv Cardoso, Lisandro P.
Menezes, Alan S. de
Santos, Adenilson O. dos
Bortoleto, Jose R. [UNESP]
Cotta, Monica A.
Morelhao, Sergio L.
dc.subject.por.fl_str_mv semiconductor epitaxy
X-ray multiple diffraction
strain determination
topic semiconductor epitaxy
X-ray multiple diffraction
strain determination
description Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
publishDate 2008
dc.date.none.fl_str_mv 2008-01-01
2020-12-10T20:12:48Z
2020-12-10T20:12:48Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/conferenceObject
format conferenceObject
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://dx.doi.org/10.1107/S0108767308080987
Acta Crystallographica A-foundation And Advances. Chester: Int Union Crystallography, v. 64, p. C592-C592, 2008.
2053-2733
http://hdl.handle.net/11449/197308
10.1107/S0108767308080987
WOS:000480420705297
url http://dx.doi.org/10.1107/S0108767308080987
http://hdl.handle.net/11449/197308
identifier_str_mv Acta Crystallographica A-foundation And Advances. Chester: Int Union Crystallography, v. 64, p. C592-C592, 2008.
2053-2733
10.1107/S0108767308080987
WOS:000480420705297
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Acta Crystallographica A-foundation And Advances
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv C592-C592
dc.publisher.none.fl_str_mv Int Union Crystallography
publisher.none.fl_str_mv Int Union Crystallography
dc.source.none.fl_str_mv Web of Science
reponame:Repositório Institucional da UNESP
instname:Universidade Estadual Paulista (UNESP)
instacron:UNESP
instname_str Universidade Estadual Paulista (UNESP)
instacron_str UNESP
institution UNESP
reponame_str Repositório Institucional da UNESP
collection Repositório Institucional da UNESP
repository.name.fl_str_mv Repositório Institucional da UNESP - Universidade Estadual Paulista (UNESP)
repository.mail.fl_str_mv
_version_ 1808129120827080704

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