Spectral domain analysis of double screen frequency selective surfaces

Detalhes bibliográficos
Autor(a) principal: Campos,Antonio Luiz Pereira de Siqueira
Data de Publicação: 2012
Outros Autores: Silva,Tércio de Lima
Tipo de documento: Artigo
Idioma: eng
Título da fonte: Journal of Microwaves. Optoelectronics and Electromagnetic Applications
Texto Completo: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742012000100007
Resumo: This paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental results.
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spelling Spectral domain analysis of double screen frequency selective surfacesFSSSpectral Domain AnalysisDouble Screen FSSMethod of MomentsImmitance ApproachThis paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental results.Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo2012-06-01info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersiontext/htmlhttp://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742012000100007Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.11 n.1 2012reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applicationsinstname:Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)instacron:SBMO10.1590/S2179-10742012000100007info:eu-repo/semantics/openAccessCampos,Antonio Luiz Pereira de SiqueiraSilva,Tércio de Limaeng2012-07-16T00:00:00Zoai:scielo:S2179-10742012000100007Revistahttp://www.jmoe.org/index.php/jmoe/indexONGhttps://old.scielo.br/oai/scielo-oai.php||editor_jmoe@sbmo.org.br2179-10742179-1074opendoar:2012-07-16T00:00Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)false
dc.title.none.fl_str_mv Spectral domain analysis of double screen frequency selective surfaces
title Spectral domain analysis of double screen frequency selective surfaces
spellingShingle Spectral domain analysis of double screen frequency selective surfaces
Campos,Antonio Luiz Pereira de Siqueira
FSS
Spectral Domain Analysis
Double Screen FSS
Method of Moments
Immitance Approach
title_short Spectral domain analysis of double screen frequency selective surfaces
title_full Spectral domain analysis of double screen frequency selective surfaces
title_fullStr Spectral domain analysis of double screen frequency selective surfaces
title_full_unstemmed Spectral domain analysis of double screen frequency selective surfaces
title_sort Spectral domain analysis of double screen frequency selective surfaces
author Campos,Antonio Luiz Pereira de Siqueira
author_facet Campos,Antonio Luiz Pereira de Siqueira
Silva,Tércio de Lima
author_role author
author2 Silva,Tércio de Lima
author2_role author
dc.contributor.author.fl_str_mv Campos,Antonio Luiz Pereira de Siqueira
Silva,Tércio de Lima
dc.subject.por.fl_str_mv FSS
Spectral Domain Analysis
Double Screen FSS
Method of Moments
Immitance Approach
topic FSS
Spectral Domain Analysis
Double Screen FSS
Method of Moments
Immitance Approach
description This paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental results.
publishDate 2012
dc.date.none.fl_str_mv 2012-06-01
dc.type.driver.fl_str_mv info:eu-repo/semantics/article
dc.type.status.fl_str_mv info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.uri.fl_str_mv http://old.scielo.br/scielo.php?script=sci_arttext&pid=S2179-10742012000100007
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dc.language.iso.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv 10.1590/S2179-10742012000100007
dc.rights.driver.fl_str_mv info:eu-repo/semantics/openAccess
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dc.format.none.fl_str_mv text/html
dc.publisher.none.fl_str_mv Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo
publisher.none.fl_str_mv Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo
dc.source.none.fl_str_mv Journal of Microwaves, Optoelectronics and Electromagnetic Applications v.11 n.1 2012
reponame:Journal of Microwaves. Optoelectronics and Electromagnetic Applications
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reponame_str Journal of Microwaves. Optoelectronics and Electromagnetic Applications
collection Journal of Microwaves. Optoelectronics and Electromagnetic Applications
repository.name.fl_str_mv Journal of Microwaves. Optoelectronics and Electromagnetic Applications - Sociedade Brasileira de Microondas e Optoeletrônica (SBMO)
repository.mail.fl_str_mv ||editor_jmoe@sbmo.org.br
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