Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors
Autor(a) principal: | |
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Data de Publicação: | 1998 |
Outros Autores: | |
Tipo de documento: | Artigo |
Idioma: | eng |
Título da fonte: | Brazilian Journal of Physics |
Texto Completo: | http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331998000100002 |
Resumo: | The wide bandgap semiconductors Silicon carbide and gallium nitride have been studied by Raman scattering, photoluminescense, and infrared absorption. Raman scattering studies determined crystalline quality and polytype of bulk and thin film samples at room temperature to detected and/or identify impurity centers and structure related defects and their role on the electronic properties of the materiais. Infrared absorption spectroscpopy was used to measure the binding enrgy of donors and their concentration. |
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Brazilian Journal of Physics |
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Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride SemiconductorsThe wide bandgap semiconductors Silicon carbide and gallium nitride have been studied by Raman scattering, photoluminescense, and infrared absorption. Raman scattering studies determined crystalline quality and polytype of bulk and thin film samples at room temperature to detected and/or identify impurity centers and structure related defects and their role on the electronic properties of the materiais. Infrared absorption spectroscpopy was used to measure the binding enrgy of donors and their concentration.Sociedade Brasileira de Física1998-03-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331998000100002Brazilian Journal of Physics v.28 n.1 1998reponame:Brazilian Journal of Physicsinstname:Sociedade Brasileira de Física (SBF)instacron:SBF10.1590/S0103-97331998000100002info:eu-repo/semantics/openAccessFreitas, Jr.,J.A.Moore,W.J.eng1999-04-28T00:00:00Zoai:scielo:S0103-97331998000100002Revistahttp://www.sbfisica.org.br/v1/home/index.php/pt/ONGhttps://old.scielo.br/oai/scielo-oai.phpsbfisica@sbfisica.org.br||sbfisica@sbfisica.org.br1678-44480103-9733opendoar:1999-04-28T00:00Brazilian Journal of Physics - Sociedade Brasileira de Física (SBF)false |
dc.title.none.fl_str_mv |
Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors |
title |
Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors |
spellingShingle |
Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors Freitas, Jr.,J.A. |
title_short |
Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors |
title_full |
Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors |
title_fullStr |
Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors |
title_full_unstemmed |
Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors |
title_sort |
Optical Studies of Undoped and Doped Wide Bandgap Carbide and Nitride Semiconductors |
author |
Freitas, Jr.,J.A. |
author_facet |
Freitas, Jr.,J.A. Moore,W.J. |
author_role |
author |
author2 |
Moore,W.J. |
author2_role |
author |
dc.contributor.author.fl_str_mv |
Freitas, Jr.,J.A. Moore,W.J. |
description |
The wide bandgap semiconductors Silicon carbide and gallium nitride have been studied by Raman scattering, photoluminescense, and infrared absorption. Raman scattering studies determined crystalline quality and polytype of bulk and thin film samples at room temperature to detected and/or identify impurity centers and structure related defects and their role on the electronic properties of the materiais. Infrared absorption spectroscpopy was used to measure the binding enrgy of donors and their concentration. |
publishDate |
1998 |
dc.date.none.fl_str_mv |
1998-03-01 |
dc.type.driver.fl_str_mv |
info:eu-repo/semantics/article |
dc.type.status.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
format |
article |
status_str |
publishedVersion |
dc.identifier.uri.fl_str_mv |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331998000100002 |
url |
http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331998000100002 |
dc.language.iso.fl_str_mv |
eng |
language |
eng |
dc.relation.none.fl_str_mv |
10.1590/S0103-97331998000100002 |
dc.rights.driver.fl_str_mv |
info:eu-repo/semantics/openAccess |
eu_rights_str_mv |
openAccess |
dc.format.none.fl_str_mv |
text/html |
dc.publisher.none.fl_str_mv |
Sociedade Brasileira de Física |
publisher.none.fl_str_mv |
Sociedade Brasileira de Física |
dc.source.none.fl_str_mv |
Brazilian Journal of Physics v.28 n.1 1998 reponame:Brazilian Journal of Physics instname:Sociedade Brasileira de Física (SBF) instacron:SBF |
instname_str |
Sociedade Brasileira de Física (SBF) |
instacron_str |
SBF |
institution |
SBF |
reponame_str |
Brazilian Journal of Physics |
collection |
Brazilian Journal of Physics |
repository.name.fl_str_mv |
Brazilian Journal of Physics - Sociedade Brasileira de Física (SBF) |
repository.mail.fl_str_mv |
sbfisica@sbfisica.org.br||sbfisica@sbfisica.org.br |
_version_ |
1754734858417995776 |