Debug and test of microcontroller-based applications using the boundary scan test infrastructure

• Autor(a) principal: Gustavo R. Alves
• Data de Publicação: 1997
• Outros Autores: José M. M. Ferreira, Daniel Aga, Ovidiu Mosuc
• Tipo de documento: Livro
• Idioma: eng
• Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
• Texto Completo: https://hdl.handle.net/10216/84455
• topic: Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática; Electrical engineering, Electrical engineering, Electronic engineering, Information engineering

Microcontroller based applications are usually debugged with the assistance of In-circuit emulators and logic analysers. However, these traditional debug tools represent a huge investment for use in classes with several groups of students working at the same time. The development of a new low-cost debug tool that uses the Boundary Scan Test infrastructure to implement the basic functionality provided by an In-circuit emulator and a logic analyser is a possible solution to overcome this economical problem. To reduce costs the Boundary Scan Test infrastructure is controlled through the parallel port of a normal Personal Computer, now widely available in classrooms.