Test of integrated optical circuits for PON networks
Autor(a) principal: | |
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Data de Publicação: | 2019 |
Tipo de documento: | Dissertação |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10773/29594 |
Resumo: | For the last two decades, the Internet has been target of a technological revolution. The amount of new services and applications that came up with this revolution demanded the search to obtain more bandwidth and bigger data rates. The only technologies capable of satisfying these conditions are the optical communications. The current technology that is capable to satisfying all these needs is the Passive Optical Network(PON). There are some variations of this technology currently being used such as the GPON and EPON. New evolutions of PON are being developed, such as the Next Generation Passive Optical Network 2(NG-PON2) This technology multiplexes different services into separated wavelengths, making its performance more effective. One tool of great matter in this business is the Photonics Integrated Circuit(PIC). The photonic integrated technology has been taking over the conventional optical equipment because it allows the integration of several functionalities into one single chip, saving space and energy. Having in mind the objective of developping next generation optical communication systems, the work presented in this document intends to test PIC in way that they can be used in optical equipment, as for example the Optical Line Terminal(OLT) which has functions of transmitter/receiver situated at the operator's station, and the Optical Network Unit(ONU) situated at the user's location. To make it possible for PIC to be integrated in optical networks these must be tested in order to assure that they perform their functions without any anomalies happening. For such reason, these PIC are at our labs, read to be tested. This work, consisted of the execution of tests to PIC as well as the optimization of the techniques and adequate procedures. In the first place, it is presented an overview of optical networks and PIC. Then the do's and dont's of testing PIC as well as the procedure and preparations of these tests. At last, the tests to the PIC will be performed which represents most of the work shown in this document. |
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Test of integrated optical circuits for PON networksPhotonic Integrated Circuit (PIC)PIC testingPONFor the last two decades, the Internet has been target of a technological revolution. The amount of new services and applications that came up with this revolution demanded the search to obtain more bandwidth and bigger data rates. The only technologies capable of satisfying these conditions are the optical communications. The current technology that is capable to satisfying all these needs is the Passive Optical Network(PON). There are some variations of this technology currently being used such as the GPON and EPON. New evolutions of PON are being developed, such as the Next Generation Passive Optical Network 2(NG-PON2) This technology multiplexes different services into separated wavelengths, making its performance more effective. One tool of great matter in this business is the Photonics Integrated Circuit(PIC). The photonic integrated technology has been taking over the conventional optical equipment because it allows the integration of several functionalities into one single chip, saving space and energy. Having in mind the objective of developping next generation optical communication systems, the work presented in this document intends to test PIC in way that they can be used in optical equipment, as for example the Optical Line Terminal(OLT) which has functions of transmitter/receiver situated at the operator's station, and the Optical Network Unit(ONU) situated at the user's location. To make it possible for PIC to be integrated in optical networks these must be tested in order to assure that they perform their functions without any anomalies happening. For such reason, these PIC are at our labs, read to be tested. This work, consisted of the execution of tests to PIC as well as the optimization of the techniques and adequate procedures. In the first place, it is presented an overview of optical networks and PIC. Then the do's and dont's of testing PIC as well as the procedure and preparations of these tests. At last, the tests to the PIC will be performed which represents most of the work shown in this document.No decorrer das últimas duas décadas a Internet tem sofrido uma grande revolução. A quantidade de serviços e aplicações que surgiram desta revolução criaram a necessidade de obter mais largura de banda e maiores velocidades. As únicas tecnologias capazes de satisfazer estas condições são as comunicações óticas. A tecnologia que é usada atualmente para satisfazer todas estas necessidades é chamada de Passive Optical Network( PON). Existem algumas evoluções desta tecnologia a serem utilizadas atualmente, nomeadamente a GPON ou EPON. Novas evoluções de PON estão a ser desenvolvidas, nomeadamente a Next Generation Passive Optical Network 2(NG-PON2). Esta tecnologia multiplexa serviços diferentes em diferentes comprimentos de onda, tornando o seu desempenho mais eficaz. Um dispositivo de grande importância neste ramo são os Photonic Integrated Circuit(PIC). A tecnologia integrada tem vindo a substituir a ótica convencional, uma vez que possiblita a integração de varias funcionalidades óticas num único chip, poupando energia e espaço. Com o obectivo de desenvolver sistemas óticos de futura geração, este trabalho pretende testar PICs de maneira que estes possam ser integrados em equipamentos óticos, como por exemplo no Optical Line Terminal(OLT) com funções tais como transmissor/receptor situado na estacão da operadora de telecomunicações ou no Optical Network Unit(ONU) que se situa na localização do utilizador. Para possível integração dos PICs em redes óticas, estes deve ser testados de modo a garantir que todas as funções se realizem sem anomalias. Para tal, estes componentes encontram-se em teste nos nossos laboratórios. Estes trabalho, consistiu na realização de testes a circuitos integrados óticos, bem como a otimização das técnicas e procedimentos adequados para os mesmos. Em primeiro lugar, _e apresentado um resumo teórico acerca das redes óticas e PIC. De seguida, são apresentados cuidados de realização de testes, bem como procedimento de preparação dos mesmos. Por fim são realizados testes aos PIC que representam o maior volume em trabalho deste documento.2020-10-26T10:58:45Z2019-12-01T00:00:00Z2019-12info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/masterThesisapplication/pdfhttp://hdl.handle.net/10773/29594engArantes, João Paulo Gomesinfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2024-02-22T11:57:15Zoai:ria.ua.pt:10773/29594Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-20T03:01:53.503373Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Test of integrated optical circuits for PON networks |
title |
Test of integrated optical circuits for PON networks |
spellingShingle |
Test of integrated optical circuits for PON networks Arantes, João Paulo Gomes Photonic Integrated Circuit (PIC) PIC testing PON |
title_short |
Test of integrated optical circuits for PON networks |
title_full |
Test of integrated optical circuits for PON networks |
title_fullStr |
Test of integrated optical circuits for PON networks |
title_full_unstemmed |
Test of integrated optical circuits for PON networks |
title_sort |
Test of integrated optical circuits for PON networks |
author |
Arantes, João Paulo Gomes |
author_facet |
Arantes, João Paulo Gomes |
author_role |
author |
dc.contributor.author.fl_str_mv |
Arantes, João Paulo Gomes |
dc.subject.por.fl_str_mv |
Photonic Integrated Circuit (PIC) PIC testing PON |
topic |
Photonic Integrated Circuit (PIC) PIC testing PON |
description |
For the last two decades, the Internet has been target of a technological revolution. The amount of new services and applications that came up with this revolution demanded the search to obtain more bandwidth and bigger data rates. The only technologies capable of satisfying these conditions are the optical communications. The current technology that is capable to satisfying all these needs is the Passive Optical Network(PON). There are some variations of this technology currently being used such as the GPON and EPON. New evolutions of PON are being developed, such as the Next Generation Passive Optical Network 2(NG-PON2) This technology multiplexes different services into separated wavelengths, making its performance more effective. One tool of great matter in this business is the Photonics Integrated Circuit(PIC). The photonic integrated technology has been taking over the conventional optical equipment because it allows the integration of several functionalities into one single chip, saving space and energy. Having in mind the objective of developping next generation optical communication systems, the work presented in this document intends to test PIC in way that they can be used in optical equipment, as for example the Optical Line Terminal(OLT) which has functions of transmitter/receiver situated at the operator's station, and the Optical Network Unit(ONU) situated at the user's location. To make it possible for PIC to be integrated in optical networks these must be tested in order to assure that they perform their functions without any anomalies happening. For such reason, these PIC are at our labs, read to be tested. This work, consisted of the execution of tests to PIC as well as the optimization of the techniques and adequate procedures. In the first place, it is presented an overview of optical networks and PIC. Then the do's and dont's of testing PIC as well as the procedure and preparations of these tests. At last, the tests to the PIC will be performed which represents most of the work shown in this document. |
publishDate |
2019 |
dc.date.none.fl_str_mv |
2019-12-01T00:00:00Z 2019-12 2020-10-26T10:58:45Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/masterThesis |
format |
masterThesis |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10773/29594 |
url |
http://hdl.handle.net/10773/29594 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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RCAAP |
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RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
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