Non-linear behaviour of large-area avalanche photodiodes

Detalhes bibliográficos
Autor(a) principal: Fernandes, L. M. P.
Data de Publicação: 2002
Outros Autores: Lopes, J. A. M., Monteiro, C. M. B., Santos, J. M. F. dos, Morgado, R. E.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/10316/4501
https://doi.org/10.1016/S0168-9002(01)01781-8
Resumo: The characterisation of photodiodes used as photosensors requires a determination of the number of electron-hole pairs produced by scintillation light. One method involves comparing signals produced by X-ray absorptions occurring directly in the avalanche photodiode with the light signals. When the light is derived from light-emitting diodes in the 400-600 nm range, significant non-linear behaviour is reported. In the present work, we extend the study of the linear behaviour to large-area avalanche photodiodes, of Advanced Photonix, used as photosensors of the vacuum ultraviolet (VUV) scintillation light produced by argon (128 nm) and xenon (173 nm). We observed greater non-linearities in the avalanche photodiodes for the VUV scintillation light than reported previously for visible light, but considerably less than the non-linearities observed in other commercially available avalanche photodiodes.
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spelling Non-linear behaviour of large-area avalanche photodiodesScintillation detectorsX-ray detectorsAvalanche photodiodesThe characterisation of photodiodes used as photosensors requires a determination of the number of electron-hole pairs produced by scintillation light. One method involves comparing signals produced by X-ray absorptions occurring directly in the avalanche photodiode with the light signals. When the light is derived from light-emitting diodes in the 400-600 nm range, significant non-linear behaviour is reported. In the present work, we extend the study of the linear behaviour to large-area avalanche photodiodes, of Advanced Photonix, used as photosensors of the vacuum ultraviolet (VUV) scintillation light produced by argon (128 nm) and xenon (173 nm). We observed greater non-linearities in the avalanche photodiodes for the VUV scintillation light than reported previously for visible light, but considerably less than the non-linearities observed in other commercially available avalanche photodiodes.http://www.sciencedirect.com/science/article/B6TJM-45HFC9M-2K/1/447b7168bf09233e9122112c90b89b172002info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleaplication/PDFhttp://hdl.handle.net/10316/4501http://hdl.handle.net/10316/4501https://doi.org/10.1016/S0168-9002(01)01781-8engNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 478:1-2 (2002) 395-399Fernandes, L. M. P.Lopes, J. A. M.Monteiro, C. M. B.Santos, J. M. F. dosMorgado, R. E.info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2022-05-25T03:17:25Zoai:estudogeral.uc.pt:10316/4501Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T20:59:47.767209Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Non-linear behaviour of large-area avalanche photodiodes
title Non-linear behaviour of large-area avalanche photodiodes
spellingShingle Non-linear behaviour of large-area avalanche photodiodes
Fernandes, L. M. P.
Scintillation detectors
X-ray detectors
Avalanche photodiodes
title_short Non-linear behaviour of large-area avalanche photodiodes
title_full Non-linear behaviour of large-area avalanche photodiodes
title_fullStr Non-linear behaviour of large-area avalanche photodiodes
title_full_unstemmed Non-linear behaviour of large-area avalanche photodiodes
title_sort Non-linear behaviour of large-area avalanche photodiodes
author Fernandes, L. M. P.
author_facet Fernandes, L. M. P.
Lopes, J. A. M.
Monteiro, C. M. B.
Santos, J. M. F. dos
Morgado, R. E.
author_role author
author2 Lopes, J. A. M.
Monteiro, C. M. B.
Santos, J. M. F. dos
Morgado, R. E.
author2_role author
author
author
author
dc.contributor.author.fl_str_mv Fernandes, L. M. P.
Lopes, J. A. M.
Monteiro, C. M. B.
Santos, J. M. F. dos
Morgado, R. E.
dc.subject.por.fl_str_mv Scintillation detectors
X-ray detectors
Avalanche photodiodes
topic Scintillation detectors
X-ray detectors
Avalanche photodiodes
description The characterisation of photodiodes used as photosensors requires a determination of the number of electron-hole pairs produced by scintillation light. One method involves comparing signals produced by X-ray absorptions occurring directly in the avalanche photodiode with the light signals. When the light is derived from light-emitting diodes in the 400-600 nm range, significant non-linear behaviour is reported. In the present work, we extend the study of the linear behaviour to large-area avalanche photodiodes, of Advanced Photonix, used as photosensors of the vacuum ultraviolet (VUV) scintillation light produced by argon (128 nm) and xenon (173 nm). We observed greater non-linearities in the avalanche photodiodes for the VUV scintillation light than reported previously for visible light, but considerably less than the non-linearities observed in other commercially available avalanche photodiodes.
publishDate 2002
dc.date.none.fl_str_mv 2002
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dc.type.driver.fl_str_mv info:eu-repo/semantics/article
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status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/10316/4501
http://hdl.handle.net/10316/4501
https://doi.org/10.1016/S0168-9002(01)01781-8
url http://hdl.handle.net/10316/4501
https://doi.org/10.1016/S0168-9002(01)01781-8
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 478:1-2 (2002) 395-399
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