Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size

Detalhes bibliográficos
Autor(a) principal: Losurdo, M.
Data de Publicação: 2003
Outros Autores: Giangregorio, M. M., Capezzuto, Pio, Bruno, G., Cerqueira, M. F., Alves, E., Stepikhova, M.
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
Texto Completo: http://hdl.handle.net/1822/14015
Resumo: The dielectric function of nanocrystalline silicon (nc-Si) with crystallite size in the range of 1 to 3 nm has been determined by spectroscopic ellipsometry in the range of 1.5 to 5.5 eV. ATauc–Lorentz parameterization is used to model the nc-Si optical properties. The nc-Si dielectric function can be used to analyze nondestructively nc-Si thin films where nanocrystallites cannot be detected by x-ray diffraction and Raman spectroscopy.
id RCAP_d545a92da792d213724583c2ce9b75ea
oai_identifier_str oai:repositorium.sdum.uminho.pt:1822/14015
network_acronym_str RCAP
network_name_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository_id_str 7160
spelling Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain sizeDielectric functionNanocrystalline siliconEllipsometryScience & TechnologyThe dielectric function of nanocrystalline silicon (nc-Si) with crystallite size in the range of 1 to 3 nm has been determined by spectroscopic ellipsometry in the range of 1.5 to 5.5 eV. ATauc–Lorentz parameterization is used to model the nc-Si optical properties. The nc-Si dielectric function can be used to analyze nondestructively nc-Si thin films where nanocrystallites cannot be detected by x-ray diffraction and Raman spectroscopy.AIP PublishingUniversidade do MinhoLosurdo, M.Giangregorio, M. M.Capezzuto, PioBruno, G.Cerqueira, M. F.Alves, E.Stepikhova, M.20032003-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/14015eng0003-695110.1063/1.1569052http://apl.aip.org/resource/1/applab/v82/i18/p2993_s1info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:30:11Zoai:repositorium.sdum.uminho.pt:1822/14015Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:25:18.176399Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse
dc.title.none.fl_str_mv Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
title Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
spellingShingle Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
Losurdo, M.
Dielectric function
Nanocrystalline silicon
Ellipsometry
Science & Technology
title_short Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
title_full Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
title_fullStr Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
title_full_unstemmed Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
title_sort Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
author Losurdo, M.
author_facet Losurdo, M.
Giangregorio, M. M.
Capezzuto, Pio
Bruno, G.
Cerqueira, M. F.
Alves, E.
Stepikhova, M.
author_role author
author2 Giangregorio, M. M.
Capezzuto, Pio
Bruno, G.
Cerqueira, M. F.
Alves, E.
Stepikhova, M.
author2_role author
author
author
author
author
author
dc.contributor.none.fl_str_mv Universidade do Minho
dc.contributor.author.fl_str_mv Losurdo, M.
Giangregorio, M. M.
Capezzuto, Pio
Bruno, G.
Cerqueira, M. F.
Alves, E.
Stepikhova, M.
dc.subject.por.fl_str_mv Dielectric function
Nanocrystalline silicon
Ellipsometry
Science & Technology
topic Dielectric function
Nanocrystalline silicon
Ellipsometry
Science & Technology
description The dielectric function of nanocrystalline silicon (nc-Si) with crystallite size in the range of 1 to 3 nm has been determined by spectroscopic ellipsometry in the range of 1.5 to 5.5 eV. ATauc–Lorentz parameterization is used to model the nc-Si optical properties. The nc-Si dielectric function can be used to analyze nondestructively nc-Si thin films where nanocrystallites cannot be detected by x-ray diffraction and Raman spectroscopy.
publishDate 2003
dc.date.none.fl_str_mv 2003
2003-01-01T00:00:00Z
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://hdl.handle.net/1822/14015
url http://hdl.handle.net/1822/14015
dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 0003-6951
10.1063/1.1569052
http://apl.aip.org/resource/1/applab/v82/i18/p2993_s1
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv AIP Publishing
publisher.none.fl_str_mv AIP Publishing
dc.source.none.fl_str_mv reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron:RCAAP
instname_str Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
instacron_str RCAAP
institution RCAAP
reponame_str Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
collection Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)
repository.name.fl_str_mv Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação
repository.mail.fl_str_mv
_version_ 1799132736270630912

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