Boundary scan test, test methodology, and fault modeling
Autor(a) principal: | |
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Data de Publicação: | 1991 |
Outros Autores: | , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | https://hdl.handle.net/10216/84545 |
Resumo: | The test technique called "boundary scan test" (BST) offers new opportunities in testing but confronts users with new problems too. The implementation of BST in a chip has become an IEEE standard and users on board level are the next group to begin thinking about using the new possibilities. This article addresses some of the questions about changes in board-level testing and fault diagnosis. The fault model itself is also affected by using BST. Trivial items are extended with more sophisticated details in order to complete the fault model. Finally, BST appears to be a test technique that offers a high degree of detectability on board level, but for diagnosis, some additional effort has to be made. |
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Boundary scan test, test methodology, and fault modelingEngenharia electrotécnica, Engenharia electrotécnica, electrónica e informáticaElectrical engineering, Electrical engineering, Electronic engineering, Information engineeringThe test technique called "boundary scan test" (BST) offers new opportunities in testing but confronts users with new problems too. The implementation of BST in a chip has become an IEEE standard and users on board level are the next group to begin thinking about using the new possibilities. This article addresses some of the questions about changes in board-level testing and fault diagnosis. The fault model itself is also affected by using BST. Trivial items are extended with more sophisticated details in order to complete the fault model. Finally, BST appears to be a test technique that offers a high degree of detectability on board level, but for diagnosis, some additional effort has to be made.19911991-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/10216/84545eng0923-8174Frans de JongJosé S. MatosJosé M. Ferreirainfo:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-11-29T15:03:47Zoai:repositorio-aberto.up.pt:10216/84545Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-20T00:14:45.815502Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Boundary scan test, test methodology, and fault modeling |
title |
Boundary scan test, test methodology, and fault modeling |
spellingShingle |
Boundary scan test, test methodology, and fault modeling Frans de Jong Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática Electrical engineering, Electrical engineering, Electronic engineering, Information engineering |
title_short |
Boundary scan test, test methodology, and fault modeling |
title_full |
Boundary scan test, test methodology, and fault modeling |
title_fullStr |
Boundary scan test, test methodology, and fault modeling |
title_full_unstemmed |
Boundary scan test, test methodology, and fault modeling |
title_sort |
Boundary scan test, test methodology, and fault modeling |
author |
Frans de Jong |
author_facet |
Frans de Jong José S. Matos José M. Ferreira |
author_role |
author |
author2 |
José S. Matos José M. Ferreira |
author2_role |
author author |
dc.contributor.author.fl_str_mv |
Frans de Jong José S. Matos José M. Ferreira |
dc.subject.por.fl_str_mv |
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática Electrical engineering, Electrical engineering, Electronic engineering, Information engineering |
topic |
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática Electrical engineering, Electrical engineering, Electronic engineering, Information engineering |
description |
The test technique called "boundary scan test" (BST) offers new opportunities in testing but confronts users with new problems too. The implementation of BST in a chip has become an IEEE standard and users on board level are the next group to begin thinking about using the new possibilities. This article addresses some of the questions about changes in board-level testing and fault diagnosis. The fault model itself is also affected by using BST. Trivial items are extended with more sophisticated details in order to complete the fault model. Finally, BST appears to be a test technique that offers a high degree of detectability on board level, but for diagnosis, some additional effort has to be made. |
publishDate |
1991 |
dc.date.none.fl_str_mv |
1991 1991-01-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
https://hdl.handle.net/10216/84545 |
url |
https://hdl.handle.net/10216/84545 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
0923-8174 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
collection |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
repository.mail.fl_str_mv |
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1799136068299128833 |