First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes

Detalhes bibliográficos
Autor(a) principal: Rato, Tiago J.
Data de Publicação: 2020
Outros Autores: Delgado, Pedro, Martins, Cristina, Reis, Marco S.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/10316/101314
https://doi.org/10.3390/pr8111520
Resumo: Modern industrial units collect large amounts of process data based on which advanced process monitoring algorithms continuously assess the status of operations. As an integral part of the development of such algorithms, a reference dataset representative of normal operating conditions is required to evaluate the stability of the process and, after confirming that it is stable, to calibrate a monitoring procedure, i.e., estimate the reference model and set the control limits for the monitoring statistics. The basic assumption is that all relevant “common causes” of variation appear well represented in this reference dataset (using the terminology adopted by the founding father of process monitoring, Walter A. Shewhart). Otherwise, false alarms will inevitably occur during the implementation of the monitoring scheme. However, we argue and demonstrate in this article, that this assumption is often not met in modern industrial systems. Therefore, we introduce a new approach based on the rigorous mechanistic modeling of the dominant modes of common cause variation and the use of stochastic computational simulations to enrich the historical dataset with augmented data representing a comprehensive coverage of the actual operational space. We show how to compute the monitoring statistics and set their control limits, as well as to conduct fault diagnosis when an abnormal event is declared. The proposed method, called AGV (Artificial Generation of common cause Variability) is applied to a Surface Mount Technology (SMT) production line of Bosch Car Multimedia, where more than 17 thousand product variables are simultaneously monitored.
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spelling First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processeshigh-dimensional datastatistical process monitoringartificial generation of variabilitydata augmentationIndustry 4.0Modern industrial units collect large amounts of process data based on which advanced process monitoring algorithms continuously assess the status of operations. As an integral part of the development of such algorithms, a reference dataset representative of normal operating conditions is required to evaluate the stability of the process and, after confirming that it is stable, to calibrate a monitoring procedure, i.e., estimate the reference model and set the control limits for the monitoring statistics. The basic assumption is that all relevant “common causes” of variation appear well represented in this reference dataset (using the terminology adopted by the founding father of process monitoring, Walter A. Shewhart). Otherwise, false alarms will inevitably occur during the implementation of the monitoring scheme. However, we argue and demonstrate in this article, that this assumption is often not met in modern industrial systems. Therefore, we introduce a new approach based on the rigorous mechanistic modeling of the dominant modes of common cause variation and the use of stochastic computational simulations to enrich the historical dataset with augmented data representing a comprehensive coverage of the actual operational space. We show how to compute the monitoring statistics and set their control limits, as well as to conduct fault diagnosis when an abnormal event is declared. The proposed method, called AGV (Artificial Generation of common cause Variability) is applied to a Surface Mount Technology (SMT) production line of Bosch Car Multimedia, where more than 17 thousand product variables are simultaneously monitored.2020info:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articlehttp://hdl.handle.net/10316/101314http://hdl.handle.net/10316/101314https://doi.org/10.3390/pr8111520eng2227-9717Rato, Tiago J.Delgado, PedroMartins, CristinaReis, Marco S.info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2022-08-23T20:39:08Zoai:estudogeral.uc.pt:10316/101314Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T21:18:31.941740Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
title First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
spellingShingle First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
Rato, Tiago J.
high-dimensional data
statistical process monitoring
artificial generation of variability
data augmentation
Industry 4.0
title_short First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
title_full First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
title_fullStr First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
title_full_unstemmed First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
title_sort First Principles Statistical Process Monitoring of High-Dimensional Industrial Microelectronics Assembly Processes
author Rato, Tiago J.
author_facet Rato, Tiago J.
Delgado, Pedro
Martins, Cristina
Reis, Marco S.
author_role author
author2 Delgado, Pedro
Martins, Cristina
Reis, Marco S.
author2_role author
author
author
dc.contributor.author.fl_str_mv Rato, Tiago J.
Delgado, Pedro
Martins, Cristina
Reis, Marco S.
dc.subject.por.fl_str_mv high-dimensional data
statistical process monitoring
artificial generation of variability
data augmentation
Industry 4.0
topic high-dimensional data
statistical process monitoring
artificial generation of variability
data augmentation
Industry 4.0
description Modern industrial units collect large amounts of process data based on which advanced process monitoring algorithms continuously assess the status of operations. As an integral part of the development of such algorithms, a reference dataset representative of normal operating conditions is required to evaluate the stability of the process and, after confirming that it is stable, to calibrate a monitoring procedure, i.e., estimate the reference model and set the control limits for the monitoring statistics. The basic assumption is that all relevant “common causes” of variation appear well represented in this reference dataset (using the terminology adopted by the founding father of process monitoring, Walter A. Shewhart). Otherwise, false alarms will inevitably occur during the implementation of the monitoring scheme. However, we argue and demonstrate in this article, that this assumption is often not met in modern industrial systems. Therefore, we introduce a new approach based on the rigorous mechanistic modeling of the dominant modes of common cause variation and the use of stochastic computational simulations to enrich the historical dataset with augmented data representing a comprehensive coverage of the actual operational space. We show how to compute the monitoring statistics and set their control limits, as well as to conduct fault diagnosis when an abnormal event is declared. The proposed method, called AGV (Artificial Generation of common cause Variability) is applied to a Surface Mount Technology (SMT) production line of Bosch Car Multimedia, where more than 17 thousand product variables are simultaneously monitored.
publishDate 2020
dc.date.none.fl_str_mv 2020
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dc.identifier.uri.fl_str_mv http://hdl.handle.net/10316/101314
http://hdl.handle.net/10316/101314
https://doi.org/10.3390/pr8111520
url http://hdl.handle.net/10316/101314
https://doi.org/10.3390/pr8111520
dc.language.iso.fl_str_mv eng
language eng
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