First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
Autor(a) principal: | |
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Data de Publicação: | 2020 |
Outros Autores: | , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/10316/101314 https://doi.org/10.3390/pr8111520 |
Resumo: | Modern industrial units collect large amounts of process data based on which advanced process monitoring algorithms continuously assess the status of operations. As an integral part of the development of such algorithms, a reference dataset representative of normal operating conditions is required to evaluate the stability of the process and, after confirming that it is stable, to calibrate a monitoring procedure, i.e., estimate the reference model and set the control limits for the monitoring statistics. The basic assumption is that all relevant “common causes” of variation appear well represented in this reference dataset (using the terminology adopted by the founding father of process monitoring, Walter A. Shewhart). Otherwise, false alarms will inevitably occur during the implementation of the monitoring scheme. However, we argue and demonstrate in this article, that this assumption is often not met in modern industrial systems. Therefore, we introduce a new approach based on the rigorous mechanistic modeling of the dominant modes of common cause variation and the use of stochastic computational simulations to enrich the historical dataset with augmented data representing a comprehensive coverage of the actual operational space. We show how to compute the monitoring statistics and set their control limits, as well as to conduct fault diagnosis when an abnormal event is declared. The proposed method, called AGV (Artificial Generation of common cause Variability) is applied to a Surface Mount Technology (SMT) production line of Bosch Car Multimedia, where more than 17 thousand product variables are simultaneously monitored. |
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First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processeshigh-dimensional datastatistical process monitoringartificial generation of variabilitydata augmentationIndustry 4.0Modern industrial units collect large amounts of process data based on which advanced process monitoring algorithms continuously assess the status of operations. As an integral part of the development of such algorithms, a reference dataset representative of normal operating conditions is required to evaluate the stability of the process and, after confirming that it is stable, to calibrate a monitoring procedure, i.e., estimate the reference model and set the control limits for the monitoring statistics. The basic assumption is that all relevant “common causes” of variation appear well represented in this reference dataset (using the terminology adopted by the founding father of process monitoring, Walter A. Shewhart). Otherwise, false alarms will inevitably occur during the implementation of the monitoring scheme. However, we argue and demonstrate in this article, that this assumption is often not met in modern industrial systems. Therefore, we introduce a new approach based on the rigorous mechanistic modeling of the dominant modes of common cause variation and the use of stochastic computational simulations to enrich the historical dataset with augmented data representing a comprehensive coverage of the actual operational space. We show how to compute the monitoring statistics and set their control limits, as well as to conduct fault diagnosis when an abnormal event is declared. The proposed method, called AGV (Artificial Generation of common cause Variability) is applied to a Surface Mount Technology (SMT) production line of Bosch Car Multimedia, where more than 17 thousand product variables are simultaneously monitored.2020info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articlehttp://hdl.handle.net/10316/101314http://hdl.handle.net/10316/101314https://doi.org/10.3390/pr8111520eng2227-9717Rato, Tiago J.Delgado, PedroMartins, CristinaReis, Marco S.info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2022-08-23T20:39:08Zoai:estudogeral.uc.pt:10316/101314Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T21:18:31.941740Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes |
title |
First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes |
spellingShingle |
First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes Rato, Tiago J. high-dimensional data statistical process monitoring artificial generation of variability data augmentation Industry 4.0 |
title_short |
First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes |
title_full |
First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes |
title_fullStr |
First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes |
title_full_unstemmed |
First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes |
title_sort |
First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes |
author |
Rato, Tiago J. |
author_facet |
Rato, Tiago J. Delgado, Pedro Martins, Cristina Reis, Marco S. |
author_role |
author |
author2 |
Delgado, Pedro Martins, Cristina Reis, Marco S. |
author2_role |
author author author |
dc.contributor.author.fl_str_mv |
Rato, Tiago J. Delgado, Pedro Martins, Cristina Reis, Marco S. |
dc.subject.por.fl_str_mv |
high-dimensional data statistical process monitoring artificial generation of variability data augmentation Industry 4.0 |
topic |
high-dimensional data statistical process monitoring artificial generation of variability data augmentation Industry 4.0 |
description |
Modern industrial units collect large amounts of process data based on which advanced process monitoring algorithms continuously assess the status of operations. As an integral part of the development of such algorithms, a reference dataset representative of normal operating conditions is required to evaluate the stability of the process and, after confirming that it is stable, to calibrate a monitoring procedure, i.e., estimate the reference model and set the control limits for the monitoring statistics. The basic assumption is that all relevant “common causes” of variation appear well represented in this reference dataset (using the terminology adopted by the founding father of process monitoring, Walter A. Shewhart). Otherwise, false alarms will inevitably occur during the implementation of the monitoring scheme. However, we argue and demonstrate in this article, that this assumption is often not met in modern industrial systems. Therefore, we introduce a new approach based on the rigorous mechanistic modeling of the dominant modes of common cause variation and the use of stochastic computational simulations to enrich the historical dataset with augmented data representing a comprehensive coverage of the actual operational space. We show how to compute the monitoring statistics and set their control limits, as well as to conduct fault diagnosis when an abnormal event is declared. The proposed method, called AGV (Artificial Generation of common cause Variability) is applied to a Surface Mount Technology (SMT) production line of Bosch Car Multimedia, where more than 17 thousand product variables are simultaneously monitored. |
publishDate |
2020 |
dc.date.none.fl_str_mv |
2020 |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/10316/101314 http://hdl.handle.net/10316/101314 https://doi.org/10.3390/pr8111520 |
url |
http://hdl.handle.net/10316/101314 https://doi.org/10.3390/pr8111520 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
2227-9717 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
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Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
repository.mail.fl_str_mv |
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1799134079758630912 |