Synchrotron diffraction characterization of alternative powder diffraction standards

Detalhes bibliográficos
Autor(a) principal: MARTINEZ, L.G.
Data de Publicação: 2016
Outros Autores: ICHIKAWA, R.U., IMAKUMA, K., ORLANDO, M.T.D., TURRILLAS, X., ENCONTRO CIENT??FICO DE F??SICA APLICADA, 5.
Tipo de documento: Artigo de conferência
Título da fonte: Repositório Institucional do IPEN
Texto Completo: http://repositorio.ipen.br/handle/123456789/26416
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spelling 2016-06-23T14:02:05Z2016-06-23T14:02:05Z25-28 de maio, 2014http://repositorio.ipen.br/handle/123456789/26416Submitted by Claudinei Pracidelli (cpracide@ipen.br) on 2016-06-23T14:02:05Z No. of bitstreams: 1 22321.pdf: 921172 bytes, checksum: 87a73256387715535c93eccfafb922cc (MD5)Made available in DSpace on 2016-06-23T14:02:05Z (GMT). No. of bitstreams: 1 22321.pdf: 921172 bytes, checksum: 87a73256387715535c93eccfafb922cc (MD5)comparative evaluationscalibration standardspowdersdiffractionsynchrotronsx-ray diffractionheatoxidessiliconSynchrotron diffraction characterization of alternative powder diffraction standardsinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/conferenceObjectNDomingos Martins, ESMARTINEZ, L.G.ICHIKAWA, R.U.IMAKUMA, K.ORLANDO, M.T.D.TURRILLAS, X.ENCONTRO CIENT??FICO DE F??SICA APLICADA, 5.info:eu-repo/semantics/openAccessreponame:Repositório Institucional do IPENinstname:Instituto de Pesquisas Energéticas e Nucleares (IPEN)instacron:IPEN223212014MARTINEZ, L.G.ICHIKAWA, R.U.IMAKUMA, K.16-06Anais39710118541608712142MARTINEZ, L.G.:397:730:SICHIKAWA, R.U.:10118:730:NIMAKUMA, K.:541:-1:NORLANDO, M.T.D.:6087:-1:NTURRILLAS, X.:12142:-1:NORIGINAL22321.pdf22321.pdfapplication/pdf921172http://repositorio.ipen.br/bitstream/123456789/26416/1/22321.pdf87a73256387715535c93eccfafb922ccMD51LICENSElicense.txtlicense.txttext/plain; charset=utf-81748http://repositorio.ipen.br/bitstream/123456789/26416/2/license.txt8a4605be74aa9ea9d79846c1fba20a33MD52123456789/264162016-07-28 18:25:17.356oai:repositorio.ipen.br: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Repositório InstitucionalPUBhttp://repositorio.ipen.br/oai/requestbibl@ipen.bropendoar:45102016-07-28T18:25:17Repositório Institucional do IPEN - Instituto de Pesquisas Energéticas e Nucleares (IPEN)false
dc.title.pt_BR.fl_str_mv Synchrotron diffraction characterization of alternative powder diffraction standards
title Synchrotron diffraction characterization of alternative powder diffraction standards
spellingShingle Synchrotron diffraction characterization of alternative powder diffraction standards
MARTINEZ, L.G.
comparative evaluations
calibration standards
powders
diffraction
synchrotrons
x-ray diffraction
heat
oxides
silicon
title_short Synchrotron diffraction characterization of alternative powder diffraction standards
title_full Synchrotron diffraction characterization of alternative powder diffraction standards
title_fullStr Synchrotron diffraction characterization of alternative powder diffraction standards
title_full_unstemmed Synchrotron diffraction characterization of alternative powder diffraction standards
title_sort Synchrotron diffraction characterization of alternative powder diffraction standards
author MARTINEZ, L.G.
author_facet MARTINEZ, L.G.
ICHIKAWA, R.U.
IMAKUMA, K.
ORLANDO, M.T.D.
TURRILLAS, X.
ENCONTRO CIENT??FICO DE F??SICA APLICADA, 5.
author_role author
author2 ICHIKAWA, R.U.
IMAKUMA, K.
ORLANDO, M.T.D.
TURRILLAS, X.
ENCONTRO CIENT??FICO DE F??SICA APLICADA, 5.
author2_role author
author
author
author
author
dc.contributor.author.fl_str_mv MARTINEZ, L.G.
ICHIKAWA, R.U.
IMAKUMA, K.
ORLANDO, M.T.D.
TURRILLAS, X.
ENCONTRO CIENT??FICO DE F??SICA APLICADA, 5.
dc.subject.por.fl_str_mv comparative evaluations
calibration standards
powders
diffraction
synchrotrons
x-ray diffraction
heat
oxides
silicon
topic comparative evaluations
calibration standards
powders
diffraction
synchrotrons
x-ray diffraction
heat
oxides
silicon
publishDate 2016
dc.date.evento.pt_BR.fl_str_mv 25-28 de maio, 2014
dc.date.accessioned.fl_str_mv 2016-06-23T14:02:05Z
dc.date.available.fl_str_mv 2016-06-23T14:02:05Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
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