Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size
Autor(a) principal: | |
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Data de Publicação: | 2003 |
Outros Autores: | , , , , , |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
Texto Completo: | http://hdl.handle.net/1822/14015 |
Resumo: | The dielectric function of nanocrystalline silicon (nc-Si) with crystallite size in the range of 1 to 3 nm has been determined by spectroscopic ellipsometry in the range of 1.5 to 5.5 eV. ATauc–Lorentz parameterization is used to model the nc-Si optical properties. The nc-Si dielectric function can be used to analyze nondestructively nc-Si thin films where nanocrystallites cannot be detected by x-ray diffraction and Raman spectroscopy. |
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Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
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7160 |
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Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain sizeDielectric functionNanocrystalline siliconEllipsometryScience & TechnologyThe dielectric function of nanocrystalline silicon (nc-Si) with crystallite size in the range of 1 to 3 nm has been determined by spectroscopic ellipsometry in the range of 1.5 to 5.5 eV. ATauc–Lorentz parameterization is used to model the nc-Si optical properties. The nc-Si dielectric function can be used to analyze nondestructively nc-Si thin films where nanocrystallites cannot be detected by x-ray diffraction and Raman spectroscopy.AIP PublishingUniversidade do MinhoLosurdo, M.Giangregorio, M. M.Capezzuto, PioBruno, G.Cerqueira, M. F.Alves, E.Stepikhova, M.20032003-01-01T00:00:00Zinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/1822/14015eng0003-695110.1063/1.1569052http://apl.aip.org/resource/1/applab/v82/i18/p2993_s1info:eu-repo/semantics/openAccessreponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos)instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãoinstacron:RCAAP2023-07-21T12:30:11Zoai:repositorium.sdum.uminho.pt:1822/14015Portal AgregadorONGhttps://www.rcaap.pt/oai/openaireopendoar:71602024-03-19T19:25:18.176399Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informaçãofalse |
dc.title.none.fl_str_mv |
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size |
title |
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size |
spellingShingle |
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size Losurdo, M. Dielectric function Nanocrystalline silicon Ellipsometry Science & Technology |
title_short |
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size |
title_full |
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size |
title_fullStr |
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size |
title_full_unstemmed |
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size |
title_sort |
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grain size |
author |
Losurdo, M. |
author_facet |
Losurdo, M. Giangregorio, M. M. Capezzuto, Pio Bruno, G. Cerqueira, M. F. Alves, E. Stepikhova, M. |
author_role |
author |
author2 |
Giangregorio, M. M. Capezzuto, Pio Bruno, G. Cerqueira, M. F. Alves, E. Stepikhova, M. |
author2_role |
author author author author author author |
dc.contributor.none.fl_str_mv |
Universidade do Minho |
dc.contributor.author.fl_str_mv |
Losurdo, M. Giangregorio, M. M. Capezzuto, Pio Bruno, G. Cerqueira, M. F. Alves, E. Stepikhova, M. |
dc.subject.por.fl_str_mv |
Dielectric function Nanocrystalline silicon Ellipsometry Science & Technology |
topic |
Dielectric function Nanocrystalline silicon Ellipsometry Science & Technology |
description |
The dielectric function of nanocrystalline silicon (nc-Si) with crystallite size in the range of 1 to 3 nm has been determined by spectroscopic ellipsometry in the range of 1.5 to 5.5 eV. ATauc–Lorentz parameterization is used to model the nc-Si optical properties. The nc-Si dielectric function can be used to analyze nondestructively nc-Si thin films where nanocrystallites cannot be detected by x-ray diffraction and Raman spectroscopy. |
publishDate |
2003 |
dc.date.none.fl_str_mv |
2003 2003-01-01T00:00:00Z |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://hdl.handle.net/1822/14015 |
url |
http://hdl.handle.net/1822/14015 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
0003-6951 10.1063/1.1569052 http://apl.aip.org/resource/1/applab/v82/i18/p2993_s1 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
application/pdf |
dc.publisher.none.fl_str_mv |
AIP Publishing |
publisher.none.fl_str_mv |
AIP Publishing |
dc.source.none.fl_str_mv |
reponame:Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) instname:Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação instacron:RCAAP |
instname_str |
Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
instacron_str |
RCAAP |
institution |
RCAAP |
reponame_str |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
collection |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) |
repository.name.fl_str_mv |
Repositório Científico de Acesso Aberto de Portugal (Repositórios Cientìficos) - Agência para a Sociedade do Conhecimento (UMIC) - FCT - Sociedade da Informação |
repository.mail.fl_str_mv |
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1799132736270630912 |